OLYMPUS CIX100
Overview
The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufacturers who maintain the high quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
OLYMPUS CIX100 Inspection System: Simplify Your Technical Cleanliness
The cleanliness of components, parts, and fluids is at the center of the manufacturing process. Meeting high standards for counting, analyzing, and classifying the often micron-sized contaminant and foreign particles is important for all processes: development, manufacturing, production, and quality control of the final product. International and national directives describe the methods and documentation requirements for determining particle contamination on essential machined parts since these particles directly impact the lifespan of parts and components. Current standards demand detailed information about the nature of the contamination, such as the number of particles, particle size distribution, and particle characteristic.
The OLYMPUS CIX100 cleanliness inspection system is designed to meet the cleanliness requirements of modern industry and national and international directives.
The technical cleanliness of components and parts is essential in manufacturing industries.
Standard process for cleanliness inspection: preparation (steps 1–3) and investigation (steps 4–6). Step 1: extract, step 2: filter, step 3: weigh, step 4: inspect, step 5: review, step 6: results.
Simple and Reliable
| Seamlessly integrated hardware and software result in a durable, high-throughput system that delivers reliable and accurate data.
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Intuitive Guidance for Maximum Productivity
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Fast Live Analysis
| The innovative all-in-one-scan solution detects reflective (metallic) and non-reflective particles twice as fast as conventional methods that require two separate images. Immediate feedback of counted and sorted particles helps you make fast decisions.
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Efficient Data Evaluation
| Revise inspection data with powerful and easy-to-use tools that support company and international standards for cleanliness inspection. Clear representation of all relevant inspection results saves time.
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Compliant Report Creation
| One-click reporting meets the requirements and methodologies set forth in international standards. Report customization (e.g., including particle morphology), makes it easy to meet company standards.
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The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufacturers who maintain the high quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
OLYMPUS CIX100 Turnkey Technical Cleanliness Inspection System: Simplify Your Technical Cleanliness
The cleanliness of components, parts and fluids is at the center of the manufacturing process. Meeting high standards for counting, analyzing, and classifying the often micron-sized contaminant and foreign particles is important for all processes: development, manufacturing, production, and quality control of the final product. International and national directives describe the methods and documentation requirements for determining particle contamination on essential machined parts since these particles directly impact the lifespan of parts and components. Previously, the mass of residue particles was used to characterize the residue. The standards in use today demand more detailed information about the nature of the contamination such as the number of particles, particle size distribution, and particle characteristic.
The OLYMPUS CIX100 Cleanliness Inspection System is designed to meet the cleanliness requirements of modern industry and national and international directives.
The technical cleanliness of components and parts is essential, especially in all manufacturing industries.
Standard Process for Cleanliness Inspection: preparation (steps 1–3) and investigation (steps 4–6)
(01:Extract, 02:Filter, 03:Weigh, 04:Inspect, 05:Review, 06:Results)
Simple and Reliable
| Seamlessly integrated hardware and software result in a durable, high-throughput system that delivers reliable and accurate data.
|
Intuitive Guidance for Maximum Productivity
| Dedicated, easy-to-use workflows minimize user action and provide reliable data － independent of the operator and experience level.
|
Fast Live Analysis
| The innovative all-in-one-scan solution enables scans with classification in reflective (metallic) and non-reflective particles to be completed twice as fast as other inspection systems. Immediate feedback of counted and sorted particles helps you make fast decisions.
|
Efficient Data Evaluation
| Powerful and easy-to-use tools support to revise inspection data. High flexibility is provided by support of all international standards. Clear representation of all relevant inspection results in a maximum time saving.
