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Industrial Solutions
Industrial Microscopes

OLYMPUS Stream

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OLYMPUS Stream Image Analysis Software 2.4.3 Brochure
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  • Overview
  • Smart Technology
  • Your System
  • Solutions
  • Specifications
  • Resources

Overview

Simplify Your Inspection Workflow

OLYMPUS Stream software offers intelligent step-by-step workflows to acquire sharp, crisp images that are ready for quantitative measurements and professional reporting based on the latest standards. Users of any experience level can conduct complex image analysis tasks, from image acquisition to standard reporting, under any imaging condition. 

Designed for flexibility, the software has a broad scope of functions necessary to conduct fast, precise observations on a variety of samples while maintaining data security and reliability. Optional solutions enable users to adapt OLYMPUS Stream software to their application, including quality analysis, research and development, and quality control.

Try On OLYMPUS Stream for 30 days free of charge.

Click "Request a Demo" and note that you would like a 30-day license in the first box. 


Easy-to-Use Interface and Step-by-Step Guidance

Smart Technologies for Crisp Image Capture

  • Tools for live images 
  • Panorama and extended depth focus 
  • Saving and recalling acquisition settings 

High Efficiency on Repeating Tasks

  • Guided operation 
  • Quantitative analysis
  • Automatic tools for efficient image acquisition
  • Efficient report creation

Designed for Olympus Hardware

Seamlessly Integration with Olympus Optical Microscopes

  • Upright microscopes
  • Inverted microscopes
  • Semiconductor microscopes
  • Stereo microscopes
  • LEXT 3D measuring laser microscope
  • DSX digital microscope

Working with Olympus Digital Cameras

  • Color fidelity
  • High resolution
  • Real-time on-screen imaging

Dedicated Observation Methods

  • HDR imaging for image contrast improvement
  • Unique 'MIX' observation mode providing sample details from both brightfield and darkfield

Solving Your Inspection Challenges

Advanced Imaging Solutions

  • Count and measure solution 
  • Three-dimensional image display and measurement

Solutions for Metallography

  • Grain sizing using the intercept counting method
  • Grain sizing using the planimetric method 
  • Graphite nodularity evaluation
  • Rating the non-metallic inclusion content
  • Comparison of sample images with reference standards
  • Dendrite arm spacing measurement

Solutions for Machinery Processing (Automotive / Machined Parts Industries)

  • Welding distortion
  • Phase and region of interest measurement
  • Particle distribution 

Solutions for Electronics (Electronic Device / Semiconductor Industries)

  • Throwing power measurement
  • Automatic critical dimension measurement

Solutions for Surface Coatings and Thin Film Deposits (Coating Industries)

  • Thin coating thickness evaluation (calotest method)
  • Layer thickness measurement
  • Pore fraction and density measurement

Software Compatibility with Microsoft Office

Smart Technology

Step-by-Step Guidance

The dynamic user interface reduces desktop clutter and confusion by only displaying the tools and functions you want to use. The interface guides you through every step of the process, including image capture, image processing, and report creation. Both simple and complex measurements can be easily conducted using the software’s intuitive set of tools.


Simple Layouts

The software’s organized layouts contain the minimum necessary functions for performing the required tasks. Simplified layouts help streamline the inspection workflow and efficiently guide users through the inspection process.

Fast measurements on a live image with just a few clicks of your mouse


Tools for Live Images

Estimating the pore size using live digital reticules (Cross section of die casting) 

The software supports live image functions for instant feedback. The software enables you to interact with the live image, which is automatically calibrated, and perform quantitative measurements.


Quick Panorama and Extended Depth Focus

Quickly create images of samples that extend beyond the standard depth of focus or the field of view. The instant extended focus image (EFI) function uses the fine focus adjustment to combine many images taken at different Z-levels to build a single combined image that is entirely in focus. Instant multiple image alignment (MIA) makes it easy to create panoramic images simply by moving the XY stage; a motorized stage is no longer necessary.

Instant EFI image of crystal: fully focused image is created even in low-contrast sample areas

Instant MIA image of a coin


Recall Acquisition Setting

Quickly recall previously used camera settings to capture repeatable images with a consistent look and feel. When using a motorized microscope, this function can automatically recall previous hardware settings. If you’re using a BX, GX, or MX series microscope, the software guides you to manually recall settings.

