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Overview

	OmniScan^™ X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities Power You Can Carry Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications. Download the OmniScan X3 64 Brochure WeldSight™ Advanced Analysis Software
OmniScan^™ X3 Phased Array Flaw Detector with Innovative TFM Confidence You Can See The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence. Download the OmniScan X3 Brochure

OmniScan^™ X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities

Power You Can Carry

Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications.

Download the OmniScan X3 64 Brochure

WeldSight™ Advanced Analysis Software

OmniScan^™ X3 Phased Array Flaw Detector with Innovative TFM

Confidence You Can See

The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.

Download the OmniScan X3 Brochure

Innovative and Efficient TFM

Confirm Your TFM Beam Coverage in Advance

The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector.

The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.

See What You’ve Been Missing with PCI

Our innovative amplitude-free live phase coherence imaging (PCI) improves small-defect sensitivity and penetration in noisy materials, all while easing your setup and simplifying sizing. Available on the OmniScan X3 64 flaw detector as of MXU 5.10.

	Virtual Collaboration, Virtually Anywhere The X3 Remote Collaboration Service (X3 RCS) enables you to share your screen, allow a remote collaborator to control the unit, and host a video conference with participants located almost anywhere in the world. Learn more about the X3 RCS Improved, Faster Calibration The OmniScan X3 calibrator tracks the signals at high speed. Perform multigroup calibrations in minutes. Familiar Yet Improved OmniScan Experience Users who own or trained on an OmniScan will transition easily to the OmniScan X3 flaw detector, and new users will find it easy to learn. Quick Tutorial Videos Download the X3 Training

Virtual Collaboration, Virtually Anywhere

The X3 Remote Collaboration Service (X3 RCS) enables you to share your screen, allow a remote collaborator to control the unit, and host a video conference with participants located almost anywhere in the world.

Learn more about the X3 RCS

Improved, Faster Calibration

The OmniScan X3 calibrator tracks the signals at high speed. Perform multigroup calibrations in minutes.

Familiar Yet Improved OmniScan Experience

Users who own or trained on an OmniScan will transition easily to the OmniScan X3 flaw detector, and new users will find it easy to learn.

Quick Tutorial Videos

Download the X3 Training

Reveal More Details

Benefit from 64-Pulser Phased Array

Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point.

Slide Right: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law.

Slide Left: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster.

Slide to compare these OmniScan models

Access Full 128-Element Aperture TFM

Made possible by new generation electronics, TFM imaging offers better focusing capabilities for smaller indications and an improved signal-to-noise ratio (SNR). With its 128-element aperture capacity, the OmniScan X3 64 model provides enhanced image clarity.

Slide Right: This TFM image was acquired with 64 elements of a 128-element probe (3.5L128-I4 model) using an OmniScan X3 32-channel model.

Slide Left: Here, the OmniScan X3 64 flaw detector enabled us to use the full 128-element aperture of our 3.5 MHz, 128-element I4 probe. Note the improved resolution and reduced background noise.

Acquire up to 4X Faster TFM

Achieve total focusing method (TFM) acquisition speeds of up to 4 times faster when using a 64-element probe. Compared to models with 32 pulsers, the OmniScan X3 64 flaw detector offers a significant improvement in efficiency owing to its larger aperture capability.

Improved Phased Array

Up to 3x as fast as the OmniScan MX2 flaw detector (max pulse repetition frequency)
Single TOFD menu for an accelerated calibration workflow
800% high amplitude range reduces the need to rescan
Onboard Dual Linear Array™ and Dual Matrix Array™ probe support accelerates setup creation

Ease Corrosion Monitoring Using Phased Array

Using phased array to inspect corrosion offers many benefits, including excellent coverage and resolution. However, becoming proficient in phased array techniques can be challenging. The OmniScan X3 flaw detector combines advanced functions such as gate synchronization with thoughtfully designed software and simplified menus, so you can obtain accurate data more easily. Configure your setup quickly thanks to its A-scan synchronization processing and manual time-corrected gain (TCG).

