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InSight Blog
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OmniScan X3 phased array PA flaw detector

5 Reasons to Make the Switch to the OmniScan X3 Flaw Detector

By Tommy Bourgelas - March 27, 2020
The Industrial Internet of Things

How the Cloud Simplifies Corrosion Data Management

By Greg Bauer - March 26, 2020

Access a Better Way of Working—Experience Olympus Scientific Cloud 3.0

By Greg Bauer - March 25, 2020

TFM and Other Major Advantages of the OmniScan X3 Flaw Detector for NDT Inspectors—A Customer Review

By Sarah Williams - March 19, 2020
Visual weld inspection

How to Confirm Videoscope Measurement Points with Confidence

By Charles Janecka - March 18, 2020
Ultrasonic Transducers

What Are the Different Types of Ultrasonic Transducers?

By Rebecca Chandler - March 10, 2020
Using an Olympus 38DL PLUS Ultrasonic Thickness Gage on a fiberglass boat hull

How to Set Up Thickness Gages for Common Applications: 12 Video Tutorials

By Rebecca Chandler - March 5, 2020
Phased array flaw detector with TFM/FMC

Master the Total Focusing Method (TFM) Using the Acoustic Influence Map (AIM) Software Tool

By Emilie Peloquin - February 24, 2020
What Does an XRF Analyzer Cost? Vanta XRF gun for measuring scrap metal in recycling plant.

Which XRF Analyzer Is Right for Me?

By Ted Shields - February 19, 2020
Fuel oil analysis

Fuel Oil Analysis Using Handheld XRF: An Experiment

By Dillon McDowell - February 11, 2020
Soil analysis with handheld XRF analyzers

Soil Analysis Discovery Combines Handheld XRF and Vis-NIR Data

By Michelle Wright - February 5, 2020
Custom probe next to a penny

Did You Know? We Custom Manufacture Probes for Your Specific Applications

By Sarah Williams - January 29, 2020
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Popular Topics
Thickness Gage Manufacturing Automotive XRF Metal Manufacturing Inspection Service Industrial Microscopes RVI Conventional Ultrasound Vanta Aerospace Energy Oil & Gas Electronics Glass & Ceramic OmniScan Phased Array Material Chemistry Depth Sizing Tube Inspection Crack Detection Confocal Microscope Measuring Defects IPLEX OLS Consumer Products Videoscope Microscope Quality Assurance Surface Roughness
Authors
Tommy Bourgelas
Senior Product Manager, OmniScan Products
Greg Bauer
Senior Product Specialist for Portable NDT products
Sarah Williams
Staff Writer
Charles Janecka
Sales Engineer, Remote Visual Inspection
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