OLYMPUS Stream software offers intelligent step-by-step workflows to acquire sharp, crisp images that are ready for quantitative measurements and professional reporting based on the latest standards. Users of any experience level can conduct complex image analysis tasks, from image acquisition to standard reporting, under any imaging condition.
Designed for flexibility, the software has a broad scope of functions necessary to conduct fast, precise observations on a variety of samples while maintaining data security and reliability. Optional solutions enable users to adapt OLYMPUS Stream software to their application, including quality analysis, research and development, process development, and quality control.
Click "Request a Demo" and note that you would like a 30-day license in the first box.
The dynamic user interface reduces desktop clutter and confusion by only displaying the tools and functions you want to use. The interface guides you through every step of the process, including image capture, image processing, and report creation. Both simple and complex measurements can be easily conducted using the software’s intuitive set of tools.
Do you encounter the following situations frequently?
OLYMPUS Stream software is the solution.
The software’s organized layouts contain the minimum necessary functions for performing the required tasks. Simplified layouts help streamline the inspection workflow and efficiently guide users through the inspection process.
Image acquisition: capture your image with a simple mouse click
Estimating the pore size using live digital reticules (Cross section of die casting)
The software supports live image functions for instant feedback. The software enables you to interact with the live image, which is automatically calibrated, and perform quantitative measurements.
Quickly create images of samples that extend beyond the standard depth of focus or the field of view. The instant extended focus image (EFI) function uses the fine focus adjustment to combine many images taken at different Z-levels to build a single combined image that is entirely in focus. Instant multiple image alignment (MIA) makes it easy to create panoramic images simply by moving the XY stage; a motorized stage is no longer necessary.
Instant EFI image of crystal: fully focused image is created even in low-contrast sample areas
Instant MIA image of a coin
Quickly recall previously used camera settings to capture repeatable images with a consistent look and feel. When using a motorized microscope, this function can automatically recall previous hardware settings. If you’re using a BX, GX, or MX series microscope, the software guides you to manually recall settings.
| Operation Step | Operator A | Operator B |
| Different operators use different settings |
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| Easily verify the correct settings |
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| Synchronize observation settings |
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| Regardless of different operators, the settings are the same |
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3D profilometry of wear track
This solution creates height maps from stacks of images acquired automatically or manually at different Z positions. The resulting image can be visualized in three dimensions using the surface view. Measurements, such as 3D profiles and height differences between two or several points, can be performed, and the results exported into workbooks and Microsoft Excel spreadsheets.
Have you ever encountered the following problems?
Image Capture
Measurement
Sharing
OLYMPUS Stream software has the solution.
The software guides you through the correct order of functions when performing image analysis, including methods that comply with most common international standards. When using a motorized stage, the alignment feature speeds up your work on multiple sample locations. Please refer to the Solution tab for more Materials Solutions information.
The automatic calibration feature uses a standard micrometer to calibrate the microscope and automatically generates a calibration report. This helps eliminate user variability in the calibration process for more reliable measurements.
The software’s automated tools can create a very large set of data in just a few minutes. Automatic magnification calibration using a calibrated grating reticle helps ensure that your images are displayed with the proper scale bar and that your measurements are confirmed. Large areas can be imaged automatically using motorized XYZ stages, enabling the creation of images of large parts with high resolution.
Sharp and high-contrast MIA image of integrated circuit (IC) pattern (dark field observation with 20X objective lens)
The software tools features quantitative information about your sample. Interactive measurements on live and still images provide the basic dimensional information (length, area, and diameter), and the results are directly visible on the image.
Advanced interactive measurements include the magic wand and complex polygonal shapes for semiautomatic area measurement, while the count and measure solution provides access to more than a one-hundred single particle parameters for quantitative analysis based on the threshold method.