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Compliant Report Creation
| One-click reporting meets the requirements and methodologies set forth in international standards.
|
Reliable
Reliable Turnkey System Solution:
Automated and Accurate For High Reproducibility
The OLYMPUS CIX100 system is a turnkey solution designed to meet the needs of automated cleanliness inspection. Each component is optimized for accuracy, reproducibility, repeatability, and seamless integration for reliable data in a high-throughput system. The system provides excellent optical performance for fast inspections. Automation of critical tasks helps speed up inspections while minimizing human errors and the risk of contaminating the sample.
| 1. Reproducible Imaging Conditions (Camera Cover) |
Reproducibility and Repeatability
The diagram illustrates the OLYMPUS CIX100 precision by verifying the measurement stability and repeatability using the Process Performance Index (PPk). The same sample at 5x and 10x magnification was measured 10 times and the particle count from typical size classes was extracted. The diagram shows the evaluation of CPk and PPk on class E (50-100 μm). | The cleanliness inspection workflow is easy, so even inexperienced operators can achieve accurate and repeatable results. The preconfigured and pre-calibrated system, user rights management, and regular system self-checks help ensure that the settings are correct for reproducible inspection data independent of the operator or system. As a result, multiple departments and sites can apply the same quality standards at different locations. |
Excellent Optical Quality
| Olympus UIS2 objectives provide high optical performance for excellent measurement and analysis accuracy. A dedicated light source maintains a consistent color temperature optimized for cleanliness inspection. |
Optimized Reproducibility
| The preconfigured and pre-calibrated system has reminders for automatic system self-checks with the integrated calibration slide that helps maintain regular system verification. |
Stable Measurement System
| The optical path alignment, motorized nosepiece, and the camera are protected by a cover to prevent accidental modifications. For greater stability, all moving parts have been eliminated from the optical light path. |
Reliable Turnkey System Solution:
Automated and Accurate For High Reproducibility
The OLYMPUS CIX100 system is a turnkey solution designed to meet the needs of automated cleanliness inspection. Each component is optimized for accuracy, reproducibility, repeatability, and seamless integration for reliable data in a high-throughput system. The system provides excellent optical performance for fast inspections. Automation of critical tasks helps speed up inspections while minimizing human errors and the risk of contaminating the sample.
| 1. Reproducible Imaging Conditions (Camera Cover) |
Reproducibility and Repeatability
The diagram illustrates the OLYMPUS CIX100 precision by verifying the measurement stability and repeatability using the Process Performance Index (PPk). The same sample at 5x and 10x magnification was measured 10 times and the particle count from typical size classes was extracted. The diagram shows the evaluation of CPk and PPk on class E (50-100 μm). | The OLYMPUS CIX100 system makes technical cleanliness inspections easy for inexperienced operators. A preconfigured and pre-calibrated system, user rights management, and regular system self-checks help ensure that the settings are correct for accurate and repeatable results. This means you can apply the same quality standards at different locations and get the same inspection results independent of the operator or system. |
Excellent Optical Quality
| Olympus UIS2 objectives provide high optical performance for excellent measurement and analysis accuracy. A dedicated light source maintains a consistent color temperature optimized for cleanliness inspection. |
Optimized Reproducibility
| The preconfigured and pre-calibrated system has reminders for automatic system self-checks with the integrated calibration slide that helps maintain regular system verification. |
Stable Measurement System
| The optical path alignment, motorized nosepiece, and the camera are protected by a cover to prevent accidental modifications. For greater stability, all moving parts have been eliminated from the optical light path. |
Intuitive
Intuitive Guidance for Maximum Productivity
The clear structured user interface not only makes cleanliness inspection repeatable and reproducible but also easy for experts and non-experts alike. | The OLYMPUS CIX100 system delivers enhanced performance and productivity through the entire inspection process and makes technical cleanliness inspections easy for operators of every experience level. The software provides step-by step guidance for the entire cleanliness inspection. Intuitive workflows and user rights management improve productivity and confidence in results while reducing cycle time, cost-per-test, and user errors. The result is a system optimized for high quality standards. |
Easy for everyone
Step by step, the intuitive interface guides operators through the complete inspection process. The result is a fast, productive workflow. | OLYMPUS CIX100 redefined the user operation and make cleanliness inspection easy for everyone even by non-experts. Every kind of user produces inspection data they can rely on. The system reduces complicated adjustment by extensive. The intuitive workflow is based on just three steps: Inspect sample, Review results and Create Report. The system reduces complicated adjustment by extensive user guidance leading through all process steps in respect of international standards and by a maximum use of automated functions. |
Easy for Every Experience Level
| A preconfigured, pre-calibrated system combined with an intuitive user interface helps make cleanliness inspection easy for operators of every experience level. |
Advanced Microscopy
Microscope mode enables you to leave the dedicated cleanliness inspection workflow to perform microscopic imaging. Expand the microscope mode capabilities with optional material analysis solutions, such as Grain Intercept, Grain Planimetric, Cast Iron, Inclusion Worst Field, Layer Thickness, Dendrite Arm Spacing, Phase Analysis, Porosity, and Coating Thickness.