OmniScan X3 Series

Models	OmniScan X3			OmniScan X3 64
Configuration	16:64PR	16:128PR	32:128PR	64:128PR
Applications	Corrosion monitoring, Pipeline integrity, Manual PA/TFM, TOFD, Small piping	Multi-group high-productivity thin weld PA & TOFD, Wind blade manufacturing, Composite	Multi-group high-productivity thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, TFM	Multi-group high-productivity very thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, High-productivity TFM, High Temperature hydrogen attack (HTHA), Advanced application development
Pulsers (PA)	16	16	32	64
Receivers	64	128	128	128
TFM Elements	32	32	64	128
UT Channels (P/R)	2	2	2	2
Groups	Up to 2 (PA, UT/TOFD, TFM) or 2 PA with 1 TOFD	Up to 8 total TFM: up to 4	Up to 8 total TFM: up to 4	Up to 8 total TFM: up to 4
Bandwidth Frequency	0.5 to 18 MHz			0.2 MHz to 26.5 MHz
Maximum Pulse Width (PA)	500 ns			1000 ns
Voltage PA	40 V, 80 V, and 115 V / Unipolar negative			10 Vpp, 20 Vpp, 40 Vpp, 80 Vpp, 120 Vpp, and 160 Vpp / Bipolar Square Pulse
Internal SSD Storage Capacity	64 GB			1 TB
All Other Features and Specifications	Identical

Service and Support You Can Trust

From calibration to training, we offer a broad portfolio of services to help you maintain optimal device performance. Evident service contracts are:

Straightforward—so you can focus on the core of your business
Efficient—we can schedule preventative maintenance, including calibrations, on your behalf
Cost-effective—providing you savings throughout the life of the contract

Learn More

Complete Solutions for Your NDT Workflow MXU The OmniScan X3 flaw detector’s MXU onboard software guides you through your inspection workflow. Learn more OmniPC Our complimentary OmniPC™ computer-based analysis software is compatible with OmniScan X3, OmniScan MX2, and OmniScan SX data files. Learn more WeldSight WeldSight™ advanced analysis and acquisition PC software is compatible with the OmniScan X3 flaw detector. For increased productivity, the WeldSight Remote Connect app installed on the acquisition unit enables you to perform the entire inspection workflow using WeldSight software. Learn more

Complete Solutions for Your NDT Workflow

MXU

The OmniScan X3 flaw detector’s MXU onboard software guides you through your inspection workflow. Learn more

OmniPC

Our complimentary OmniPC™ computer-based analysis software is compatible with OmniScan X3, OmniScan MX2, and OmniScan SX data files. Learn more

WeldSight

WeldSight™ advanced analysis and acquisition PC software is compatible with the OmniScan X3 flaw detector. For increased productivity, the WeldSight Remote Connect app installed on the acquisition unit enables you to perform the entire inspection workflow using WeldSight software. Learn more

Onboard Software

	MXU PAUT, TOFD, and TFM Inspection and Analysis Software The OmniScan X3 flaw detector’s MXU onboard software provides streamlined, simplified menus and advanced yet intuitive tools to guide you through your inspection workflow using UT, PA, TOFD, and TFM methods, from setup to reporting.

MXU

PAUT, TOFD, and TFM Inspection and Analysis Software

The OmniScan X3 flaw detector’s MXU onboard software provides streamlined, simplified menus and advanced yet intuitive tools to guide you through your inspection workflow using UT, PA, TOFD, and TFM methods, from setup to reporting.

Ease Your NDT Workflow Using Built-In Tools

1. Scan Plan

Follow the steps—1, 2, 3—to set up your inspection on board

2. Calibration

Conduct a fully compliant calibration using the built-in tools

3. Acquisition

View the live scan results during your inspection

4. Analysis

Quickly and confidently interpret your data

Live TFM Envelope Processing

Facilitate Flaw Characterization and Sizing

The instrument’s unique envelope processing provides high-resolution TFM images. Indications look clean and sharp and stand out more clearly against background noise. Up to four TFM modes facilitate interpretation and sizing.

Expand Your PA and TFM Capabilities

Increase your potential to meet the challenges of your customers and develop new procedures for a wider range of applications. Gain the power to drive advanced PA probes such as our Dual Liner Array™ or Dual Matrix Array™ probes or customized probes to achieve higher quailty imaging of acoustically challenging materials.

