Olympus Logo

Contact Us Contact Us

  • Products▾
    • Thickness and Flaw Inspection Solutions▾
      • Flaw Detectors / Phased Array Flaw Detectors▾
        • Ultrasonic Flaw Detectors
        • Phased Array
        • Eddy Current Products
        • Eddy Current Array Products
        • Bond Testing
      • Thickness Gauges▾
        • 27MG
        • 45MG
        • 38DL PLUS
        • Magna-Mike 8600
        • 35RDC
        • Transducers and Accessories
      • Transducers and Probes▾
        • Single and Dual Element Transducers
        • Eddy Current Probes
        • Probes for Tube Inspection
        • Phased Array Probes
        • BondMaster Probes
      • Automated Inspection Systems▾
        • Wheel Inspection System
        • Bar Inspection Systems
        • Tube Inspection Systems
        • Friction Stir Weld Inspection System
      • NDT Systems Instrumentation ▾
        • FOCUS PX / PC / SDK
        • QuickScan
      • NDT Industrial Scanners▾
        • Weld Inspection Scanners
        • Corrosion Inspection Scanners
        • Aerospace/Wind Blade Inspection Scanners
        • Scanner Accessories
      • The Olympus Scientific Cloud
    • XRF and XRD Analyzers▾
      • Handheld XRF Analyzers▾
        • Vanta
        • Vanta Element
        • DELTA Professional
      • Compact and Portable XRF Analyzers▾
        • Vanta
        • Vanta Element
        • GoldXpert
        • Xpert for Consumer/RoHS
      • Process XRF Analyzers▾
        • Vanta iX
        • FOX-IQ
      • XRD Analyzers▾
        • TERRA II Portable XRD Analyzer
        • BTX III Benchtop XRD Analyzer
      • OEM Solutions▾
        • X-STREAM
      • Applications and Solutions Key
      • The Olympus Scientific Cloud
    • Industrial Microscopes▾
      • Scanning Probe Microscopy▾
        • OLS4500
      • Laser Confocal Microscopes▾
        • OLS5100
      • Digital Microscopes
      • Measuring Microscopes▾
        • STM7
        • STM7-BSW
      • Cleanliness Inspector▾
        • OLYMPUS CIX100
      • Light Microscopes▾
        • Upright Microscopes
        • Inverted Microscopes
        • Modular Microscopes
      • Semiconductor & Flat Panel Display Inspection Microscopes▾
        • MX63 / MX63L
        • AL120
        • AL120-12
      • Stereo Microscopes▾
        • SZX16
        • SZX10
        • SZX7
        • SZ61/SZ51
      • Digital Cameras▾
        • DP74
        • SC180
        • UC90
        • DP27
        • SC50
        • LC30
        • DP22
        • XM10
        • XM10IR
      • Image Analysis Software▾
        • OLYMPUS Stream
      • Micro Spectrophotometer▾
        • USPM-RU-W
        • USPM-RU III
      • Objective Lenses▾
        • MPLAPON
        • MPLAPON-Oil
        • MPLN
        • MPLN-BD
        • MPLFLN
        • MPLFLN-BD
        • MPLFLN-BDP
        • LMPLFLN
        • LMPLFLN-BD
        • SLMPLN
        • LCPLFLN-LCD
        • LMPLN-IR/LCPLN-IR
        • White Light Interferometry Objective
        • Micrometer
      • OEM Microscope Components for Integration▾
        • Equipment Integration Solutions
        • Objective Lenses
        • Optical Microscope Frames
        • Super Wide Tube Lens
        • Optical Microscope Modules
        • Modular Microscope Assemblies
      • Microscope FAQ
    • Videoscopes and Borescopes▾
      • Videoscopes▾
        • IPLEX NX
        • IPLEX GAir
        • IPLEX GX/GT
        • IPLEX G Lite
        • IPLEX TX
        • IPLEX Long Scope Solution
      • Fiberscopes▾
        • Small Diameter Fiberscopes
      • Rigid Borescopes▾
        • Standard Rigid Borescopes
        • Swing Prism Borescopes
        • Zoom Swing Prism Borescopes
        • MK Modular Mini-Scope
        • Aeroengine Borescopes
      • Light Sources
      • Inspection Assist Software▾
        • InHelp
  • Industries
  • Blog
  • Resources
  • Support▾
    • Contact Us
    • Olympus Scientific Cloud
    • Olympus Training Member
    • Customer Service
    • Service Centers
    • Software Downloads
    • Product Information
    • Discontinued and Obsolete Products
    • Product Service Termination List
    • ISO Certifications
    • MSDS Datasheets
    • Terms and Conditions of Supply
    • CIC
    • Olympus Technolab
    • Microscope Classroom
    • Compliance and Ethics at Olympus
    • Same Day Shipping Program
    • Custom Financing Solutions
  • Rentals
  • Shop
  • Search
  • My Account
    • IMS Log in
    • IMS Registration
    • My Apps
    • My Devices
    • My Data
    • OSC Marketplace
    • My Organization
    • OSC Log in
    • OSC Log in
    • Log Out
    • Log Out
Industrial Solutions

