OmniScan™ X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities
Power You Can Carry
Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications.
OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM
Confidence You Can See
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.
The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector.
The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.
See What You’ve Been Missing with PCI
Our innovative amplitude-free live phase coherence imaging (PCI) improves small-defect sensitivity and penetration in noisy materials, all while easing your setup and simplifying sizing. Available on the OmniScan X3 64 flaw detector as of MXU 5.10.
Virtual Collaboration, Virtually Anywhere
The X3 Remote Collaboration Service (X3 RCS) enables you to share your screen, allow a remote collaborator to control the unit, and host a video conference with participants located almost anywhere in the world.
Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point.
Slide Right: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law.
Slide Left: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster.
Slide to compare these OmniScan models
Slide to compare these OmniScan models
Access Full 128-Element Aperture TFM
Made possible by new generation electronics, TFM imaging offers better focusing capabilities for smaller indications and an improved signal-to-noise ratio (SNR). With its 128-element aperture capacity, the OmniScan X3 64 model provides enhanced image clarity.
Slide Right: This TFM image was acquired with 64 elements of a 128-element probe (3.5L128-I4 model) using an OmniScan X3 32-channel model.
Slide Left: Here, the OmniScan X3 64 flaw detector enabled us to use the full 128-element aperture of our 3.5 MHz, 128-element I4 probe. Note the improved resolution and reduced background noise.
Acquire up to 4X Faster TFM
Achieve total focusing method (TFM) acquisition speeds of up to 4 times faster when using a 64-element probe. Compared to models with 32 pulsers, the OmniScan X3 64 flaw detector offers a significant improvement in efficiency owing to its larger aperture capability.
Improved Phased Array
Up to 3x as fast as the OmniScan MX2 flaw detector (max pulse repetition frequency)
Single TOFD menu for an accelerated calibration workflow
800% high amplitude range reduces the need to rescan
Onboard Dual Linear Array™ and Dual Matrix Array™ probe support accelerates setup creation
Ease Corrosion Monitoring Using Phased Array
Using phased array to inspect corrosion offers many benefits, including excellent coverage and resolution. However, becoming proficient in phased array techniques can be challenging. The OmniScan X3 flaw detector combines advanced functions such as gate synchronization with thoughtfully designed software and simplified menus, so you can obtain accurate data more easily. Configure your setup quickly thanks to its A-scan synchronization processing and manual time-corrected gain (TCG).
OmniScan X3 Series
Models
OmniScan X3
OmniScan X3 64
Configuration
16:64PR
16:128PR
32:128PR
64:128PR
Applications
Corrosion monitoring, Pipeline integrity, Manual PA/TFM, TOFD, Small piping
Multi-group high-productivity thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, TFM
Multi-group high-productivity very thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, High-productivity TFM, High Temperature hydrogen attack (HTHA), Advanced application development
The OmniScan X3 flaw detector’s MXU onboard software guides you through your inspection workflow. Learn more
OmniPC
Our complimentary OmniPC™ computer-based analysis software is compatible with OmniScan X3, OmniScan MX2, and OmniScan SX data files. Learn more
WeldSight
WeldSight™ advanced analysis and acquisition PC software is compatible with the OmniScan X3 flaw detector. For increased productivity, the WeldSight Remote Connect app installed on the acquisition unit enables you to perform the entire inspection workflow using WeldSight software. Learn more
Onboard Software
MXU
PAUT, TOFD, and TFM Inspection and Analysis Software
The OmniScan X3 flaw detector’s MXU onboard software provides streamlined, simplified menus and advanced yet intuitive tools to guide you through your inspection workflow using UT, PA, TOFD, and TFM methods, from setup to reporting.
Ease Your NDT Workflow Using Built-In Tools
1. Scan Plan
Follow the steps—1, 2, 3—to set up your inspection on board
2. Calibration
Conduct a fully compliant calibration using the built-in tools
3. Acquisition
View the live scan results during your inspection
4. Analysis
Quickly and confidently interpret your data
Live TFM Envelope Processing
Facilitate Flaw Characterization and Sizing
The instrument’s unique envelope processing provides high-resolution TFM images. Indications look clean and sharp and stand out more clearly against background noise. Up to four TFM modes facilitate interpretation and sizing.
Expand Your PA and TFM Capabilities
Increase your potential to meet the challenges of your customers and develop new procedures for a wider range of applications. Gain the power to drive advanced PA probes such as our Dual Liner Array™ or Dual Matrix Array™ probes or customized probes to achieve higher quailty imaging of acoustically challenging materials.