Slide to compare these OmniScan models

When Precision Is Paramount

See Clearly with Lower Frequencies and Wider Bandwidth

Versus the 32-channel model, the 64-channel model provides a higher signal-to-noise ratio (SNR) on a larger bandwidth for higher and lower frequencies.
Capable of driving lower frequencies using a larger pulse width, the OmniScan X3 64 flaw detector offers better signal resolution on attenuative materials such as composites.
In C-scans, the 64-channel model’s higher resolution and SNR reveal more features in finer detail, enabling you to achieve greater precision when required.

Fix Errors before They Are Made: Improved PAUT and TOFD Data Quality and Reliability

The coupling check channel feature of the OmniScan X3 flaw detector, combined with the ScanDeck™ module’s real-time coupling and scan speed indicators help inspectors monitor data quality before the file is saved.* The coupling quality data is recorded and can be reviewed later.

*The ScanDeck module is available on certain scanners, such as the AxSEAM scanner, as of July 2020.

Avoid Signal Saturation on Large Indications

Easy Gain Adjustment with 800% Amplitude Range

Improve inspection efficiency by eliminating unnecessary rescanning. The high 800% amplitude range enables you to adjust the gain of large indications, such as lack of fusion, to reference level in post processing, avoiding the need to rescan.

Confirm TFM Beam Coverage in Advance

The Acoustic Influence Map (AIM) provides you with an onboard visual model of the sensitivity based on the TFM mode, probe, settings, and simulated reflector. The AIM tool takes the guesswork out of creating your scan plan, enabling you to adjust it accordingly.

Obtain clear data on the projected highest sensitivity area.
See which TFM modes provide the best cover your area of interest.
The higher the Sensitivity Index, the better the expected signal-to-noise ratio (SNR).
Simulate the TFM mode sensitivity on a spherical or planar defect.

	Complete OmniScan Retrocompatibility for Your Convenience Reuse your data files from previous versions of OmniPC software and setup files from OmniScan MX2, SX, and MX flaw detectors. To ease your transition, OmniScan .ops setup files are compatible with the OmniScan X3 flaw detector, and .opd data files are compatible with OmniPC 5 and WeldSight software.

Complete OmniScan Retrocompatibility for Your Convenience

Reuse your data files from previous versions of OmniPC software and setup files from OmniScan MX2, SX, and MX flaw detectors. To ease your transition, OmniScan .ops setup files are compatible with the OmniScan X3 flaw detector, and .opd data files are compatible with OmniPC 5 and WeldSight software.

TOFD Lateral Wave Processing

Lateral wave synchronization improves the readability of time-of-flight diffraction (TOFD) data.

A straighter lateral wave enables more precise depth evaluation and flaw sizing.
Detect indications closer to the surface, using the lateral wave removal function.
Lateral wave processing can be done per section, providing better flexibility.

OmniPC 5 Software

	OmniPC Phased Array and Ultrasonic Testing Data Analysis PC Software OmniPC analysis software is the computer-based companion software for the OmniScan X3 flaw detector. An inspection tool created by inspectors, OmniPC software provides the power and performance to handle all your basic data analysis and reporting needs.

OmniPC

Phased Array and Ultrasonic Testing Data Analysis PC Software

OmniPC analysis software is the computer-based companion software for the OmniScan X3 flaw detector. An inspection tool created by inspectors, OmniPC software provides the power and performance to handle all your basic data analysis and reporting needs.

Why OmniPC?

Optimized for NDT Inspectors

Like the on-board software of the OmniScan X3 flaw detector, OmniPC software enables inspectors using UT, PA, TOFD, and TFM to perform efficient analysis and reporting on a PC or laptop.

Complimentary Companion Software for OmniScan Flaw Detectors

OmniPC software is free for download, including updates, by subscribing here:

No HASP key
No product key
No renewal payments

Complementary Companion Software for OmniScan Flaw Detectors

User-friendly features including convenient shortcuts, the flexibility to use different methods, and the ability to open multiple sessions on one computer increase the efficiency your analysis.