Operation Step Operator A Operator B
Different operators use different settings

Easily verify the correct settings

Synchronize observation settings

Regardless of different operators, the settings are the same


3D Solution

3D profilometry of wear track

This solution creates height maps from stacks of images acquired automatically or manually at different Z positions. The resulting image can be visualized in three dimensions using the surface view. Measurements, such as 3D profiles and height differences between two or several points, can be performed, and the results exported into workbooks and Microsoft Excel spreadsheets.


Guided Operation for Specific Analyses

The software guides you through the correct order of functions when performing image analysis, including methods that comply with most common international standards. When using a motorized stage, the alignment feature speeds up your work on multiple sample locations. 

Learn more


Automatic Calibration

The automatic calibration feature uses a standard micrometer to calibrate the microscope and automatically generates a calibration report. This helps eliminate user variability in the calibration process for more reliable measurements. 


Automated Inspection Tools

The software’s automated tools can create a very large set of data in just a few minutes. Automatic magnification calibration using a calibrated grating reticle helps ensure that your images are displayed with the proper scale bar and that your measurements are confirmed. Large areas can be imaged automatically using motorized XYZ stages, enabling the creation of images of large parts with high resolution.

Sharp and high-contrast MIA image of integrated circuit (IC) pattern (dark field observation with 20X objective lens)


Quantitative Information That Matters

The software tools features quantitative information about your sample. Interactive measurements on live and still images provide the basic dimensional information (length, area, and diameter), and the results are directly visible on the image. 
Advanced interactive measurements include the magic wand and complex polygonal shapes for semiautomatic area measurement, while the count and measure solution provides access to more than a one-hundred single particle parameters for quantitative analysis based on the threshold method.

Basic measurement (supra conductor)

Magic wand (supra conductor)

Object detection (supra conductor)


Efficient Report Creation

Creating a report often takes longer than capturing the image and taking the measurements. With the software, you can repeatedly produce smart and sophisticated reports based on predefined templates.  Editing is simple, and reports can be exported to Microsoft Word, Excel, or PowerPoint. In addition, the software’s reporting tool enables digital zooming and magnification on acquired images. Report files are a reasonable size for easier data exchange by email.

Professional report that summarizes particle counting data


Your System

Customize Your Software Package

Developed for Olympus microscopes, OLYMPUS Stream  software is a powerful and user-friendly measurement tool. There is no need to manually record the optical parameters of Olympus UIS2 objectives when using it with a conventional microscope. Magnification calibration is also not required when importing images from our DSX and LEXT  microscopes. The software is available from entry-level to advanced packages. 


OLYMPUS Stream Packages 

OLYMPUS Stream software is available in four packages based on functionality—Start, Basic, Essentials, and Motion.
Application-specific materials solution modules can be added to streamline repetitive analysis tasks. Olympus representatives can help you determine which package is right for you. 

Learn more


Seamlessly Integrates with Most Olympus Optical Microscopes 

Control Upright Microscopes

BX53M microscope and software system 

The BX53M microscope employs coded functions that integrate the microscope’s hardware settings with OLYMPUS Stream software. The observation method, illumination intensity, and objective position are all recorded by the software and/or the handset. The microscope settings can be automatically saved with each image, making it easier to reproduce the settings at a later time and provide documentation for reporting purposes. 

View our upright microscopes


Control Inverted Microscopes

GX53 microscope and software system

Our digital cameras provide high-resolution viewing and fast image transfer while our software provides all the tools needed for today's complex metallurgical requirements. 
Choose from extended measurements, standard metallography, and advanced metallography application-specific modules (over a dozen application specific routines are available), and automatically populate data and create reports that comply with common ASTM and ISO specifications. 

View our inverted microscopes


Control Semiconductor Microscopes

Integrated microscope and software system

We offer several software platforms that integrate with our semiconductor microscope frames to control all motorized functions, including the digital camera and motorized stage. Each interface is designed for basic inspection and control, advanced image analysis, or repetitive site inspection and defect review.

View our semiconductor microscopes


Control Stereo Microscopes

SZX16 microscope and software system

Our stereo microscope motorized focus drive makes digital documentation with extended focal imaging (EFI) efficient and fully automatic. This even enables the creation of pseudo 3D images. The software offers tools for simple 2D measurements up to complex phase analysis and support many operations including observation, report generation, database creation, and archiving.

