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OLYMPUS CIX100

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CIX100 Brochure
Home/ Products/ Cleanliness Inspector/ OLYMPUS CIX100
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  • Overview
  • Reliable
  • Intuitive
  • Fast
  • Informative
  • Compliant
  • Specifications
  • Resources

Overview

The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufacturers who maintain the high quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.


OLYMPUS CIX100 Turnkey Technical Cleanliness Inspection System: Simplify Your Technical Cleanliness

The cleanliness of components, parts and fluids is at the center of the manufacturing process. Meeting high standards for counting, analyzing, and classifying the often micron-sized contaminant and foreign particles is important for all processes: development, manufacturing, production, and quality control of the final product. International and national directives describe the methods and documentation requirements for determining particle contamination on essential machined parts since these particles directly impact the lifespan of parts and components. Previously, the mass of residue particles was used to characterize the residue. The standards in use today demand more detailed information about the nature of the contamination such as the number of particles, particle size distribution, and particle characteristic.
The OLYMPUS CIX100 Cleanliness Inspection System is designed to meet the cleanliness requirements of modern industry and national and international directives.

The technical cleanliness of components and parts is essential, especially in all manufacturing industries.

Standard Process for Cleanliness Inspection: preparation (steps 1–3) and investigation (steps 4–6)
(01:Extract, 02:Filter, 03:Weigh, 04:Inspect, 05:Review, 06:Results)


Simple and Reliable

Seamlessly integrated hardware and software result in a durable, high-throughput system that delivers reliable and accurate data.

  • Easy Setup for True Turnkey Functionality
  • Accurate repeatability and best secure by invariant system setup
  • Excellent optical performance and reproducible imaging conditions
  • Convinced durability by reproducible positioning and integrated calibration device
  • Full system integration for high performance

Intuitive Guidance for Maximum Productivity

Dedicated, easy-to-use workflows minimize user action and provide reliable data - independent of the operator and experience level. 
User-friendly tools make it easy to revise inspection data.

  • Step-by-step guidance to improve productivity and reduce inspection and process time
  • User right management to restrict functionality and avoid operator handling errors by restricting functionality
  • Touch screen support for efficient handling
  • Compliant One-Click Reporting for direct documentation
  • Data Management by automated results storing and sharing options

Fast Live Analysis

The innovative all-in-one-scan solution enables scans with classification in reflective (metallic) and non-reflective particles to be completed twice as fast as other inspection systems. Immediate feedback of counted and sorted particles helps you make fast decisions.

  • Overview image for direct identification of filter coverage, particle clustering or worst particles
  • Automatic live processing and classification of contaminant particles ranging from 2.5 µm up to 42 mm
  • High throughput by unique all-in-one-scan technology for detection of both reflective and non-reflective objects in one scan
  • Live analytics and result display for shortest reaction time
  • Compliant results by support of international standards
  • Optional height measurement support

Efficient Data Evaluation

Powerful and easy-to-use tools support to revise inspection data. High flexibility is provided by support of all international standards. Clear representation of all relevant inspection results in a maximum time saving. 

  • Clear arrangement of images and data for efficient data review
  • Visualization of different particle views for immediate identification
  • Convincing capability as particle location and thumbnails are linked with their dimensional images
  • Easy reclassification, review, revision and recalculation of inspection data
  • Short reaction time by live display of overall cleanliness code, particle and classification tables
  • Trend analysis to identify potential measurement deviation over the time
  • Full control by displaying complete inspection data set in one view

Compliant Report Creation

One-click reporting meets the requirements and methodologies set forth in international standards.
Report customization (e.g., including particle morphology), makes it easy to meet company standards.

  • Completely intuitive and professional documentation based on compliant templates
  • Smart variability by customizable templates
  • Utmost flexibility by support of various output formats
  • Efficient and time-optimized exchange by direct file sharing options
  • Sophisticated data storage options for long-term justification of results

Software Compatibility with Microsoft Office

Reliable

Reliable Turnkey System Solution:
Automated and Accurate For High Reproducibility

The OLYMPUS CIX100 system is a turnkey solution designed to meet the needs of automated cleanliness inspection. Each component is optimized for accuracy, reproducibility, repeatability, and seamless integration for reliable data in a high-throughput system. The system provides excellent optical performance for fast inspections. Automation of critical tasks helps speed up inspections while minimizing human errors and the risk of contaminating the sample.