Basic measurement (supra conductor)
Magic wand (supra conductor)
Object detection (supra conductor)
Creating a report often takes longer than capturing the image and taking the measurements. With the software, you can repeatedly produce smart and sophisticated reports based on predefined templates. Editing is simple, and reports can be exported to Microsoft Word, Excel, or PowerPoint. In addition, the software’s reporting tool enables digital zooming and magnification on acquired images. Report files are a reasonable size for easier data exchange by email.
Professional report summarizing particle counting data
OLYMPUS Stream software is a powerful and user-friendly tool for making measurements, developed for Olympus microscopes with the assistance of experienced microscope users. The software is available in a variety of packages designed to fit various needs from the entry-level OLYMPUS Stream Start software to advanced packages.
OLYMPUS Stream software is available in four packages based on functionality—Start, Basic, Essentials, and Motion.
Application-specific materials solution modules can be added to streamline repetitive analysis tasks. Olympus representatives can help you determine which package is right for you.
BX53M microscope and software system
The BX53M microscope employs coded functions that integrate the microscope’s hardware settings with OLYMPUS Stream software. The observation method, illumination intensity, and objective position are all recorded by the software and/or the handset. The microscope settings can be automatically saved with each image, making it easier to reproduce the settings at a later time and provide documentation for reporting purposes.
GX53 microscope and software system
Our digital cameras provide high-resolution viewing and fast image transfer while our software provides all the tools needed for today's complex metallurgical requirements.
Choose from extended measurements, standard metallography, and advanced metallography application-specific modules (over a dozen application specific routines are available), and automatically populate data and create reports that comply with common ASTM and ISO specifications.
Integrated microscope and software system
We offer several software platforms that integrate with our semiconductor microscope frames to control all motorized functions, including the digital camera and motorized stage. Each interface is designed for basic inspection and control, advanced image analysis, or repetitive site inspection and defect review.
SZX16 microscope and software system
Our stereo microscope motorized focus drive makes digital documentation with extended focal imaging (EFI) efficient and fully automatic. This even enables the creation of pseudo 3D images. The software offers tools for simple 2D measurements up to complex phase analysis and support many operations including observation, report generation, database creation, and archiving.
Use OLYMPUS Stream software for post-processing (Stream Desktop) with the complete range of DSX series digital microscopes and the LEXT 3D measuring laser microscope.
LEXT 3D measuring laser microscope
DSX digital microscope series
> View the LEXT 3D Measuring Laser Microscope
> View the DSX Digital Microscope
Excellent spatial resolution combined with a high pixel count exploit the full optical resolution of the objectives and enable the structures and details within the smallest samples to be imaged, even with low magnification objectives. High-definition images enable you to make observations exclusively on-screen without using the eyepieces.
The low-noise, high-resolution images of a 9-megapixel sensor enable the user to zoom deep into the sample, revealing its structures (sandstone)
High dynamic range (HDR) imaging improves image contrast in difficult conditions (very bright areas together with very dark areas in the same image). All cameras supported by OLYMPUS Stream software can be used in this mode, and dedicated cameras have an available live mode.
Clearly exposed for both dark and bright parts by HDR (Sample: fuel injector bulb)
Contrast enhancement by HDR (Sample: Sliced magnesite)
This illumination technique combines directional darkfield, which uses a circular LED to illuminate one or more quadrants at a given time, , and brightfield, fluorescence, or polarization, enabling you to highlight defects and differentiate raised surfaces from depressions that are normally difficult to see with conventional microscopes. MIX observation helps reduce a sample’s halation and is useful for visualizing a sample’s surface texture.
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Conventional: brightfield shines the light straight down on the sample while traditional darkfield highlights scratches and imperfections on a flat surface by illuminating the sample from the side of the objective |
Advanced: MIX is a combination of brightfield
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Industrial labs often require repeatable and reproducible results as part of their standard operating procedures. OLYMPUS Stream software facilitates inspection, measurement, and analysis with a simple and reliable workflow. The software offers a variety of tools for various materials science analyses, so you can be confident in your results.