View our stereo microscopes


Enhance the Power of Olympus Confocal and Digital Microscopes

Use OLYMPUS Stream software for post-processing (Stream Desktop) with the complete range of DSX series digital microscopes and the LEXT 3D measuring laser microscope.

LEXT 3D measuring laser microscope

DSX digital microscope series

View the LEXT 3D Measuring Laser Microscope
View the DSX Digital Microscope


Supports Most Olympus Digital Cameras

Resolution and Color Fidelity

The low-noise, high-resolution images of a 9-megapixel sensor enable the user to zoom deep into the sample, revealing its structures (sandstone)

Excellent spatial resolution combined with a high pixel count exploit the full optical resolution of the objectives and enable the structures and details within the smallest samples to be imaged, even with low magnification objectives. High-definition images enable you to make observations exclusively on-screen without using the eyepieces.

Reveal More with Infrared (IR)

IR image of the backside from a Si wafer,
taken with the XM10-IR monochrome
camera

IR imaging mode is a fundamental tool for quality control and in R&D laboratories. IR mode enables nondestructive inspection through silicon layers of packaged products during the back end stage of fabrication.

View our digital cameras


Dedicated Observation Methods for Materials Science

HDR imaging for enhanced contrast

High dynamic range (HDR) imaging improves image contrast in difficult conditions (very bright areas together with very dark areas in the same image). All cameras supported by OLYMPUS Stream software can be used in this mode, and dedicated cameras have an available live mode.

Clearly exposed for both dark and bright parts by HDR (Sample: fuel injector bulb)

Contrast enhancement by HDR (Sample: Sliced magnesite)


MIX observation to visualize sample’s surface structure

The software supports our MIX observation

This illumination technique combines directional darkfield, which uses a circular LED to illuminate one or more quadrants at a given time, , and brightfield, fluorescence, or polarization, enabling you to highlight defects and differentiate raised surfaces from depressions that are normally difficult to see with conventional microscopes. MIX observation helps reduce a sample’s halation and is useful for visualizing a sample’s surface texture.

Conventional: brightfield shines the light straight down on the sample while traditional darkfield highlights scratches and imperfections on a flat surface by illuminating the sample from the side of the objective

Advanced: MIX is a combination of brightfield
and directional darkfield from a ring of LEDs;
the LEDs can be adjusted to select which
direction to illuminate from

Solutions

Solving Your Inspection Challenges

Industrial labs often require repeatable and reproducible results as part of their standard operating procedures. OLYMPUS Stream software facilitates inspection, measurement, and analysis with a simple and reliable workflow. The software offers a variety of tools for various materials science analyses, so you can be confident in your results. 

Olympus industrial microscopes support metallurgical analysis solutions


Count and Measure Solution

The software’s count and measure solution uses advanced threshold methods to reliably separate objects, such as particles and scratches, from the background. More than 50 different object measurement and classification parameters are available, including shape, size, position, and pixel properties. 

Conventional software
Unclear grain boundaries

Etched steel microstructure 
(original image)

OLYMPUS Stream
Grain boundaries are clearly detected


Grain classification results

Efficient Analysis

Example of Macro Manager set up for Count and Measure

You can preset complex imaging and measurement tasks with the macro manager and then execute it with a single click. 

Powerful Image Filters

Enhanced contrast using the DCE filter (dendrite in an aluminum casting)

The software has a variety of useful filters for edge detection, smoothing, and other purposes.


Three-Dimensional Measurement and Line Profiles

The OLYMPUS Stream 3D solution provides coded and motorized Z control and instant EFI with height mapping capabilities to measure a three-dimensional sample.

3D surface view (Roughness test sample)

Single view and 3D profile measurement


Solutions for Metallography

Metallography is used in materials development, incoming inspection, production and manufacturing control, and failure analysis. 

  • Grain sizing using the intercept counting method 
  • Grain sizing using the planimetric method
  • Graphite nodularity evaluation 
  • Rating the content of non-metallic inclusions in high-purity steel 
  • Compare sample images with reference standards
  • Automatically or manually measure dendrite arm spacing 


Solutions for Machinery Processing (Automotive / Machined Parts Industries)

To produce parts that are high quality, scratches, cracks, pore size, and contamination is strictly monitored during the production process.