Automated and Accurate For High Reproducibility

1. Reproducible Imaging Conditions (Camera Cover)
Highest reproducibility by protected camera alignment to prevent unwanted misalignments.
2. Innovative Polarization Method (Detection Unit)
Detects both reflective (metallic) and non-reflective particles in a single scan.
3. Proven Durability (Stage / Stage inserts)Reproducible Measurement Conditions
The automatic focus drive helps ensure reproducible positioning  for straightforward reinvestigation of detected contaminants. The stage insert maintains a secured membrane position and features an additional insert for the integrated calibration tool or a second sample.
4. Excellent Optical Quality (Microscope)
Renowned Olympus UIS2 objectives and high-resolution camera provide exceptional image quality and accurate measurements.
5. Easy to Use (Software)
Easy-to-use software guides users through the entire inspection process, helping to boost productivity and minimize errors. The interface has large buttons that are easy to click with a mouse or the touch screen monitor.
6. High Performance (Workstation)
While scanning the sample, the system gives direct visual feedback of classified and counted contaminants with color changes. Optionally, the system can emit an acoustic warning signal when limits are exceeded. 


Reproducibility and Repeatability

Reproducibility and Repeatability

The diagram illustrates the OLYMPUS CIX100 precision by verifying the measurement stability and repeatability using the Process Performance Index (PPk). The same sample at 5x and 10x magnification was measured 10 times and the particle count from typical size classes was extracted. The diagram shows the evaluation of CPk and PPk on class E (50-100 μm).

The OLYMPUS CIX100 system makes technical cleanliness inspections easy for inexperienced operators. A preconfigured and pre-calibrated system, user rights management, and regular system self-checks help ensure that the settings are correct for accurate and repeatable results. This means you can apply the same quality standards at different locations and get the same inspection results independent of the operator or system. 


Excellent Optical Quality

Olympus UIS2 objectives provide high optical performance for excellent measurement and analysis accuracy. A dedicated light source maintains a consistent color temperature optimized for cleanliness inspection. 


Optimized Reproducibility

Optimized Reproducibility

The preconfigured and pre-calibrated system has reminders for automatic system self-checks with the integrated calibration slide that helps maintain regular system verification.


Stable Measurement System

Secure Setup

The optical path alignment, motorized nosepiece, and the camera are protected by a cover to prevent accidental modifications. For greater stability, all moving parts have been eliminated from the optical light path. 


Intuitive

Intuitive Guidance for Maximum Productivity

The clear structured user interface not only makes cleanliness inspection repeatable and reproducible but also easy for experts and non-experts alike.

The OLYMPUS CIX100 system delivers enhanced performance and productivity through the entire inspection process and makes technical cleanliness inspections easy for operators of every experience level. The software provides step-by step guidance for the entire cleanliness inspection. Intuitive workflows and user rights management improve productivity and confidence in results while reducing cycle time, cost-per-test, and user errors. The result is a system optimized for high quality standards


Easy for everyone

Step by step, the intuitive interface guides operators through the complete inspection process. The result is a fast, productive workflow.

OLYMPUS CIX100 redefined the user operation and makes cleanliness inspection easy for everyone even by non-experts. All kinds of users produce inspection data they can rely on. The system extensively reduces elaborate adjustments. The intuitive workflow is based on just three steps: Inspect Sample, Review Results and Create Report. The system reduces complicated adjustment by extensive user guidance leading through all process steps in respect of international standards and by a maximum use of automated functions.


Easy for Every Experience Level

Easy for Every Experience Level
The system reminds to perform automatic system checks for precise results on a regular basis; and pre-configured and customized system configurations support the operator on daily purposes.

A preconfigured, pre-calibrated system combined with an intuitive user interface helps make cleanliness inspection easy for operators of every experience level.


Storage and Sharing

All data are saved automatically. Users can quickly access all the archived samples, as well as their associated data and reports for revision or distribution.

Management Tools

Administrators can control which users have access to different parts of the system. This helps inexperienced users stay on task. Importantly, they also cannot influence critical parameters like calibration and data selected for the automatically generated report. 