Olympus industrial microscopes support metallurgical analysis solutions
The software’s count and measure solution uses advanced threshold methods to reliably separate objects, such as particles and scratches, from the background. More than 50 different object measurement and classification parameters are available, including shape, size, position, and pixel properties.
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Conventional software |
Etched steel microstructure
| OLYMPUS Stream |
Grain classification results
Example of Macro Manager set up for Count and Measure
You can preset complex imaging and measurement tasks with the macro manager and then execute it with a single click.
Enhanced contrast using the DCE filter (dendrite in an aluminum casting)
The software has a variety of useful filters for edge detection, smoothing, and other purposes.
The OLYMPUS Stream 3D solution provides coded and motorized Z control and instant EFI with height mapping capabilities to measure a three-dimensional sample.
3D surface view (Roughness test sample)
Single view and 3D profile measurement
Metallography is used in materials development, incoming inspection, production and manufacturing control, and failure analysis.
To produce parts that are high quality, scratches, cracks, pore size, and contamination is strictly monitored during the production process.
In printed circuit boards, very thin plates are coated and verifying the homogeneity of this coating is a key element of product quality.
Surface coatings are any mixture of film-forming materials that contain pigments, solvents, and other additives, which, when applied to a surface and cured or dried, yields a thin film that is functional and often decorative.
| Solutions | Descriptions |
| Grain Intercept |
Steel manufacturers use this solution for measuring and controlling grain size after cross-sectioning, polishing, or etching steel samples.
This function is based on overlaying of “test lines” and counting the number of intercepts with grain boundaries. |
| Grain Planimetric |
Steel manufacturers use this solution for measuring and controlling grain size after cross-sectioning, polishing, or etching steel samples.
This function reconstructs boundaries for each grain and conducts grain sizing with the area percentage of the second phase. |
| Inclusion Worst Field | Steel manufacturers use this solution for measuring and controlling the shape and size of nonmetallic inclusions (oxide, alumina, sulfide, or silicate) in steel. |
| Cast Iron | Casting manufacturers who need to measure and control the graphite nodularity and check the mechanical characteristics of their cast products use this solution. |
| Chart Comparison | A live or still image can be overlaid onto standard charts for comparison. Function preview is available. |
| Layer Thickness | One or multiple layers of a cross-sectioned sample can be measured using the Layer Thickness solution. The shapes are defined, and the layers automatically measured. |
| Coating Thickness | This solution enables the measurement of coating thickness from top-view images using the Calotest method. |
| Automatic Measurements | This solution is used for creating measurements based on edge-detection on a live image with pattern recognition. |
| Throwing Power | This solution measures the distribution of copper plating thickness in through-holes or micro-vias. |
| Porosity | This solution enables pores to be measured either for area fraction or the number of surface pores using ROIs (circular, triangular, rectangular, and polygonal) and thresholds. |
| Particle Distribution | This solution is used to create particle size distribution histograms and tables from multiple images or image series. |