Slide to compare these OmniScan models
When Precision Is Paramount
See Clearly with Lower Frequencies and Wider Bandwidth
Versus the 32-channel model, the 64-channel model provides a higher signal-to-noise ratio (SNR) on a larger bandwidth for higher and lower frequencies.
Capable of driving lower frequencies using a larger pulse width, the OmniScan X3 64 flaw detector offers better signal resolution on attenuative materials such as composites.
In C-scans, the 64-channel model’s higher resolution and SNR reveal more features in finer detail, enabling you to achieve greater precision when required.
Fix Errors before They Are Made: Improved PAUT and TOFD Data Quality and Reliability
The coupling check channel feature of the OmniScan X3 flaw detector, combined with the ScanDeck™ module’s real-time coupling and scan speed indicators help inspectors monitor data quality before the file is saved.* The coupling quality data is recorded and can be reviewed later.
*The ScanDeck module is available on certain scanners, such as the AxSEAM scanner, as of July 2020.
Avoid Signal Saturation on Large Indications
Easy Gain Adjustment with 800% Amplitude Range
Improve inspection efficiency by eliminating unnecessary rescanning. The high 800% amplitude range enables you to adjust the gain of large indications, such as lack of fusion, to reference level in post processing, avoiding the need to rescan.
Confirm TFM Beam Coverage in Advance
The Acoustic Influence Map (AIM) provides you with an onboard visual model of the sensitivity based on the TFM mode, probe, settings, and simulated reflector. The AIM tool takes the guesswork out of creating your scan plan, enabling you to adjust it accordingly.
Obtain clear data on the projected highest sensitivity area.
See which TFM modes provide the best cover your area of interest.
The higher the Sensitivity Index, the better the expected signal-to-noise ratio (SNR).
Simulate the TFM mode sensitivity on a spherical or planar defect.
Complete OmniScan Retrocompatibility for Your Convenience
Reuse your data files from previous versions of OmniPC software and setup files from OmniScan MX2, SX, and MX flaw detectors. To ease your transition, OmniScan .ops setup files are compatible with the OmniScan X3 flaw detector, and .opd data files are compatible with OmniPC 5 and WeldSight software.
TOFD Lateral Wave Processing
Lateral wave synchronization improves the readability of time-of-flight diffraction (TOFD) data.
A straighter lateral wave enables more precise depth evaluation and flaw sizing.
Detect indications closer to the surface, using the lateral wave removal function.
Lateral wave processing can be done per section, providing better flexibility.
OmniPC 5 Software
OmniPC
Phased Array and Ultrasonic Testing Data Analysis PC Software
OmniPC analysis software is the computer-based companion software for the OmniScan X3 flaw detector. An inspection tool created by inspectors, OmniPC software provides the power and performance to handle all your basic data analysis and reporting needs.
Why OmniPC?
Optimized for NDT Inspectors
Like the on-board software of the OmniScan X3 flaw detector, OmniPC software enables inspectors using UT, PA, TOFD, and TFM to perform efficient analysis and reporting on a PC or laptop.
Complimentary Companion Software for OmniScan Flaw Detectors
OmniPC software is free for download, including updates, by subscribing here:
No HASP key
No product key
No renewal payments
User-friendly features including convenient shortcuts, the flexibility to use different methods, and the ability to open multiple sessions on one computer increase the efficiency your analysis.
Familiar OmniScan User Interface
The user interface of OmniPC software resembles the OmniScan X3 on-board software to ease your learning curve.
Flexible Tools to Ease Your PAUT and TOFD Data Analysis
Correct Oversights Made during Acquisition
OmniPC software’s Skew, Scan Offset, and Index Offset can be changed during post-inspection analysis to improve data accuracy and avoid reacquisition.
Adjustable Gates and Dynamic Readings
Gates A, B, and I are available with various lists of readings (for corrosion inspections).
Replay the Acquisition
At any time, adjust the Gain, apply the Auto 80%, and slide the Data cursors.
B-Scan Screening
C-Scan Screening
Identify Indications with Ease
Use the gate in True Depth or Sound Path or change the Zoom Palette to locate indications faster.
TOFD Recalibration
Recalibrate your wedge delay and PCS in your TOFD files. Synchronize and remove the lateral wave as required.
Easily Extract and Export Data for Reports
Different exporting options are available to meet your reporting needs.
Specifications
OmniScan® X3 Series Specifications
These specifications apply to all OmniScan X3 and OmniScan X3 64 models.
WeldSight