Familiar OmniScan User Interface

The user interface of OmniPC software resembles the OmniScan X3 on-board software to ease your learning curve.

Flexible Tools to Ease Your PAUT and TOFD Data Analysis

Correct Oversights Made during Acquisition

OmniPC software’s Skew, Scan Offset, and Index Offset can be changed during post-inspection analysis to improve data accuracy and avoid reacquisition.

Adjustable Gates and Dynamic Readings

Gates A, B, and I are available with various lists of readings (for corrosion inspections).

Replay the Acquisition

At any time, adjust the Gain, apply the Auto 80%, and slide the Data cursors.

B-Scan Screening

C-Scan Screening

Identify Indications with Ease

Use the gate in True Depth or Sound Path or change the Zoom Palette to locate indications faster.

TOFD Recalibration

Recalibrate your wedge delay and PCS in your TOFD files. Synchronize and remove the lateral wave as required.

Easily Extract and Export Data for Reports

Different exporting options are available to meet your reporting needs.

Specifications

OmniScan^® X3 Series Specifications

These specifications apply to all OmniScan X3 and OmniScan X3 64 models.

• Data Specifications • Acoustic Specifications • TFM/FMC • Operating Environment

Display
Type	Multigroup, multimode ultrasonic flaw detector
Size (W × H × D)	335 mm x 221 mm x 151 mm (13.2 in. x 8.7 in. x 5.9 in.)
Weight	5.7 kg (12.6 lb) (with 1 battery)
Hard Drive Capacity	OmniScan X3 : Internal 64 GB SSD OmniScan X3 64 : Internal 1TB SSD extendable using an external USB drive
Storage Devices	SDHC^™ and SDXC^™ cards or most standard USB storage devices
Max Onboard File Size	25 GB
GPS	Yes (unless specified otherwise for some regions)
Alarms	3
Wireless Connection	Yes – wireless LAN dongle included in the package (model varies according to region)
PA Connectors	1 connector
UT Connectors	4 (2 channels P/R)
Certifications	ISO 18563-1:2015 ISO-22232-1:2020
Type	TFT LCD with resistive touch screen
Size	269 mm (10.6 in.)
Resolution	1280 × 768 pixels
Number of Colors	16 million
Viewing Angles	Horizontal: −85° to 85° Vertical: −85° to 85°
I/O Ports
USB 2.0	2 ports (one hidden behind the battery)
USB 3.0	1 port
Video Output	Video out (HDMI)
Memory Card	SDHC port
Communication	Ethernet
I/O Lines
Encoder	2-axis encoder line (quadrature quadrature direction), 3rd encoder ready
Digital Input	6 digital inputs, TTL
Digital Output	5 digital outputs, TTL
Acquisition On/Off Switch	Through the configuration of a digital input
Power Output Line	5 V nominal, 1 A (short-circuit protected), and 12 V output at 1 A
External DC Supply
DC-IN Voltage	15 VDC to 18 VDC (min. 50 W)
Connector	Circular, 2.5 mm pin diameter, center-positive
Battery
Type	Lithium-ion battery
Capacity	87 Wh
Number of Batteries	2
Life	5 hours using 2 batteries (hot-swap capable)
PA/UT Configuration
Bit Depth	16 bits
Maximum PRF	20 kHz
Frequency
Effective Digitizing Frequency	Up to 100 MHz
Display
Refresh Rate	A-scan: 60 Hz; S-scan: 20 Hz to 30 Hz
Envelope (echo-dynamic mode)	Yes: Volume-corrected S-scan (30 Hz)
A-Scan Height	Up to 800%
Synchronization
On Internal Clock	1 Hz to 10 kHz
External Pace	Yes
On Encoder	On 2 axes: from 1 to 65,536 steps

