Olympus Logo

Contact Us   Contact Us  

  • Products▾
    • Thickness and Flaw Inspection Solutions▾
      • Flaw Detectors / Phased Array Flaw Detectors▾
        • Ultrasonic Flaw Detectors
        • Phased Array
        • Eddy Current Products
        • Eddy Current Array Products
        • Bond Testing
      • Thickness Gauges▾
        • 27MG
        • 45MG
        • 38DL PLUS
        • Magna-Mike 8600
        • 35RDC
        • Transducers and Accessories
      • Transducers and Probes▾
        • Single and Dual Element Transducers
        • Eddy Current Probes
        • Probes for Tube Inspection
        • Phased Array Probes
        • BondMaster Probes
      • Automated Inspection Systems▾
        • Wheel Inspection System
        • Bar Inspection Systems
        • Tube Inspection Systems
        • Friction Stir Weld Inspection System
      • NDT Systems Instrumentation ▾
        • FOCUS PX / PC / SDK
        • QuickScan
      • NDT Industrial Scanners▾
        • Weld Inspection Scanners
        • Corrosion Inspection Scanners
        • Aerospace/Wind Blade Inspection Scanners
        • Scanner Accessories
      • The Olympus Scientific Cloud
    • XRF and XRD Analyzers▾
      • Handheld XRF Analyzers▾
        • Vanta
        • Vanta Element
        • DELTA Professional
      • Compact and Portable XRF Analyzers▾
        • Vanta
        • Vanta Element
        • GoldXpert
        • Xpert for Consumer/RoHS
      • Process XRF Analyzers▾
        • Vanta iX
      • XRD Analyzers▾
        • TERRA II Portable XRD Analyzer
        • BTX III Benchtop XRD Analyzer
      • OEM Solutions▾
        • X-STREAM
      • Applications and Solutions Key
      • The Olympus Scientific Cloud
    • Industrial Microscopes▾
      • Laser Confocal Microscopes▾
        • OLS5100
      • Digital Microscopes
      • Measuring Microscopes▾
        • STM7
        • STM7-BSW
      • Cleanliness Inspector▾
        • OLYMPUS CIX100
      • Light Microscopes▾
        • Upright Microscopes
        • Inverted Microscopes
        • Modular Microscopes
      • Semiconductor & Flat Panel Display Inspection Microscopes▾
        • MX63 / MX63L
        • AL120
        • AL120-12
      • Stereo Microscopes▾
        • SZX16
        • SZX10
        • SZX7
        • SZ61/SZ51
      • Digital Cameras▾
        • DP28
        • DP74
        • SC180
        • DP23
        • LC30
        • XM10
        • XM10IR
      • Image Analysis Software▾
        • OLYMPUS Stream
      • Micro Spectrophotometer▾
        • USPM-RU-W
        • USPM-RU III
      • Objective Lenses▾
        • MPLAPON
        • MPLAPON-Oil
        • MPLN
        • MPLN-BD
        • MPLFLN
        • MPLFLN-BD
        • MPLFLN-BDP
        • LMPLFLN
        • LMPLFLN-BD
        • SLMPLN
        • LCPLFLN-LCD
        • LMPLN-IR/LCPLN-IR
        • White Light Interferometry Objective
        • Micrometer
      • OEM Microscope Components for Integration
      • Microscope FAQ
    • Videoscopes and Borescopes▾
      • Videoscopes▾
        • IPLEX NX
        • IPLEX GAir
        • IPLEX GX/GT
        • IPLEX G Lite
        • IPLEX TX
        • IPLEX Long Scope Solution
      • Fiberscopes▾
        • Small Diameter Fiberscopes
      • Rigid Borescopes▾
        • Standard Rigid Borescopes
        • Swing Prism Borescopes
        • Zoom Swing Prism Borescopes
        • MK Modular Mini-Scope
        • Aeroengine Borescopes
      • Light Sources
      • Inspection Assist Software▾
        • InHelp
  • Industries
  • Resources
  • Learn
  • Blog
  • Support▾
    • Contact Us
    • Customer Service
    • XRF and XRD Technical Support
    • Service Centers
    • Custom Financing Solutions
    • Olympus Scientific Cloud
    • Software Downloads
    • Instruction Manual Downloads
    • ISO Certifications
    • MSDS Datasheets
    • Compliance and Ethics at Olympus
    • Product Information
    • Product Service Termination List
    • Discontinued and Obsolete Products
    • Terms and Conditions of Supply
    • CIC
    • Olympus Technolab
    • Microscope Classroom
  • Rentals
  • Shop
  • Search
  • My Account
    • IMS Log in
    • IMS Registration
    • My Apps
    • My Devices
    • My Data
    • OSC Marketplace
    • My Organization
    • OSC Log in
    • OSC Log in
    • Log Out
    • Log Out
Industrial Solutions
LEXT Objectives for Metrology
Guaranteed Measurement Accuracy to 6 nm
Learn More
Elixon Theatre jQuery Plugin

Contact Us   Contact Us  

Scientific Solutions 
Test. Measure. Image. Analyze.

Thickness and Flaw Inspection SolutionsThickness and Flaw Inspection SolutionsXRF and XRDXRF and XRD AnalyzersRemote visual inspectionVideoscopes and BorescopesIndustrial microscopesIndustrial Microscopes
Automated Inspection SystemsAutomated Inspection SystemsOEM Microscope ComponentsOEM Microscope ComponentsOlympus Scientific CloudOlympus Scientific CloudAbout Olympus Scientific SolutionsAbout Olympus Scientific Solutions
What's New
  • Events
  • Newsletter Sign-up
  • Press Releases

The Olympus NDT Podcast. INSPECT TECH
Listen to Our New Podcast

Olympus LifeScience

Copyright OLYMPUS CORPORATION, All rights reserved.

Global | Terms Of Use | Privacy Notice | Cookies | | About Us | Careers | Careers | Sitemap

Copyright OLYMPUS CORPORATION, All rights reserved.

Global | Terms Of Use | Privacy Notice | Cookies | | About Us | Imprint | Careers | Careers | Sitemap

  • Youtube
  • LinkedIn
  • Twitter
  • Facebook
Cancel

Redirecting

You are being redirected to our local site.