Administrators can access the complete system setup (top), while inexperienced users can be limited to basic workflows (bottom)


Touch Screen Support

High performance by touch technology

The interface has large buttons that are easy to click with a mouse or the touch screen monitor.


Inspection Configurations

The OLYMPUS CIX100 system is already configured and calibrated when it is delivered but can be easily modified and customized to your applications and requirements.

Inspection configurations are used to specify all of the parameters for sample inspection, including rules for the characterization of particles, setting particle families, and types. 


Fast

Fast Live Analytics and Review
All Relevant Data Displayed in One Place

All relevant data are displayed live on a single screen during the inspection, enabling the operator to stop or interrupt the inspection if a test fails.

The OLYMPUS CIX100 system offers high-performance image acquisition and precise live analytics of both reflective and non-reflective particles ranging from 2.5 μm up to 42 mm in a single scan thanks to a patented* polarization method. This all-in-one-scan solution enables scans to be completed twice as fast as the classical method (Inspector series). Counted and sorted particles are displayed live and sorted into size classes while the scan is acquired, supporting direct decision making and helping ensure a fast reaction time in case of a failed test.


Fast: Capture Data in a Single Scan

An innovative polarization method based on wavelength separation and color detects both reflective (metallic) and non-reflective particles in a single scan. Integrated into the microscope frame, this high-throughput design enables scans to be completed twice as fast as the classical method (Inspector series) and eliminates moving components from the optical light path, such as the polarizer, which could negatively impact the system stability, leading to potentially incorrect results. This all-in-one-scan technique increases the number of inspected particles, reducing the cost per test and shortening the reaction time in case of a failed test.


1: ’Classical’ method, 2: ’New’ method
(1-1:First recording:Non-reflecting, 1-2:Second recording:Reflecting, 2:Single-scan solution:Combinded)
An innovative polarization method detects both reflective (metallic) and non-reflective particles in a single scan. 


Direct Identification

The overview image assists with evaluating filter coverage, particle clustering, or worst particles, so users can react quickly before the final inspection starts

The sample overview image is created at the beginning of the sample inspection and displays the entire filter at low magnification. The overview image helps to identify filter coverage or particle clusters before the sample inspection starts.


Sample Information Overview

The sample information area lists the most interesting data

Inspection configurations are used to specify all parameters for sample inspection.


Live Analytics for direct result feedback

Predefined acceptable particle counts per size classes are displayed and the sample can be validated (OK) or rejected (NOK) even before the complete membrane is acquired. An acoustic signal can be switched on when the approval reads NOK or the inspection is finished.

Contaminants are automatically analyzed and sorted into size class bins defined by the selected standard and are color coded to clearly indicate which size class exceeds a predefined limit. A statistical control chart function visually illustrates the level of particle class compliance, for improved reliability.


Detect Dark, Bright, Small and Large Particles

Image stitching automatically reconstructs images of large particles.
Scan dark particles on a bright background or vice versa.

Live processing and classification of both small and large particles according to international standards (2.5 µm up to 42 mm).


Time Information

Clearly view the time remaining for sample acquisition.

Informative

Flexible for Evaluation and Revision

Flexible for Evaluation and Revision

All particles and classification tables, overall cleanliness code, particle location, and the standard used appear in one view.

The OLYMPUS CIX100 system combines powerful, easy-to-use tools to revise inspection data with a fast, guided particle review. The one-click reclassification function provides flexibility and supports international standards. Thumbnail images of every contaminant detected by the system are linked with dimensional measurements, making it easy to review the data. Retrieving a contaminant’s information is simple. During the review process, the results are updated and displayed automatically in all views and size classification bins. This saves you time with clear representations of all relevant inspection results.


Deep Data Insights for Direct Identification 

Visualization of different particle view eg. largest reflective or non-reflective particles

Clear arrangement of images, data and results for immediate decision making for reprocessing. At-a-glance display of complete inspection data in various selectable views. View images of particles organized from largest to smallest for all kind of particles (reflective or non-reflective).


Revise Inspection Data

Revise Inspection Data

Based on the stored particle position information, the stage directly repositions at a selected particle position for further investigation and revision, such as with an Extended Focus Image (all-in-focus image, EFI) or a tailored solution for a height measurement.