Storage and Sharing
 | All data are saved automatically. Users can quickly access all the archived samples, as well as their associated data and reports for revision or distribution. |
Management Tools
Administrators can control which users have access to different parts of the system. This helps inexperienced users stay on task. Importantly, they also cannot influence critical parameters like calibration and data selected for the automatically generated report.
Administrators can access the complete system setup (top), while inexperienced users can be limited to basic workflows (bottom)
Touch Screen Support
High performance by touch technology | The interface has large buttons that are easy to click with a mouse or the touch screen monitor. |
Inspection Configurations
The OLYMPUS CIX100 system is already configured and calibrated when it is delivered but can be easily modified and customized to your applications and requirements. | Inspection configurations are used to specify all of the parameters for sample inspection, including rules for the characterization of particles, setting particle families, and types. |
Intuitive Guidance for Maximum Productivity
The clear structured user interface not only makes cleanliness inspection repeatable and reproducible but also easy for experts and non-experts alike. | The OLYMPUS CIX100 system delivers enhanced performance and productivity through the entire inspection process and makes technical cleanliness inspections easy for operators of every experience level. The software provides step-by step guidance for the entire cleanliness inspection. Intuitive workflows and user rights management improve productivity and confidence in results while reducing cycle time, cost-per-test, and user errors. The result is a system optimized for high quality standards |
Easy for everyone
Step by step, the intuitive interface guides operators through the complete inspection process. The result is a fast, productive workflow. | OLYMPUS CIX100 redefined the user operation and makes cleanliness inspection easy for everyone even by non-experts. All kinds of users produce inspection data they can rely on. The system extensively reduces elaborate adjustments. The intuitive workflow is based on just three steps: Inspect Sample, Review Results and Create Report. The system reduces complicated adjustment by extensive user guidance leading through all process steps in respect of international standards and by a maximum use of automated functions. |
Easy for Every Experience Level
| A preconfigured, pre-calibrated system combined with an intuitive user interface helps make cleanliness inspection easy for operators of every experience level. |
Storage and Sharing
| All data are saved automatically. Users can quickly access all the archived samples, as well as their associated data and reports for revision or distribution. |
Management Tools
Administrators can control which users have access to different parts of the system. This helps inexperienced users stay on task. Importantly, they also cannot influence critical parameters like calibration and data selected for the automatically generated report.
Administrators can access the complete system setup (top), while inexperienced users can be limited to basic workflows (bottom)
Touch Screen Support
High performance by touch technology | The interface has large buttons that are easy to click with a mouse or the touch screen monitor. |
Inspection Configurations
The OLYMPUS CIX100 system is already configured and calibrated when it is delivered but can be easily modified and customized to your applications and requirements. | Inspection configurations are used to specify all of the parameters for sample inspection, including rules for the characterization of particles, setting particle families, and types. |
Fast
Fast Live Analytics and Review
All Relevant Data Displayed in One Place
All relevant data are displayed live on a single screen during the inspection, enabling the operator to stop or interrupt the inspection if a test fails. | The OLYMPUS CIX100 system offers high-performance image acquisition and precise live analytics of both reflective and non-reflective particles ranging from 2.5 μm up to 42 mm in a single scan thanks to a patented* polarization method. This all-in-one-scan solution enables scans to be completed twice as fast as the classical method (Inspector series). Counted and sorted particles are displayed live and sorted into size classes while the scan is acquired, supporting direct decision making and helping ensure a fast reaction time in case of a failed test. |
Capture Data in a Single Scan
An innovative polarization method based on wavelength separation and color detects both reflective (metallic) and non-reflective particles in a single scan. Integrated into the microscope frame, this high-throughput design enables scans to be completed twice as fast as the classical method (Inspector series) and eliminates moving components from the optical light path, such as the polarizer, which could negatively impact the system stability, leading to potentially incorrect results. This all-in-one-scan technique increases the number of inspected particles, reducing the cost per test and shortening the reaction time in case of a failed test.