| Advanced Phase Analysis | This feature offers a new integrated solution to perform phase analysis on a selection of various regions of interest (ROIs) including triangles, circles, rectangles, and polygons. |
| Solutions | Metal/ Casting | Automotive | Glass/ Ceramic | Coating | Consumer goods | Electronic devices |
| Grain Intercept | ■ | ■ | ■ | |||
| Grain Planimetric | ■ | ■ | ■ | |||
| Inclusion Worst Field | ■ | ■ | ■ | |||
| Cast Iron | ■ | ■ | ■ | |||
| Chart Comparison | ■ | ■ | ■ | |||
| Layer Thickness | ■ | |||||
| Coating Thickness | ■ | |||||
| Automatic Measurements | ■ | ■ | ||||
| Throwing Power | ■ | ■ | ||||
| Porosity | ■ | ■ | ■ | ■ | ■ | ■ |
| Particle Distribution | ■ | ■ | ■ | ■ | ■ | ■ |
| Advanced Phase Analysis | ■ | ■ | ■ | ■ | ■ | ■ |
| Solutions |
Semicon
ductors | Fluids & oils |
Machined
parts |
Carbon/
Composites |
Chemical/
Plastic/ Rubber |
Industrial
scientific research |
| Grain Intercept | ■ | ■ | ■ | |||
| Grain Planimetric | ■ | ■ | ■ | |||
| Inclusion Worst Field | ■ | ■ | ■ | |||
| Cast Iron | ■ | ■ | ■ | |||
| Chart Comparison | ■ | ■ | ■ | |||
| Layer Thickness | ■ | ■ | ||||
| Coating Thickness | ■ | |||||
| Automatic Measurements | ||||||
| Throwing Power | ||||||
| Porosity | ■ | ■ | ■ | ■ | ■ | ■ |
| Particle Distribution | ■ | ■ | ■ | ■ | ■ | ■ |
| Advanced Phase Analysis | ■ | ■ | ■ | ■ | ■ | ■ |
| ■: Standard □: Optional | Start | Basic | Essentials | Motion | Desktop | |
| Image Acquisition | Basic image acquisition including HDR and auto-calibration of magnification and Live HDR*1, and position navigation*1 | ■ | ■ | ■ | ■ | |
| Software autofocus*2 and movie acquisition (Avi format) | ■ | ■ | ■ | |||
| Time lapse, Instant EFI, and Instant/Manual MIA*3 | □ | ■ | ■ | |||
| Motorized EFI/MIA and Z-stack acquisition | □ | □ | ■ | |||
| Remote live view (NetCam) | □ | □ | □ | |||
| Image and Customization Tools | Basic tool windows (Image history, properties, navigator, gallery view tool window)*4 | ■ | ■ | ■ | ■ | ■ |
| Annotations, layer management, scale bar, cross hair, info stamp display, and image filters | ■ | ■ | ■ | ■ | ■ | |
| Digital reticle/grid, line profile display, My Function, layout management, and Macro Manager | ■ | ■ | ■ | ■ | ||
| Measurements/ Image Analysis | Basic interactive measurement (distance, angles, rectangles, circles, ellipses, polygons, circle-to-circle distance, angle ruler, and line ruler) and data export to MS-Excel | ■ | ■ | ■ | ■ | ■ |
| Phase analysis, magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics | □ | ■ | ■ | ■ | ||
| 3D measurements, 3D profile measurements, and 3D surface view | □ | □ | ■ | ■ | ||
| Reporting*5 | Report creation (MS-Word, and MS-Excel formats) | ■ | ■ | ■ | ■ | |
| Presentation creation | □ | □ | □ | □ | ||
| Data Management | Stream document storage*6 | ■ | ■ | ■ | ■ | |
| Workgroup Database with structured data format | □ | □ | □ | □ | ||
| Device Support | Olympus microscopes*7 and Olympus cameras*8 | ■ | ■ | ■ | ■ | |
| Non-Olympus cameras and image source converter*9 | ■ | ■ | ■ | |||
| Non-Olympus stage controller*9 | □ | □ | ■ | |||
| PC Requirements | |
| CPU | Intel Core 2 Duo or higher (Intel Core i5, i7 recommended) |
| RAM / Hard disk / DVD drive | 3 GB or more (8 GB recommended)/2.4 GB or more free space/DVD+R DL compatible |
| OS*10 | Windows 10 Pro (32-bit/64-bit) , Windows 8.1 (32-bit/64-bit) Pro, Windows 7 (32-bit/64-bit) Ultimate with SP1, Windows 7 (32-bit/64-bit) Professional with SP1 |
| .NET Framework | Version 4.5.2 or 4.6.1 |
| Graphic card*11 | 1280 × 1024 monitor resolution with 32-bit video card |
| Web browser | Windows Internet Explorer 8, 9, 10, or 11 |
*1 Requires the DP74 camera, and the Live HDR function requires 64-bit OS.