Trend Analysis

Trend analysis

Data statistical analysis can be performed over time and graphically displayed.


Particle Snapshots Documentation

Particle Snapshots Documentation

Individual images of contaminants can be taken and processed for manual measurement confirmation and improved documentation.


Easy Data Review

Easy Data Review

View images of particles organized from largest to smallest for all kinds of particles (reflective or non-reflective).

Thumbnail images of contaminants are conveniently linked with their locations and dimensions. Selecting a thumbnail automatically drives the system to this contaminant.


Trusted Results

Classification and particle tables list the results according to the selected standard.

Classification and particle tables show the results according to the selected standard and particle data respectively.


Supported Standards

Evaluation is performed according to all major international standards used in the automotive and aerospace industries including:

ISO 4406:2017
ISO 4407:1999
ISO 4407:2002 [Cumulative and Differential]
ISO 11218:1993
ISO 12345:2013
ISO 14952:2003
ISO 16232-10:2007 (A, N, and V)
ISO 16232:2018 (A, N, and V)
ISO 21018:2008
DIN 51455:2015 [70%and 85%]
NAS 1638:1964; NF E 48-651:1986
NF E 48-655:1989
SAE AS4059:2011
VDA 19.1:2015 (A, N, and V)
VDA 19.2:2015

Companies also have the flexibility to set up their own evaluation standards. Reports can be easily modified to meet the needs of your company.


Direct Feedback

Direct Feedback
The overall classification results based on the selected standard are calculated and displayed.

Instantaneous calculation and presentation of overall classification contamination class code (CCC) according to the selected standard.


Precisely Compliant

Precisely Compliant

Different Cleanliness Codes

Results can be recalculated to all standards with one click. 


Quick and Easy: Review, Revise, and Recalculate

Operators can easily revise their inspection data. Powerful software tools including delete, split, and merge make revising the data simple. 

Quick and Easy: Review, Revise, and Recalculate
The OLYMPUS CIX100 system has tools that make it easy to revise inspection data during the review step. (1. Delete, 2.Split, 3.Merge)


Height Measurement Solution

Height Measurement Solution

The OLYMPUS CIX100 system’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the objective’s depth of focus and stacks them together to create an all-in-focus image. In addition, the CIX100 system can be further enhanced with a height measurement solution consisting of a 20X objective and special software to fulfill the VDA 19 requirements for height measurements. For selected particles, the height measurement is performed either automatically or manually. The calculated height value is listed as an additional data field in the results sheet.


Define company standards

Evaluation is performed according to all major international standards used in the automotive and aerospace industries. Companies also have the flexibility to set up their own evaluation standards.

Compliant

Efficient Report Creation

Reports that comply with international standards.

Smart, sophisticated reporting tools enable easy one-click digital documentation of inspection results. Reports are based on predefined templates that comply with industry standards and can be easily modified to meet the needs of your company. Export the results to Microsoft Word or directly export as a PDF for easy data sharing over email. Report templates and data sharing tools help inexperienced operators quickly create and distribute accurate, professional documentation. The OLYMPUS CIX100 system can also archive reports and data for record keeping and trend analysis.


Completely Intuitive by Predefined Templates

Reports are based on predefined templates that comply with industry standards and can be easily modified to meet the needs of your company. 


Efficient and Easy

Analytical reports comply with the standard used during analysis.

A list of available templates is displayed based on the standard used during analysis and allows fast creating of compliant reports even by unexperienced operators.


Easy Data Export

The software supports output formats such as MS Word or PDF or Excel.

The software supports output formats such as MS Word or PDF or Excel.

Exporting a report is as easy as clicking your mouse. Export the reports into Microsoft Word or PDF, depending on your requirements. Statistics, like trend analyses, can be exported to Microsoft Excel just as easily. 


Long-Term Data Safety


Capability to justify decision after years.

Inspection data and reports need to be archived for a certain period of time. 


Sample Information Area

The information page of a report

This area of the report consists of information about the sample such as customer, examiner, order number, and date of inspection. All data are inserted automatically.


Classification Table

Because the largest particles detected during the scan are of high interest, this report section lists the ten largest particles found during the inspection.