1: Classical method, 2: Single-scan method
(1-1: First image of non-reflecting particles, 1-2: Second image of reflecting particles, 2: Single-scan solution: Combined)
An innovative polarization method detects both reflective (metallic) and non-reflective particles in a single scan.
Review Particles in Real Color
Activating real color mode enables users to view particles in their actual colors, providing additional information to identify the particle type as metallic or non-metallic.
The all-in-one scan shows all reflective particles as blue in polarization, indicating these particles are metallic. In real color mode, the blue color of reflective particles is omitted, and the true colors of all particles are shown in the brightfield image. Materials that are actually blue remain blue, while metals show their metallic shine and the reflections typical for the material.
With these helpful visuals, users can better understand the nature of each particle and quickly confirm the particle type.
 | Particle as seen by the system during detection and analysis. The blue color indicates that this particle is metallic. |
 | The same particle as seen during the review mode in real color using the U-ANT filter and the color correction mode. The particle is confirmed as metallic. |
Fast Identification
The overview image assists with evaluating filter coverage, particle clustering, or worst particles, so users can react quickly before the final inspection starts. | The sample overview image is created at the beginning of the sample inspection and displays the entire filter at low magnification. The overview image helps to identify filter coverage or particle clusters before the sample inspection starts. |
Sample Information Overview
The sample information area lists the most important data. | Inspection configurations are used to specify all parameters for sample inspection. |
Live Analytics for Real-Time Results
Predefined acceptable particle counts per size classes are displayed, and the sample can be validated (OK) or rejected (NOK) even before the complete membrane is acquired. An acoustic signal can be switched on when the approval reads NOK or the inspection is finished. | Contaminants are automatically analyzed and sorted into size class bins defined by the selected standard and are color coded to clearly indicate which size class exceeds a predefined limit. A statistical control chart function visually illustrates the level of particle class compliance, for improved reliability. |
Detect Dark, Bright, Small and Large Particles
Image stitching automatically reconstructs images of large particles. | Live processing and classification of both small and large particles according to international standards (2.5 µm up to 42 mm). |
Time Information
| Clearly view the time remaining for sample acquisition. |
Fast Live Analytics and Review
All Relevant Data Displayed in One Place
All relevant data are displayed live on a single screen during the inspection, enabling the operator to stop or interrupt the inspection if a test fails. | The OLYMPUS CIX100 system offers high-performance image acquisition and precise live analytics of both reflective and non-reflective particles ranging from 2.5 μm up to 42 mm in a single scan thanks to a patented* polarization method. This all-in-one-scan solution enables scans to be completed twice as fast as the classical method (Inspector series). Counted and sorted particles are displayed live and sorted into size classes while the scan is acquired, supporting direct decision making and helping ensure a fast reaction time in case of a failed test. |
Fast: Capture Data in a Single Scan
An innovative polarization method based on wavelength separation and color detects both reflective (metallic) and non-reflective particles in a single scan. Integrated into the microscope frame, this high-throughput design enables scans to be completed twice as fast as the classical method (Inspector series) and eliminates moving components from the optical light path, such as the polarizer, which could negatively impact the system stability, leading to potentially incorrect results. This all-in-one-scan technique increases the number of inspected particles, reducing the cost per test and shortening the reaction time in case of a failed test.