  • Welding distortion 
  • Phase and ROIs measurement 
  • Particle distribution


Solutions for Electronics (Electronic Device / Semiconductor Industries)


In printed circuit boards, very thin plates are coated and verifying the homogeneity of this coating is a key element of product quality.

  • Throwing power measurement 
  • Automatic critical dimension measurement


Solutions for Surface Coatings and Thin Film Deposits (Coating Industries)

Surface coatings are any mixture of film-forming materials that contain pigments, solvents, and other additives, which, when applied to a surface and cured or dried, yields a thin film that is functional and often decorative. 

  • Thin coating thickness evaluation (calotest method) 
  • Layer thickness measurement 
  • Pore fraction and density measurement

Materials Solutions for Every Purpose

Solutions Descriptions
Grain Intercept Steel manufacturers use this solution for measuring and controlling grain size after cross-sectioning, polishing, or etching steel samples.
This function is based on overlaying of “test lines” and counting the number of intercepts with grain boundaries.
Grain Planimetric Steel manufacturers use this solution for measuring and controlling grain size after cross-sectioning, polishing, or etching steel samples.
This function reconstructs boundaries for each grain and conducts grain sizing with the area percentage of the second phase.
Non-Metallic Inclusions Steel manufacturers use this solution for measuring and controlling the shape and size of nonmetallic inclusions (oxide, alumina, sulfide, or silicate) in steel.
Cast Iron Casting manufacturers who need to measure and control the graphite nodularity and check the mechanical characteristics of their cast products use this solution.
Chart Comparison A live or still image can be overlaid onto standard charts for comparison. Function preview is available.
Dendrite Arm Spacing This solution is used to manually or automatically determine the mean dendrite arm spacing in cast aluminum.
Layer Thickness One or multiple layers of a cross-sectioned sample can be measured using the Layer Thickness solution. The shapes are defined, and the layers automatically measured.
Coating Thickness This solution enables the measurement of coating thickness from top-view images using the Calotest method.
Automatic Measurements This solution is used for creating measurements based on edge-detection on a live image with pattern recognition.
Throwing Power This solution measures the distribution of copper plating thickness in through-holes or micro-vias.
Porosity This solution enables pores to be measured either for area fraction or the number of surface pores using ROIs (circular, triangular, rectangular, and polygonal) and thresholds.
Particle Distribution This solution is used to create particle size distribution histograms and tables from multiple images or image series.
Advanced Phase Analysis This feature offers a new integrated solution to perform phase analysis on a selection of various regions of interest (ROIs) including triangles, circles, rectangles, and polygons.

Solutions Metal/ Casting Automotive Glass/ Ceramic Coating Consumer goods Electronic devices
Grain Intercept ■ ■

■

Grain Planimetric ■ ■

■

Inclusion Worst Field ■ ■

■

Cast Iron ■ ■

■

Chart Comparison ■ ■

■

Layer Thickness

■

Coating Thickness

■

Automatic Measurements

■ ■
Throwing Power

■ ■
Porosity ■ ■ ■ ■ ■ ■
Particle Distribution ■ ■ ■ ■ ■ ■
Advanced Phase Analysis ■ ■ ■ ■ ■ ■

Solutions Semicon
ductors
Fluids & oils Machined 
parts
Carbon/ 
Composites
Chemical/ 
Plastic/ 
Rubber
Industrial 
scientific 
research
Grain Intercept

■

■ ■
Grain Planimetric

■

■ ■
Inclusion Worst Field

■

■ ■
Cast Iron

■

■ ■
Chart Comparison

■

■ ■
Layer Thickness

■ ■
Coating Thickness

■
Automatic Measurements

Throwing Power

Porosity ■ ■ ■ ■ ■ ■
Particle Distribution ■ ■ ■ ■ ■ ■
Advanced Phase Analysis ■ ■ ■ ■ ■ ■

Specifications

Main License Specifications

■: Standard □: Optional Start Basic Essentials Motion Desktop
Image Acquisition Basic image acquisition including HDR and auto-calibration of magnification and Live HDR*1, and position navigation*1 ■ ■ ■ ■

Software autofocus*2 and movie acquisition (Avi format)