This section of the report incorporates the data calculated during the inspection according to the standard used and displays information such as size class and range information, as well as the absolute numbers of particles detected and the contamination class.


Images of Largest Particles

The result page showing images of the largest particles

Thumbnails of the largest particles are displayed together with the particle parameters and the particle class. Thumbnails also show images of contaminants reconstructed by stitching smaller images together.


Specifications

Hardware

Microscope OLYMPUS CIX100 Motorized focus
  •  Coaxial motorized fine focus with 3 axis joystick
  •  Focus stroke 25mm
  •  Fine stroke 100 µm / rotation
  •  Maximum height of stage holder mounting : 40 mm
  •  Focus speed 200 µm/sec
  •  Software autofocus enabled
  •  Customizable multi-point focus map
Illumination
  • Built-in LED illumination
  • Innovative illumination mechanism with simultaneous detection of reflecting and non-reflecting particles
  • Light intensity controllable by software
Imaging device
  • Color CMOS USB 3.0 camera
  • On chip pixel size 2.2 x 2.2 µm
Sample size
  • The standard sample is a filter membrane of diameter 47 mm. Filter holders with 55 mm membrane diameter or customized sample holders can be provided. 
Nose piece Motorized type Motorized Nosepiece
  • 6 positions motorized nosepiece with 3 UIS2 objectives already installed
  • PLAPON 1.25X used for preview
  • MPLFLN 5X used for detecting particles bigger than 10 µm
  • MPLFLN 10X used for detecting particles bigger than 2.5 µm
Software controlled
  • The image magnification and relation between pixel and size is known at every moment.
  • Selected objectives are used at selected steps into the measurement process, objectives are automatically positioned
Stage Motorized stage X,Y Motorized stage X,Y
  • Stepper motors controlled movement
  • Maximum range : 130 x 79 mm
  • Max speed 240 mm/s (4 mm ball screw pitch)
  • Repeatability < 1µm
  • Resolution 0.01 µm
  • Controllable with 3 axis joystick
Software controlled
  • Scanning speed is depends on the used magnification, at 10x the scanning time is less than 10 minutes
  • Stage alignment is performed at factory assembly
Specimen holder Sample holder
  • Membrane holder is specially designed to avoid an unwanted rotation of the membrane during the mounting
  • The membrane is mechanically flattened by the membrane holder
  • No tool is needed to fix the cover
  • The sample holder is always assigned the slot 1 on the stage 
Particle Standard Device (PSD)
  • Reference sample used to validate the system measurement
  • Sample used in the check system's built-in function for controlling the proper function of the CIX
  • The PSD is always assigned slot 2 on the stage
Stage insert 2-Position stage insert
  • Stage insert dedicated to the right positioning of the sample holder and the PSD
Controller Workstation High-Performance pre-installed workstation
  • HP Z4G4, Windows 10-64 bit Professional (English)
  • 16 GB RAM, 256 GB SSD and 4 TB data storage
  • 2GB video adaptor
  • Microsoft Office 2019 (English) installed
  • Networking capabilities, English qwerty keyboard, optical mouse 1000 dpi
Add-in boards
  • Motorized controller, RS232 serial and USB 3.0
Language selection
  • Operating system and Microsoft Office default language can be changed by the user
Touch panel display 23 inch slim screen
  • Resolution 1920x1080 optimized for use with the CIX software
Power Rating
  • AC adaptor (2), Controller and Microscope frame (4 plugs necessary)
  • Input: 100-240V AC 50/60Hz, 10 A
Power consumption
  • Controller: 700 W; Monitor: 56 W; Microscope: 5.8 W; Control Box 7.4 W
  • Total: 769.2 W
Drawing Dimensions (W × D × H) Approx. 1300 mm × 800 mm × 510 mm
Weight 44kg(97 lb)

System environment limitations

Normal use Temperature 10 °C to 35 °C (50 °F to 95 °F)  
Humidity 30 to 80%
For safety regulations Environment Indoor use
Temperature 5 ℃ to 40 ℃ (41 °F to 104 °F)
Humidity
  • Maximum 80% (up to 31 °C [88 °F])
    (no condensation)
  • Usable humidity declines linearly as temperature rises above 31 °C (88 °F)
  • 70% (34 °C [93 °F]) to 60% (37 °C [98 °F]) to 50% (40 °C [104 °F]) 
Altitude Up to 2,000 m (6,562 ft)
Level of horizon Up to ±2°
Power supply and voltage stability  ±10%
Pollution level (IEC60664) 2
Overall voltage category (IEC60664) II