1: ’Classical’ method, 2: ’New’ method
(1-1:First recording：Non-reflecting, 1-2:Second recording：Reflecting, 2:Single-scan solution：Combinded)
An innovative polarization method detects both reflective (metallic) and non-reflective particles in a single scan.
Direct Identification
The overview image assists with evaluating filter coverage, particle clustering, or worst particles, so users can react quickly before the final inspection starts | The sample overview image is created at the beginning of the sample inspection and displays the entire filter at low magnification. The overview image helps to identify filter coverage or particle clusters before the sample inspection starts. |
Sample Information Overview
The sample information area lists the most interesting data | Inspection configurations are used to specify all parameters for sample inspection. |
Live Analytics for direct result feedback
Predefined acceptable particle counts per size classes are displayed and the sample can be validated (OK) or rejected (NOK) even before the complete membrane is acquired. An acoustic signal can be switched on when the approval reads NOK or the inspection is finished. | Contaminants are automatically analyzed and sorted into size class bins defined by the selected standard and are color coded to clearly indicate which size class exceeds a predefined limit. A statistical control chart function visually illustrates the level of particle class compliance, for improved reliability. |
Detect Dark, Bright, Small and Large Particles
Image stitching automatically reconstructs images of large particles. | Live processing and classification of both small and large particles according to international standards (2.5 µm up to 42 mm). |
Time Information
| Clearly view the time remaining for sample acquisition. |
Informative
Flexible for Evaluation and Revision
All particles and classification tables, overall cleanliness code, particle location, and the standard used appear in one view. | The OLYMPUS CIX100 system combines powerful, easy-to-use tools to revise inspection data with a fast, guided particle review. The one-click reclassification function provides flexibility and supports international standards. Thumbnail images of every contaminant detected by the system are linked with dimensional measurements, making it easy to review the data. Retrieving a contaminant’s information is simple. During the review process, the results are updated and displayed automatically in all views and size classification bins. This saves you time with clear representations of all relevant inspection results. |
Deep Data Insights for Direct Identification
Visualization of different particle view eg. largest reflective or non-reflective particles | Clear arrangement of images, data and results for immediate decision making for reprocessing. At-a-glance display of complete inspection data in various selectable views. View images of particles organized from largest to smallest for all kind of particles (reflective or non-reflective). |
Revise Inspection Data
| Based on the stored particle position information, the stage directly repositions at a selected particle position for further investigation and revision, such as with an Extended Focus Image (all-in-focus image, EFI) or a tailored solution for a height measurement. |
Trend Analysis
| Data statistical analysis can be performed over time and graphically displayed. |
Particle Snapshots Documentation
| Individual images of contaminant can be taken and processed for manual measurement confirmation and improved documentation. |
Easy Data Review
View images of particles organized from largest to smallest for all kinds of particles (reflective or non-reflective). | Thumbnail images of contaminants are conveniently linked with their locations and dimensions. Selecting a thumbnail automatically drives the system to this contaminant. |
Trusted Results
Classification and particle tables list the results according to the selected standard. | Classification and particle tables show the results according to the selected standard and particle data respectively. |
Support Standards
Evaluation is performed according to all major international standards used in the automotive and aerospace industries including:
ASTM E1216-11:2016
ISO 4406:2021
ISO 4407:1999
ISO 4407:2002 [Cumulative and Differential]
ISO 11218:1993
ISO 12345:2013
ISO 14952:2003
ISO 16232-10:2007 (A, N, and V)
ISO 16232:2018 (A, N, and V)
ISO 21018:2008
DIN 51455:2015 [70%and 85%]
NAS 1638:1964; NF E 48-651:1986
NF E 48-655:1989
SAE AS4059:2011
VDA 19.1:2015 (A, N, and V)
VDA 19.2:2015
Download CIX Explanation of Standards (PDF)
Companies also have the flexibility to set up their own evaluation standards. Reports can be easily modified to meet the needs of your company.