■ ■ ■

Time lapse, Instant EFI, and Instant/Manual MIA*3

□ ■ ■

Motorized EFI/MIA and Z-stack acquisition

□ □ ■

Image and Customization Tools Basic tool windows (Image history, properties, navigator, gallery view tool window)*4 ■ ■ ■ ■ ■
Annotations, layer management, scale bar, cross hair, info stamp display, and image filters ■ ■ ■ ■ ■
Digital reticle/grid, line profile display, My Function, layout management, and Macro Manager

■ ■ ■ ■
Measurements/ Image Analysis Basic interactive measurement (distance, angles, rectangles, circles, ellipses, polygons, circle-to-circle distance, angle ruler, and line ruler) and data export to MS-Excel ■ ■ ■ ■ ■
Phase analysis, magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics

□ ■ ■ ■
3D measurements, 3D profile measurements, and 3D surface view

□ □ ■ ■
Reporting*5 Report creation (MS-Word, and MS-Excel formats) 

■ ■ ■ ■
Presentation creation

□ □ □ □
Data Management Stream document storage*6

■ ■ ■ ■
Workgroup Database with structured data format

□ □ □ □
Device Support Olympus microscopes*7 and Olympus cameras*8 ■ ■ ■ ■

Non-Olympus cameras and image source converter*9

■ ■ ■

Non-Olympus stage controller*9

□ □ ■

PC Requirements
CPU Intel® Core i5, Intel® core i7, Intel® Xeon
RAM / Hard disk / DVD drive 4 GB or more (8 GB recommended)/2.4 GB or more free space/DVD+R DL compatible
OS*10 Windows 10 Pro (64-bit) , Windows  8.1 (64-bit) Pro, Windows 7 (64-bit) Professional with SP2
.NET Framework Version 4.6.2 or higher
Graphic card*11 1280 × 1024 monitor resolution with 32-bit video card
Web browser Windows Internet Explorer 8, 9, 10, or 11

*1   Requires the DP74 camera, and the Live HDR function requires 64-bit OS.
*2   Requires Olympus microscope with motorized Z-axis or external motorized Z-axis with OLYMPUS Stream Motion or Automation Solution
*3   Instant MIA may not work properly with some cameras
*4   Write and read all major file formats and open Olympus proprietary formats (DSX, LEXT and POIR file formats)
*5   Requires Microsoft Word 2010, 2013, 2016, 2019, or Office 365 to be installed beforehand (not provided).
*6   Using Microsoft SQL Server Express
*7   Supports MX61A, MX61, MX61L, MX61A, MX63L, MX63, GX53, BX3M-CB, BX3M-CBFM, BX-UCB, BX-REMCB, IX-UCB, SZX-MDCU, SZX2-MDCU, U-CBS, STM7.
*8   Supports DP21, DP22, DP26, DP27, DP73, DP74, LC30, SC30, SC50, SC100, SC180, UC30, UC50, UC90, XC10, XC30, XC50, XM10.
*9   Please contact Olympus for supported device information
*10 Olympus cameras work with all supporting operating systems.
*11 Required configurations for LiveHDR in DP74. Graphic board applicable to CUDA made by NVIDIA (compute capability 2.1 or higher). Graphic board driver applicable to CUDA 9.1 or higher.


Special Solution Specifications

Solutions Compatiblity Functions
Basic/ Essentials Motion Desktop Measurement Type
3D □ Included Partially included* 3D Surface View, 3D Measurement, 3D Profile Measurement, Motorized Z-stack/EFI, Instant EFI with height map (requires coded or motorized Z-axis).
Automation □ Included

Automation Solution (Motorized/Manual/Instant MIA, Motorized/Instant EFI without height map (requires coded or motorized XYZ-axis) and with time lapse.
Weld Measurement □ □ □ Weld Measurement solution (measurements for geometric distortion introduced by the heating during welding).
Count & Measure □ □ □ Multiple threshold methods are available (automatic, manual HSV, manual and adaptative)
The system can automatically measure multiple parameters on all segmented objects (Area, Aspect Ratio, Bisector, Bounding Box, Gravity Center, ID, Mass Center, Intensity Values, Convexity, Diameters, Elongation, Feret, Extent, Next Neighbor Distance, Orientation, Perimeter, Radius, Shape, Sphericity, etc.)
Spreadsheet and charts with individual and distribution measurements.