Software

Software CIX-ASW-V1.4.2
  • Dedicated workflow software for technical cleanliness inspection
Languages GUI
  • GUI: English, French, German, Spanish, Japanese, Simplified Chinese and Korean
Online help
  • Online help: English, French, German, Spanish, Japanese, Simplified Chinese and Korean
License management
  • Software license activated by license card (already activated at installation)
User Management
  • System can be connected to a network for domain administration
  • The range of functions can be selected depending on the authenticated user.
Live image Display in color mode
  • Particles are analyzed with blue color for metallic ones and original color for non-metallic ones.
Window fit method
  • The image is always displayed in a full view
Live detection
  • Particles are detected as soon as they are captured for improved speed 
  • User can stop the process if the measurement result is not good.
Image capture and manual measurements Collecting user snapshots
  • In the review mode it is possible to acquire single images from any position on the sample, as well as acquire images in the live observation mode (from direct image) or the sample view mode (from recorded data).
  • Images can be stored in .tif, .jpg or .png files with a standard resolution of 1000 x 1000 pixels.
  • Snapshots can be linked to detected particle and used in the analytical report afterwards
  • Particle snapshots can be automatically acquired in EFI (Extended Focus Imaging) mode.
  • Recordings taken in EFI mode can be used in the analytical report. 
Manual measurements
  • It is possible to perform arbitrary distance measurements on an acquired snapshot
  • Arbitrary measurements can be renamed and the color can be colored
  • Arbitrary measurements and scale bar are burned in the image when stored
Hardware control XY motorized stage
  • Joystick operation and control by software
  • Automatic or manual repositioning on selected particles
Motorized nosepiece
  • Selection by software only
Motorized focusing
  • Control by joystick
  • Software autofocus available
  • Predictive autofocus using multipoint focus map
Check system System verification
  • System is verified by measuring the Particle Standard Device parameters.
  • OK or NOK quality value is produced
Selectable objective
  • Check system can be performed only with the working objective (one objective should be selected at least)
  • Check system is performed with either 5X or 10X objectives, or both.
Technical cleanliness standards Supported standards
  • ISO 4406:2017; ISO 4407:1999; ISO 4407:2002 [Cumulative and Differential]; ISO 11218:1993; ISO 12345:2013; ISO 14952:2003; ISO 16232-10:2007 (A, N, and V); ISO 16232:2018 (A, N, and V); ISO 21018:2008; DIN 51455:2015 [70%and 85%]; NAS 1638:1964; NF E 48-651:1986; NF E 48-655:1989; SAE AS4059:2011; VDA 19.1:2015 (A, N, and V); VDA 19.2:2015
Precisely compliant to VDA19:2016 recommendations
  • Thresholds are automatically set at the VDA recommend values
Identification of particle family
  • Particles can be classified by particle families (fibers, reflecting, reflecting fibers, or others)
Customized standards
  • User defined standards can be defined easily
  • Particle measurement parameters include filiform particle size and compact particle size according to DT 55-83
Inspection configuration
  • The system enables users to load, define, copy, rename, delete and save an inspection configuration
  • Standards and report templates can also be stored and recalled
  • It is possible to invert the detection threshold to detect bright particles on dark background
  • It is possible to acquire several samples in a sequence.
  • Each sample can be inspected with a particluar configuration.
Particle tile view Displays the detected particles in tile for improved navigation
  • Every particle position can be retrieved by double click on the tile
  • Every tile is adapted to the actual particle size
Store the full membrane The complete filter is stored
  • Offline analysis enables users to select a different standard for the results display
Data export Save data
  • Inspection data can be exported to an Excel (.xlsx) table
  • All tables available in the software can also be exported into Excel.
Trend analysis Trend analysis over several samples (Built-in SQC tool)
  • Data per size classes can be displayed
  • Data can be plotted over time, sample, measurement ID
  • Scale can be selected (log-normal, log-log)
  • Data points can be extracted and exported to spreadsheet
  • Table can be exported in Q-DAS (.dfq) format. All tables available in the software can also be exported into Excel.
Particle Edition Particles can be edited during the revision process.  It is possible to:
  • Add, delete, merge, or split particles with lines or polyline.
  • Change the particle type
Dynamic reports Professional analytical reports can be produced by using Microsoft Word 2019
  • Templates are precisely customizable
  • Users can choose to put the pictures after the table or all pictures grouped together when selecting different particle families