Direct Feedback
| Instantaneous calculation and presentation of overall classification contamination class code (CCC) according to the selected standard. |
Precisely Compliant
Different Cleanliness Codes | Results can be recalculated to all standards with one click. |
Quick and Easy: Review, Revise, and Recalculate
Operators can easily revise their inspection data. Powerful software tools including delete, split, and merge make revising the data simple.
The OLYMPUS CIX100 system has tools that make it easy to revise inspection data during the review step. (1. Delete, 2.Split, 3.Merge)
Height Measurement Solution
The OLYMPUS CIX100 system’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the objective’s depth of focus and stacks them together to create an all-in-focus image. In addition, the CIX100 system can be further enhanced with a height measurement solution consisting of a 20X objective and special software to fulfill the VDA 19 requirements for height measurements. For selected particles, the height measurement is performed either automatically or manually. The calculated height value is listed as an additional data field in the results sheet.
Define company standards
Evaluation is performed according to all major international standards used in the automotive and aerospace industries. Companies also have the flexibility to set up their own evaluation standards.
Flexible for Evaluation and Revision
All particles and classification tables, overall cleanliness code, particle location, and the standard used appear in one view. | The OLYMPUS CIX100 system combines powerful, easy-to-use tools to revise inspection data with a fast, guided particle review. The one-click reclassification function provides flexibility and supports international standards. Thumbnail images of every contaminant detected by the system are linked with dimensional measurements, making it easy to review the data. Retrieving a contaminant’s information is simple. During the review process, the results are updated and displayed automatically in all views and size classification bins. This saves you time with clear representations of all relevant inspection results. |
Deep Data Insights for Direct Identification
Visualization of different particle view eg. largest reflective or non-reflective particles | Clear arrangement of images, data and results for immediate decision making for reprocessing. At-a-glance display of complete inspection data in various selectable views. View images of particles organized from largest to smallest for all kind of particles (reflective or non-reflective). |
Revise Inspection Data
| Based on the stored particle position information, the stage directly repositions at a selected particle position for further investigation and revision, such as with an Extended Focus Image (all-in-focus image, EFI) or a tailored solution for a height measurement. |
Trend Analysis
| Data statistical analysis can be performed over time and graphically displayed. |
Particle Snapshots Documentation
| Individual images of contaminants can be taken and processed for manual measurement confirmation and improved documentation. |
Easy Data Review
View images of particles organized from largest to smallest for all kinds of particles (reflective or non-reflective). | Thumbnail images of contaminants are conveniently linked with their locations and dimensions. Selecting a thumbnail automatically drives the system to this contaminant. |
Trusted Results
Classification and particle tables list the results according to the selected standard. | Classification and particle tables show the results according to the selected standard and particle data respectively. |
Supported Standards
Evaluation is performed according to all major international standards used in the automotive and aerospace industries including:
ISO 4406:2017
ISO 4407:1999
ISO 4407:2002 [Cumulative and Differential]
ISO 11218:1993
ISO 12345:2013
ISO 14952:2003
ISO 16232-10:2007 (A, N, and V)
ISO 16232:2018 (A, N, and V)
ISO 21018:2008
DIN 51455:2015 [70%and 85%]
NAS 1638:1964; NF E 48-651:1986
NF E 48-655:1989
SAE AS4059:2011
VDA 19.1:2015 (A, N, and V)
VDA 19.2:2015
Companies also have the flexibility to set up their own evaluation standards. Reports can be easily modified to meet the needs of your company.
Direct Feedback
| Instantaneous calculation and presentation of overall classification contamination class code (CCC) according to the selected standard. |
Precisely Compliant
Different Cleanliness Codes | Results can be recalculated to all standards with one click. |
Quick and Easy: Review, Revise, and Recalculate
Operators can easily revise their inspection data. Powerful software tools including delete, split, and merge make revising the data simple.
The OLYMPUS CIX100 system has tools that make it easy to revise inspection data during the review step. (1. Delete, 2.Split, 3.Merge)
Height Measurement Solution
The OLYMPUS CIX100 system’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the objective’s depth of focus and stacks them together to create an all-in-focus image. In addition, the CIX100 system can be further enhanced with a height measurement solution consisting of a 20X objective and special software to fulfill the VDA 19 requirements for height measurements. For selected particles, the height measurement is performed either automatically or manually. The calculated height value is listed as an additional data field in the results sheet.