* Not possible to use the functions relating to image acquisition


Materials Solutions Specifications

Solutions Compatiblity Output
Basic Essentials/ Motion Desktop Automatic report creation Workbook with individual measurement Store all results in the image properties
Grain Intercept □ □ □ ■ ■ ■
Grain Planimetric □ □ □ ■ ■*2 ■
Non-Metallic Inclusions □ □ □ ■ ■ ■
Cast Iron □ □ □ ■ ■ ■
Chart Comparison □ □ □

■ ■
Layer Thickness □ □ □ ■ ■

Coating Thickness □ □ □ ■ ■

■

Dendrite Arm Spacing □ □ □ ■ ■ ■
Automatic Measurements □ □

■

Throwing Power □ □

■ ■

■

Porosity □ □ □ ■ ■

■

Particle Distribution □ □ □ ■ ■

■

Advanced Phase Analysis □ Included Included ■ ■

Solutions Functions
Measurement type Supported standards Multiple stage location*1
Sample alignment*1
Grain Intercept Selection of pattern (circles, cross, cross & circles, vertical lines, horizontal lines, horizontal & vertical lines)
Definition of the number of test lines for determination of grain elongation
Displays the G-value in the Material Solution tool window
ASTM E112-13, ISO 643:2012, JIS G 0551:2013, JIS G 0552:1998, GOST 5639-82, GB/T 6394-2002, DIN 50601:1985, ASTM E1382-97(2015)  ■
Grain Planimetric Automatic extraction of grain boundaries
User interaction using Stream sliders for improved usability
Displays the G-value histogram in the Material Solution and position navigation*1 for direct interaction
ASTM E112-13, ISO 643:2012, JIS G 0551:2013, JIS G 0552:1998, GOST 5639-82, GB/T 6394-2002, DIN 50601:1985, ASTM E1382-97(2015) ■
Non-Metaric Inclusions Automatic detection of non-metallic inclusion using colors, shape, and size 
Automatic classification of oxides, sulfides, silicates, and aluminates 

Worst field: 
On each field the worst inclusion will be measured
Live display of the detected inclusion with its rating 

Average content:
The entire sample is scanned with a motorized stage
On each field an inclusion rating is performed
The result is given as a table “quantity of fields for each severity level”
ASTM E45-18 (method A), DIN 50602:1985 (method M), ISO 4967:2013 (method A), GB/T 10561-2005 (method A, equivalent to ISO 4967), JIS G 0555:2003 (method A, equivalent to ISO 4967), UNI 3244:1980 (method M), EN 10247:2017 (methods P and M), SEP 1571:2017(method M), ASTM E45-18 (method D), ISO 4967:2013 (method B), EN10247:2017 (method K). ■
Cast Iron On polished samples: automatically measures the characteristics of the graphite content (size, shape, and distribution)
On etched samples: measures the ferrite to pearlite ratio
Integrated workflow that takes into account the sample status (etched or polished)
EN ISO 945-1:2018, ASTM A247-17, JIS G 5502:2001, KS D 4302:2006, GB/T 9441-2009, ISO 16112:2017, JIS G 5505:2013, NF A04-197:2017, ASTM E2567-16a (for nodularity only)

Chart Comparison Multiple displays available, including live overlay
User interaction using Stream sliders for improved usability
Calculates statistics on the selected values
ISO 643: 1983, ISO 643: 2012, ISO 945: 2008, ASTM E 112: 2010, EN 10247: 2007, DIN 50602: 1985, SEP 1572: 1971, SEP 1520: 1998, ISO 4505:1978

Layer Thickness Layer boundaries can be specified using automatic detection, magic wand, or manual mode (using 2 or 3 points).
Individual measurements can be added or deleted later on
Measurement of any type of layers (with even or uneven boundaries) is supported.
Layer thickness measurement calculates mean, maximum, and minimum values as well as statistical data for each individual layer.