Optional Solution CIX-S-HM

Height Measurements Automatic or Manual height measurement of selected particles
  • Optional software solution that drives the motorized focus drive from top to bottom of selected particles. The particle height is then processed from the difference between the top and the bottom Z coordinate.
  • Includes an additional objective lens (20X MPLFLN) and a license card that needs to be activated at installation.
  • It is possible to select multiple particles for automatic height measurement at several positions.

Environment Law and Regulations

Europe Low Voltage Directive 2014/35/EU
EMC Directive 2014/30/EU
RoHS Directive 2011/65/EU
REACH Regulation No. 1907/2006
Packaging and Packaging Waste Directive 94/62/EC
WEEE Directive 2012/19/EU
Machinery Directive 2006/42/EC
USA UL 61010-1:2010 Edition 3
FCC 47 CFR Part15 SubPartB
Canada CAN/CSA-C22.2 (No. 61010-1-12)
Australia Radio communications Act 1992, Telecommunications Act 1997
Regulation on Energy conservation AS/NZS 4665-2005
Japan Electrical Appliances and Material Safety Act (PSE)
Korea Electrical Appliances Safety Control Act
Regulation on Energy Efficiency Labeling and Standards
Regulations for EMC and Wireless Telecommunication (Notice 2913-5)
China China RoHS
China PL Law
Regulation for Manuals

Resources

Application Notes

Analyzing Oil Cleanliness in Power Generation Plants Using the CIX100 System
How Clean is Your Syringe?
Analyzing Metal Contamination in Piston Rings
Maximize Precision in Industrial Particulate Inspections
Contamination Analysis After the Camshaft Cleaning Process
Analyzing cleaned bearings for metal contamination
Contamination Analysis of Hydraulic Facilities for Steel Plants using the OLYMPUS CIX100 Technical Cleanliness Inspection System
Metal Contamination Analysis of Automotive Lithium-Ion Batteries using the OLYMPUS CIX100 Technical Cleanliness Inspection System
Evaluating the Cleanliness of Brake Calipers
Evaluating the Cleanliness Diesel Injectors
Evaluating the Cleanliness of the Inside of a Radiator Tube
Evaluating the Cleanliness of Automotive Parts
 Show More

Videos

CIX100 - Technical Cleanliness Inspection System

SlideShare

An Introduction to Technical Cleanliness Inspection
The Value of a Turnkey Cleanliness Inspection System

Brochures

CIX100 Benefits
Olympus CIX100 System Turnkey Solution for Technical Cleanliness Inspection
CIX Explanation of Standards
CIX Basics of Cleanliness inspection
CIX100 Brochure
 Show More

Blog

The Essential Guide to Fast Technical Cleanliness Inspections
7 Capabilities That Make Technical Cleanliness Inspections Easy for Novice Operators
5 Ways the OLYMPUS CIX100 Cleanliness Inspector Delivers Reproducible Results
Breaking Down the Technical Cleanliness Workflow Part 5: Reflective/Nonreflective Particle and Fiber Identification
Breaking Down the Technical Cleanliness Workflow Part 4: Contamination Level Calculation
Breaking Down the Technical Cleanliness Workflow Part 3: Particle Size Classification and Particle Count Extrapolation and Normalization
Breaking Down the Technical Cleanliness Workflow Part 2: Image Acquisition and Particle Measurement
Breaking Down the Technical Cleanliness Workflow Part 1: Preparation
Optimizing the Technical Cleanliness Inspection Workflow
The Value of a Turnkey Cleanliness Inspection System
An Introduction to Technical Cleanliness Inspection
The Increasing Importance of Technical Cleanliness
A Turnkey Solution to Technical Cleanliness
The Advantages of Using Polarized Light to Identify Wear Debris
 Show More
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