*2 Requires Olympus microscope with motorized Z-axis or external motorized Z-axis with OLYMPUS Stream Motion or Automation Solution
*3 Instant MIA may not work properly with some cameras
*4 Write and read all major file formats and open Olympus proprietary formats (DSX, LEXT and POIR file formats)
*5 Requires Microsoft Office 2016, 2013 (SP1) or 2010 (SP2)
*6 Using Microsoft SQL Server Express
*7 Supports MX61A, MX61, MX61L, MX61A, MX63L, MX63, GX53, BX3M-CB, BX3M-CBFM, BX-UCB, BX-REMCB, IX-UCB, SZX-MDCU, SZX2-MDCU, U-CBS, STM7.
*8 Supports DP21, DP22, DP26, DP27, DP73, DP74, LC20, LC30, SC30, SC50, SC100, SC180, UC30, UC50, UC90, XC10, XC30, XC50, XM10.
*9 Please contact Olympus for supported device information
*10 The DP74 supports Windows 10/8.1 (64-bit) and Windows 7 (32-bit/64-bit). The DP73 supports Windows 8.1/7 (64-bit). The SC180/UC90 support Windows 10/8.1/7 (64-bit).
*11 Required configurations for LiveHDR in DP74. Graphic board applicable to CUDA made by NVIDIA (compute capability 2.1 or higher). Graphic board driver applicable to CUDA 7.0 or higher.
| Solutions | Compatiblity | Functions | ||
| Basic/ Essentials | Motion | Desktop | Measurement Type | |
| 3D | □ | Included | Partially included* | 3D Surface View, 3D Measurement, 3D Profile Measurement, Motorized Z-stack/EFI, Instant EFI with height map (requires coded or motorized Z-axis). |
| Automation | □ | Included | Automation Solution (Motorized/Manual/Instant MIA, Motorized/Instant EFI without height map (requires coded or motorized XYZ-axis) and with time lapse. | |
| Weld Measurement | □ | □ | □ | Weld Measurement solution (measurements for geometric distortion introduced by the heating during welding). |
| Count & Measure | □ | □ | □ |
Multiple threshold methods are available (automatic, manual HSV, manual and adaptative)
The system can automatically measure multiple parameters on all segmented objects (Area, Aspect Ratio, Bisector, Bounding Box, Gravity Center, ID, Mass Center, Intensity Values, Convexity, Diameters, Elongation, Feret, Extent, Next Neighbor Distance, Orientation, Perimeter, Radius, Shape, Sphericity, etc.) Spreadsheet and charts with individual and distribution measurements. |
* Not possible to use the functions relating to image acquisition
| Solutions | Compatiblity | Output | ||||
| Basic | Essentials/ Motion | Desktop | Automatic report creation | Workbook with individual measurement | Store all results in the image properties | |
| Grain Intercept | □ | □ | □ | ■ | ■ | ■ |
| Grain Planimetric | □ | □ | □ | ■ | ■*2 | ■ |
| Inclusion Worst Field | □ | □ | □ | ■ | ■ | ■ |
| Cast Iron | □ | □ | □ | ■ | ■ | ■ |
| Chart Comparison | □ | □ | □ | ■ | ■ | |
| Layer Thickness | □ | □ | □ | ■ | ■ | |
| Coating Thickness | □ | □ | □ | ■ | ■ | ■ |
| Automatic Measurements | □ | □ | ■ | |||
| Throwing Power | □ | □ | ■ | ■ | ■ | |
| Porosity | □ | □ | □ | ■ | ■ | ■ |
| Particle Distribution | □ | □ | □ | ■ | ■ | ■ |
| Advanced Phase Analysis | □ | Included | Included | ■ | ■ | |
| Solutions | Functions | ||
| Measurement type | Supported standards |
Multiple stage location*1 Sample alignment*1 | |
| Grain Intercept |
Selection of pattern (circles, cross, cross & circles, vertical lines, horizontal lines, horizontal & vertical lines)
Definition of the number of test lines for determination of grain elongation Displays the G-value in the Material Solution tool window | ISO 643: 2012, JIS G 0551: 2013, JIS G 0552: 1998, ASTM E112: 2013, DIN 50601: 1985, GOST 5639: 1982, GB/T 6394: 2002 | ■ |
| Grain Planimetric |
Automatic extraction of grain boundaries