Eddy Current Probes

Contact UsContact Us
Get a QuoteGet a Quote
Request a DemoTest your applicationRequest a DemoTest your application
Home/ Products/ Flaw Detectors / Phased Array Flaw Detectors/ Eddy Current Products/ Eddy Current Probes
Back to Resources

Olympus eddy current probes consist of the acquired brands of Nortec and NDT Engineering. We offer more than 10,000 standard and custom designed eddy current probes, standard references, and accessories. This section features many of the standard design probes that are available in a wide range of diameters, frequencies, and connector styles.

Olympus also offers custom probe designs to meet specific inspection requirements. Eddy current probes may be designed to match the contours of a part or shaped to fit into a fixture for fast and accurate inspections.

Please note that product availability varies by region. Contact your local Olympus sales office for more information.

Loading...
  • Overview
  • Resources

Overview

Rotating Plastic Scanner Probes

The rotating plastic scanner probes section features a variety of expandable plastic-tip probes and stainless-steel backshell probes, including the SUB series, SPO-5965 series, SPO-3564 series, and standard series.

View Product

Manual Bolt Hole Probes

Manual bolt hole probe coils are positioned at right angles to the shaft direction. These probes are rotated by hand to inspect holes with the fasteners removed. Standard (fractional and metric) and custom diameters are available with either absolute or differential coils.

View Product

Spot Probes

Spot probes are used for discovering flaws both on and below surfaces. Their large coil diameter and low frequency operation are advantageous for scanning larger areas, and providing an increased detectable flaw size; typically equal to one-half of the probe diameter.

View Product

Weld Probes

Weld probes are designed to inspect ferrous welds. They provide a cost-effective alternative to magnetic particle inspection, which requires the part to be prepared (cleaned) prior to inspection.

View Product

Sliding Probes

Sliding probes are specifically designed to inspect rows of fasteners. They operate in reflection mode and are used to find surface and near-surface flaws. They come in adjustable types, which are able to accommodate different fastener sizes, and fixed types, which are usually procedure specific.

View Product

Conductivity Probes and Standards

Conductivity probes are designed for sorting non-ferrous metals and determining heat treatment condition or damage.

View Product

Right Angle Surface Probes

90° tip, stainless-steel shaft. Designed for general surface crack detection, these probes are available in a variety of lengths, and with various coil configurations, drops, and connector options.

View Product

Straight Shaft Surface Probes

Straight stainless-steel shaft. Designed for general surface crack detection, these probes are available in a variety of lengths, and with various coil configurations and connector options.

View Product

Angle Shaft Surface Probe

30° or 45° tip, stainless-steel shaft. Designed for general surface-crack detection, these probes are available in a variety of lengths, and with various coil configurations, drops, and connector options.

View Product

Flexible Shaft Surface Probes

Flexible copper shaft of these probes can be bent to various shapes. Designed for general surface crack detection, flexible surface probes are available in a variety of lengths, and with various coil configurations, drops, and connector options.

