DSX1000 digital microscopes enable faster failure analysis with guaranteed* accuracy and repeatability.
*To guarantee XY accuracy, calibration work must be undertaken by an Olympus service technician.
Choose the model that best suits your needs.
Entry Model
Easy to Use with Basic Functionality
Standard zoom head, offering 5 observation methods. | Tilt Model
See Your Sample from Many Angles
Offers all the features of the Entry model and adds a tilting frame, motorized XY stage, and console. | High-Resolution Model
High-Resolution Images for Advanced Analysis
Universal zoom head adds differential interference contrast imaging, enhanced depth of focus, and high-resolution 3CMOS mode. | High-End Model
6 Observation Methods and Advanced Measurement Functions
Packed with advanced features, this model features the universal zoom head and adds a tilting frame and motorized XY stage with rotation (+ 90°). |
Our lineup of 17 objective lenses, including super long working distance and high numerical aperture options, offers flexibility to obtain a wide range of images.
Provides a long working distance between the lens and sample.
Delivers both high resolution and a long working distance.
Delivers high performance at the nano scale.
Speed combined with guaranteed accuracy and repeatability make the DSX1000 digital microscope the right tool of choice for failure analysis.
Supported models
Supported models
Supported models
*To guarantee XY accuracy, calibration work must be undertaken by an Olympus service technician.
With the DSX1000 digital microscope:
Complete your inspection using one easy-to-use systemWith a conventional digital microscope:
Two microscopes, a low-magnification and a high-magnification model, are needed to complete an inspectionWith the DSX1000 digital microscope:
High resolution and long working distance in one objectiveWith a conventional digital microscope:
Resolution decreases as magnification increasesWith the DSX1000 digital microscope:
Observe uneven samples without bumping into themWith a conventional digital microscope:
The objective can crash into the sample, potentially damaging itWith the DSX1000 digital microscope:
All 6 observation methods are available at all magnificationsWith a conventional digital microscope:
Only one or two observation methods are available, limiting what can be seen in the sampleWith the DSX1000 digital microscope:
Both accuracy and repeatability are guaranteed at all magnificationsWith a conventional digital microscope:
The measurement precision is not guaranteedThe software offers fast, efficient inspection workflows for image acquisition, quantitative measurements and image analysis, reporting, and advanced materials science inspection tasks.
A brake pad's surface impacts its performance, including braking force, heat stability, noise, and heat generation. Digital microscopes are used to check that the compounds used to create the brake pad are mixed properly.
| Automotive |
Digital microscopes are effective tools for analyzing defects, such as wire breakage, wire pitch deviation, bonding peeling, and migration that can occur during the bonding process.
|
Electronics
IC/Wafer |
Drill bits are widely used in industrial fields as a cutting tool. If the edge is damaged, inaccuracies may arise during hole positioning, or the drill may break. Conventional digital microscope is commonly used to perform drill inspection, but there are challenges. The DSX1000 offers advantages of detecting damage on a drill bit edge.
|
Metal
Fabrication/Mold |
Semiconductors are essential components in many electronic devices. Defects can be introduced into the circuit during manufacturing process, and visual inspection using a microscope is a preferred option to inspect defects. The DSX1000 simplifies semiconductor visual inspection.
|
Electronics
IC/Wafer |
Manufacturers use strict quality control measures to minimize failures of electrical connector pins, and microscopes play an essential role. The DSX1000 microscope’s objective lenses offer the depth of focus and resolution required to focus an entire connector pin at the same time, greatly simplifying and speeding up the inspection process.
|
Electronics
IC/Wafer |
Fractography has become increasingly important as infrastructure continues to age and quality control issues cause problems. Optical or digital microscopes are essential fractography tools that are used to capture high-quality images for analysis. See details of advantages which DSX1000 can offer to analyze factured metal surfaces.
|
Metal
Fabrication/Mold |
During the dicing process of integrated circuit (IC) manufacturing, amount of allowable roughness of wafer surface is carefully controlled. Amount of roughness is checked with a digital microscope, but the physical properties of IC chips can be challenging. The DSX1000 objective lenses offer high resolution at low magnification to reduce shading and flare, enabling inspectors to more easily see chipping during low-magnification observations.
|
Electronics
IC/Wafer |
Inspection of resin peeling defects is critical as these defects can cause a completed PWB to have lower insulation and heat resistance, making them more susceptible to failure. PWBs are challenging to inspect with a microscope. The DSX1000 digital microscope has advanced telecentric optics and high-resolution objectives that offer an excellent depth of focus, which enable you to observe an etched PWB to investigate the cause of a defect.
|
Electronics
IC/Wafer |
Manufacturers measure the laminated ceramic capacitors’ dimensions and visually inspect them to look for cracks in the ceramic. Microscopes or digital microscopes is used to supplement the automated inspection system, but poses challenges. The DSX1000 offers multiple advantages to inspect capacitors.
|
Electronics
IC/Wafer |
During the manufacturing process of PWBs, a microscopic inspection is necessary to analyze circuit shape precisely. There are multiple advantages of measuring circuit shape with the DSX1000.
|
Electronics
IC/Wafer |
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