User interaction using Stream sliders for improved usability Displays the G-value histogram in the Material Solution and position navigation*1 for direct interaction | ISO 643: 2012, JIS G 0551: 2013, JIS G 0552: 1998, ASTM E112: 2013, DIN 50601: 1985, GOST 5639: 1982, GB/T 6394: 2002 | ■ |
| Inclusion Worst Field |
Automatic detection of non-metallic inclusion using colors, shape, and size
Automatic classification of oxides, sulfides, silicates, and aluminates Live display of the detected inclusion with its rating |
ISO 4967 (method A): 2013, JIS G 0555 (method A): 2003, ASTM E45 (method A): 2013, EN 10247 (methods P and M): 2007, DIN 50602 (method M): 1985, GB/T 10561 (method A):
2005, UNI 3244 (method M): 1980 | ■ |
| Cast Iron |
On polished samples: automatically measures the characteristics of the graphite content (size, shape, and distribution)
On etched samples: measures the ferrite to pearlite ratio Integrated workflow that takes into account the sample status (etched or polished) |
ISO 945-1: 2010, ISO 16112: 2017, JIS G 5502: 2001, JIS G 5505: 2013, ASTM A247: 17, ASTM E2567: 16a, NF A04-197:
2004, GB/T 9441: 2009, KS D 4302: 2006 | |
| Chart Comparison |
Multiple displays available, including live overlay
User interaction using Stream sliders for improved usability Calculates statistics on the selected values | ISO 643: 1983, ISO 643: 2012, ISO 945: 2008, ASTM E 112: 2004, EN 10247: 2007, DIN 50602: 1985, SEP 1572: 1971, SEP 1520: 1998, ISO 4505:1978 | |
| Layer Thickness |
Layer boundaries can be specified using automatic detection, magic wand, or manual mode (using 2 or 3 points).
Individual measurements can be added or deleted later on Measurement of any type of layers (with even or uneven boundaries) is supported. Layer thickness measurement calculates mean, maximum, and minimum values as well as statistical data for each individual layer. | ||
| Coating Thickness |
Prints are measured from top view
Calculation of the coating thickness according to the sample geometry | EN 1071: 2002, VDI 3824: 2001 | |
| Automatic Measurements |
Automatically measures distances (point-to-point, point-to-line, circle-to-circle, point-to-circle, line-to-circle)
Automatically measures circle diameter (roundness, bounding box) Automatically measures angles between two lines Definition of tolerances values for measurement and visual validation Expert and user mode for measurement repeatability | ■ | |
| Throwing Power |
Manual measurements of selected point of interest on the sample
Predefined points that will be triggered by the operator Selection of the vias type and documentation of the analysis Report and automatic calculation according to the manual measurements | ||
| Porosity |
Pore detection per ROIs (triangle, circle, rectangle, polygon, or magic wand) with overlapping capability
Measurement of the pore density, count, and specific area Measurement of the biggest pore Measurement of a specified size range | ■ | |
| Particle Distribution |
Particles are defined using simplified threshold settings.
Automatic classification according to a selected parameter (size, color, or shape) Measurement of ROIs and multiple thresholds Definition of validation and coding according to user-defined standards | ■ | |
| Advanced Phase Analysis |
Phase fraction per ROIs (triangle, circle, rectangle, or polygon)
Magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics also usable Measurement of the total phase percentage per phase and per ROI Selectable minimum area detection | ■ | |
*1 Possible with OLYMPUS Stream Motion and other Stream packages with Automation solution
*2 Stream chart with the distribution can be output
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