View Product

Bent Shaft Surface Probes

Bent shaft surface probes are general purpose stainless-steel probes used for surface or near-surface crack detection. They are available in a variety of sizes, and with various coil configurations and connector options.

View Product

Pencil Surface Probe

Pencil surface probes are general purpose plastic-tip probes used for surface or near-surface crack detection. They are available with various coil configuration and connector options. Pencil surface probes feature an adjustable collar for greater stability.

View Product

All Other Surface Probes

A specialized probe series including the Pencil 3551l probe, Blade probe, Plastic-Tip probe, Finger probe, and Spring Loaded probe.

View Product

Rotating Stainless Steel Scanner Probes

The rotating stainless steel scanner probes section includes a range of all-stainless-steel probes, including the standard series and the SEU series.

View Product

All Other Scanner Probes

The other rotating scanner probes section includes a variety of specialized scanner probes, such as the Adjustable X type series, the Adjustable Y type series, the Countersink series, and the Countersink Stainless Steel series.

View Product

Ring/Donut Probes

Ring/Donut probes are made to fit various fastener head diameters. Their principal use is for subsurface crack detection with the fastener in place. They are available in both bridge and reflection configurations.

View Product

Cables and Adaptors

Olympus manufactures high quality cables and adaptors to fit with all eddy current probe models.

View Product

Standards

Reference standards should be used in every application and are available in many configurations and materials.

View Product

Resources

Application Notes

Eddy Current Weld Inspection
Corrosion Detection and Measurement Using Eddy Current Methods
Inspecting Areas Close To Edges
Fastener Hole Crack Detection Using Adjustable Slide Probes
 Show More

White Papers

Eddy Current Probes and Application Guide
Introduction to Eddy Current Testing
Eddy Current Probe Types and Their Usage
 Show More

Tutorials

Eddy Current Array Tutorial

Brochures

Eddy Current Probes Catalog

Sorry, this page is not available in your country
Let us know what you're looking for by filling out the form below.

Contact Us

Please choose your areas of interest.
Subscribe to the Olympus IMS Newsletter, an e-newsletter that will keep you posted on special offers, new products, or applications.

  • Contact UsContact Us
  • Get a QuoteGet a Quote
  • Request a DemoTest your applicationRequest a DemoTest your application
  • Contact Us
  • Thickness and Flaw Inspection Solutions
    • Flaw Detectors / Phased Array Flaw Detectors
      • Ultrasonic Flaw Detectors
      • Phased Array
      • Eddy Current Products
        • OmniScan MX ECA/ECT
        • NORTEC 600
        • Rotating Bolthole Scanners
        • Eddy Current Probes
        • MultiScan MS5800 for Tube Inspection
        • Probes for Tube Inspection
      • Eddy Current Array Products
      • Bond Testing
    • Thickness Gauges
    • Transducers and Probes
    • Automated Inspection Systems
    • NDT Systems Instrumentation
    • NDT Industrial Scanners
    • The Olympus Scientific Cloud
  • XRF and XRD Analyzers
  • Industrial Microscopes
  • Videoscopes and Borescopes
  • Subscribe to Newsletters
Home/ Products/ Flaw Detectors / Phased Array Flaw Detectors/ Eddy Current Products/ Eddy Current Probes
Print

Copyright OLYMPUS CORPORATION, All rights reserved.

Global | Terms Of Use | Privacy Notice | Cookies | About Us | Careers | Careers | Sitemap

Copyright OLYMPUS CORPORATION, All rights reserved.

Global | Terms Of Use | Privacy Notice | Cookies | About Us | Imprint | Careers | Careers | Sitemap

  • Youtube
  • LinkedIn
  • Twitter
  • Facebook

This site uses cookies to enhance performance, analyze traffic, and for ads measurement purposes. If you do not change your web settings, cookies will continue to be used on this website. To learn more about how we use cookies on this website, and how you can restrict our use of cookies, please review our Cookie Policy.

OK
Cancel

Redirecting

You are being redirected to our local site.