Coating Thickness Prints are measured from top view
Calculation of the coating thickness according to the sample geometry
EN 1071: 2002, VDI 3824: 2001, ISO 26423:2016

Dendrite Arm Spacing Determines the mean dendrite arm spacing in cast aluminum alloys

Automatic Measurements Automatically measures distances (point-to-point, point-to-line, circle-to-circle, point-to-circle, line-to-circle)
Automatically measures circle diameter (roundness, bounding box)
Automatically measures angles between two lines
Definition of tolerances values for measurement and visual validation
Expert and user mode for measurement repeatability

■
Throwing Power Manual measurements of selected point of interest on the sample
Predefined points that will be triggered by the operator
Selection of the vias type and documentation of the analysis
Report and automatic calculation according to the manual measurements

Porosity Pore detection per ROIs (triangle, circle, rectangle, polygon, or magic wand) with overlapping capability
Measurement of the pore density, count, and specific area
Measurement of the biggest pore
Measurement of a specified size range

VW 50093/ P6093:2012,
VDG P201-2002, VDG P202-2010,
VDG P211-2010

■
Particle Distribution Particles are defined using simplified threshold settings.
Automatic classification according to a selected parameter (size, color, or shape)
Measurement of ROIs and multiple thresholds
Definition of validation and coding according to user-defined standards

■
Advanced Phase Analysis Phase fraction per ROIs (triangle, circle, rectangle, or polygon)
Magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics also usable
Measurement of the total phase percentage per phase and per ROI
Selectable minimum area detection

■


*1 Possible with OLYMPUS Stream Motion and other Stream packages with Automation solution
*2 Stream chart with the distribution can be output

Informations for customers using LEXT and DSX with OLYMPUS Stream 

Please confirm here if  since there are some restrictions of the software version combination as follows.

Resources

Application Notes

Nonmetallic Inclusion Analysis in Steel
Using a microscope to inspect the solder wettability of mounting components
Evaluation of Steel Grain Size
Evaluation of spheroidal graphite cast iron
Evaluation using visual comparisons with standard diagrams of industrial standards
Measuring Weld Throat Thickness with OLYMPUS Stream Image Analysis Software
Using Image Analysis Software to Measure Throwing Power or PCB Copper Plating Thickness Uniformity
Au Area Ratio Measurement for Bonded Surfaces after Bump Abruption
Cast Iron Analysis
Grain Size Analysis in Metals and Alloys
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Videos

Olympus Stream Image Analysis Software: How to acquire an image without halation using the MIX illumination method
Metal Industry Inspection Solutions video
OLYMPUS Stream - Count and Measure (Object Detection and Classification)
OLYMPUS Stream - License Activation
Tech Tours - Olympus Industrial Microscopes
OLYMPUS Stream - Performing Manual Magnification Calibration
OLYMPUS Stream - Material Solution Modules
OLYMPUS Stream - Image-Analysis Software
OLYMPUS Stream - My Functions Tool Window
OLYMPUS Stream - Layer Thickness Solution
OLYMPUS Stream - HDR (High Dynamic Range) Imaging
OLYMPUS Stream - Inclusion Worst Field Analysis (Non-metallic Inclusions)
OLYMPUS Stream - Grains Intercept
OLYMPUS Stream - Configuring and Using the U-CBS Coded Nosepiece Controller
OLYMPUS Stream - MIA - Automated Stitched Image Acquisition
OLYMPUS Stream - MIA - Manual Stitched Image Aquisition
OLYMPUS Stream - Automated EFI
OLYMPUS Stream - Macro Recorder
OLYMPUS Stream - 3D Imaging and Measurements
OLYMPUS Stream - Manual EFI Capture
OLYMPUS Stream - Count and Measure with Particle Separation
OLYMPUS Stream - Page Template Creation
OLYMPUS Stream - Report Generation
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Infographics

OLYMPUS Stream Metallography Solutions Infographic

Brochures

OLYMPUS Stream Image Analysis Software 2.4 Leaflet
Industrial Microscopy Overview Brochure
OLYMPUS Stream Image Analysis Software 2.4.3 Brochure
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Manuals

OLYMPUS Stream Installation Manual
OLYMPUS Stream Count and Measure Function
OLYMPUS Stream Quick Reference Guide
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Solutions

Metal Industry Inspection Solutions
Wind Turbine Inspection Solutions
Corrosion Inspection Solutions
Composite Inspection Solutions
Measurement Solutions
Weld Inspection Solutions
 Show More

Blog

Acquiring High-Quality Images Through Silicon Without Damaging the Finished Product
Using Image Analysis Software to Automatically Detect Particles in Cadmium Zinc Telluride
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