Define company standards
Evaluation is performed according to all major international standards used in the automotive and aerospace industries. Companies also have the flexibility to set up their own evaluation standards.
Compliant
Efficient Report Creation
Reports that comply with international standards. | Smart, sophisticated reporting tools enable easy one-click digital documentation of inspection results. Reports are based on predefined templates that comply with industry standards and can be easily modified to meet the needs of your company. Export the results to Microsoft Word or directly export as a PDF for easy data sharing over email. Report templates and data sharing tools help inexperienced operators quickly create and distribute accurate, professional documentation. The OLYMPUS CIX100 system can also archive reports and data for record keeping and trend analysis. |
Completely Intuitive by Predefined Templates
| Reports are based on predefined templates that comply with industry standards and can be easily modified to meet the needs of your company. |
Efficient and Easy
Analytical reports comply with the standard used during analysis. | A list of available templates is displayed based on the standard used during analysis and allows fast creating of compliant reports even by unexperienced operators. |
Easy Data Export
The software supports output formats such as MS Word or PDF or Excel. | Exporting a report is as easy as clicking your mouse. Export the reports into Microsoft Word or PDF, depending on your requirements. Statistics, like trend analyses, can be exported to Microsoft Excel just as easily. |
Long-Term Data Storage
| Quickly access all the archived samples, as well as their associated data and reports for revision or distribution. All inspection data and reports are automatically saved and archived for a certain period of time. |
Sample Information Area
The information page of a report | This area of the report consists of information about the sample such as customer, examiner, order number, and date of inspection. All data are inserted automatically. |
Classification Table
Because the largest particles detected during the scan are of high interest, this report section lists the ten largest particles found during the inspection. | This section of the report incorporates the data calculated during the inspection according to the standard used and displays information such as size class and range information, as well as the absolute numbers of particles detected and the contamination class. |
Images of Largest Particles
The result page showing images of the largest particle | Thumbnails of the largest particles are displayed together with the particle parameters and the particle class. Thumbnails also show images of contaminants reconstructed by stitching smaller images together. |
Efficient Report Creation
Reports that comply with international standards. | Smart, sophisticated reporting tools enable easy one-click digital documentation of inspection results. Reports are based on predefined templates that comply with industry standards and can be easily modified to meet the needs of your company. Export the results to Microsoft Word or directly export as a PDF for easy data sharing over email. Report templates and data sharing tools help inexperienced operators quickly create and distribute accurate, professional documentation. The OLYMPUS CIX100 system can also archive reports and data for record keeping and trend analysis. |
Completely Intuitive by Predefined Templates
| Reports are based on predefined templates that comply with industry standards and can be easily modified to meet the needs of your company. |
Efficient and Easy
Analytical reports comply with the standard used during analysis. | A list of available templates is displayed based on the standard used during analysis and allows fast creating of compliant reports even by unexperienced operators. |
Easy Data Export
The software supports output formats such as MS Word or PDF or Excel. | Exporting a report is as easy as clicking your mouse. Export the reports into Microsoft Word or PDF, depending on your requirements. Statistics, like trend analyses, can be exported to Microsoft Excel just as easily. |
Long-Term Data Safety
| Inspection data and reports need to be archived for a certain period of time. |
Sample Information Area
The information page of a report | This area of the report consists of information about the sample such as customer, examiner, order number, and date of inspection. All data are inserted automatically. |
Classification Table
Because the largest particles detected during the scan are of high interest, this report section lists the ten largest particles found during the inspection. | This section of the report incorporates the data calculated during the inspection according to the standard used and displays information such as size class and range information, as well as the absolute numbers of particles detected and the contamination class. |
Images of Largest Particles
The result page showing images of the largest particles | Thumbnails of the largest particles are displayed together with the particle parameters and the particle class. Thumbnails also show images of contaminants reconstructed by stitching smaller images together. |