Data Specifications

Processing
Maximum Number of A-Scan Data Points	Up to 16,384
Real-Time Averaging	PA: 2, 4, 8, 16 UT: 2, 4, 8, 16, 32, 64
Rectification	RF, full wave, half wave+, half wave-
Filtering	PA channel (OmniScan X3): 8 low-pass, 6 band-pass, and 4 high-pass filters PA channel (OmniScan X3 64): 9 band-pass and 7 high-pass filters UT channel: 8 low-pass, 6 band-pass, and 4 high- pass filters (3 additional filters when configured in TOFD)
Video Filtering	Smoothing (adjusted to the probe frequency range)
Programmable TCG
Number of Points	32: One TCG (time-corrected gain) curve per focal law
Range	PA (standard): 40 dB per step of 0.1 dB UT: 100 dB per step of 0.1 dB
Maximum Slope	PA (standard): 40 dB/10 ns UT: 40 dB/10 ns

Acoustic Specifications

Model	OmniScan X3	OmniScan X3 64	Both
Pulser	PA Channel	PA Channel	UT Channels
Voltage	40 V, 80 V, and 115 V	10 Vpp, 20 Vpp, 40 Vpp, 80 Vpp, 120 Vpp, and 160 Vpp	85 V, 155 V, and 295 V
Pulse Width	Adjustable from 30 ns to 500 ns; resolution of 2.5 ns	Adjustable from 30 ns to 1000 ns (half period of bipolar pulse or duration of negative of pulse); resolution of 5 ns	Adjustable from 30 ns to 1,000 ns; resolution of 2.5 ns
Fall Time	< 10 ns	< 10 ns	< 10 ns
Pulse Shape	Negative square pulse	Bipolar negative-positive square pulse Negative square pulse
Output Impedance	28 Ω in pulse-echo 24 Ω in pitch-catch	35 Ω	< 30 Ω
Receiver	PA Channel		UT Channels
Gain Range	0 dB to 80 dB maximum input signal; 550 mVp-p (full-screen height).	0 dB to 80 dB; maximum input signal 900 mVp-p (full-screen height).	0 dB to 120 dB maximum input signal; 34.5 Vp-p (full-screen height).
Input Impedance	57 Ω ± 10% at 9 MHz in pulse-echo 100 Ω ± 10% at 9 MHz in pitch-catch	120 Ω ±10 % at 13 MHz	50 Ω in pulse-echo mode 50 Ω in pulse-receive mode
System Bandwith	0.5 MHz to 18 MHz	0.2 MHz to 26.5 MHz	0.25 MHz to 28 MHz
Beam Formation	PA Channel		UT Channels
Scan Type	Single, linear, sectorial, compound, and TFM		-
Maximum Aperture	OMNIX3-PATFM1664PR = 16 elements OMNIX3-PATFM16128PR = 16 elements OMNIX3-PATFM32128PR = 32 elements	OMNIX3-PATFM64128PR = 64 elements	-
Number of Receiving Elements	OMNIX3-PATFM1664PR = 64 receiving elements OMNIX3-PATFM16128PR = 128 receiving elements OMNIX3-PATFM32128PR = 128 receiving elements	OMNIX3-PATFM64128PR =128 elements	-
Number of Focal Laws	Up to 1024		-
Delay Range Transmission	0 µs to 10 µs in 2.5 ns increments	0 µs to 10 µs in 5 ns increments	-
Delay Range Reception	0 µs to 6.4 µs in 2.5 ns increments		-

TFM/FMC

Supported Modes	Pulse-echo: L-L, T-T, and TT-TT Self-tandem: LL-L, TT-T, TT-L, TL-T, LT-T, TTT-TT, and TL-L
Number of Groups	Up to 4 simultaneous TFM groups
Maximum Aperture	64-element aperture for 64:128PR 64-element extended aperture (32:128PR only) 32-element extended aperture for 16:64PR and 16:128PR 128-element extended aperture for 64:128PR
Image Resolution	Up to 1024 × 1024 (1 M points) for each TFM group
Live TFM Envelope	Yes

Operating Environment

Ingress Protection Rating	IP65 certified (completely protected against dust and water jets from all directions (6.3 mm nozzle))
Shockproof Rating	Drop tested according to MIL-STD-810G
Intended Use	Indoor and outdoor use
Altitude	Up to 2,000 m (6,561 ft)
Operating Temperature	−10 °C to 45 °C (14 °F to 113 °F)
Storage Temperature	−20 °C to 60 °C (−4 °F to 140 °F) (with battery inside) −20 °C to 70 °C (−4 °F to 158 °F) (with no battery inside)