Specifications
Hardware
| Microscope | OLYMPUS CIX100 | Motorized focus |
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| Illumination |
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| Imaging device |
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| Sample size |
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| Nose piece | Motorized type | Motorized Nosepiece |
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| Software controlled |
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| Stage | Motorized stage X,Y | Motorized stage X,Y |
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| Software controlled |
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| Specimen holder | Sample holder |
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| Particle Standard Device (PSD) |
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| Stage insert | 2-Position stage insert |
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| Controller | Workstation | High-Performance pre-installed workstation |
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| Add-in boards |
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| Language selection |
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| Touch panel display | 23 inch slim screen |
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| Power | Rating |
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| Power consumption |
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| Drawing | Dimensions (W × D × H) | Approx. 1300 mm × 800 mm × 510 mm | |
| Weight | 44kg(97 lb) | ||
System environment limitations
| Normal use | Temperature | 10 °C to 35 °C (50 °F to 95 °F) |
| Humidity | 30 to 80% | |
| For safety regulations | Environment | Indoor use |
| Temperature | 5 ℃ to 40 ℃ (41 °F to 104 °F) | |
| Humidity |
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| Altitude | Up to 2,000 m (6,562 ft) | |
| Level of horizon | Up to ±2° | |
| Power supply and voltage stability | ±10% | |
| Pollution level (IEC60664) | 2 | |
| Overall voltage category (IEC60664) | II |
Software
| Software | CIX-ASW-V1.5 |
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| Languages | GUI |
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| Online help |
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| License management |
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| User Management |
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| Live image | Display in color mode |
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| Window fit method |
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| Live detection |
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| Live classification |
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| Microscope mode |
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| Image capture and manual measurements | Collecting user snapshots |
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| Manual measurements |
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| Hardware control | XY motorized stage |
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| Motorized nosepiece |
| ||||
| Motorized focusing |
| ||||
| Check system | System verification |
| |||
| Selectable objective |
| ||||
| Technical cleanliness standards | Supported standards |
| |||
| Precisely compliant to VDA19:2016 recommendations |
| ||||
| Identification of particle family |
| ||||
| Customized standards |
| ||||
| Inspection configuration |
| ||||
| Particle tile view | Displays the detected particles in tile for improved navigation |
| |||
| Store the full membrane | The complete filter is stored |
| |||
| Data export | Save data |
| |||
| Trend analysis | Trend analysis over several samples (Built-in SQC tool) |
| |||
| Particle Edition | Particles can be edited during the revision process. |
It is possible to:
| |||
| Dynamic reports | Professional analytical reports can be produced by using Microsoft Word 2019 |
| |||
Optional Solution CIX-S-HM
| Height Measurements | Automatic or Manual height measurement of selected particles |
|
Environment Law and Regulations
| Europe | Low Voltage Directive 2014/35/EU |
| EMC Directive 2014/30/EU | |
| RoHS Directive 2011/65/EU | |
| REACH Regulation No. 1907/2006 | |
| Packaging and Packaging Waste Directive 94/62/EC | |
| WEEE Directive 2012/19/EU | |
| Machinery Directive 2006/42/EC | |
| USA | UL 61010-1:2010 Edition 3 |
| FCC 47 CFR Part15 SubPartB | |
| Canada | CAN/CSA-C22.2 (No. 61010-1-12) |
| Australia | Radio communications Act 1992, Telecommunications Act 1997 |
| Regulation on Energy conservation AS/NZS 4665-2005 | |
| Japan | Electrical Appliances and Material Safety Act (PSE) |
| Korea | Electrical Appliances Safety Control Act |
| Regulation on Energy Efficiency Labeling and Standards | |
| Regulations for EMC and Wireless Telecommunication (Notice 2913-5) | |
| China | China RoHS |
| China PL Law | |
| Regulation for Manuals |
Hardware
| Microscope | OLYMPUS CIX100 | Motorized focus |
|
| Illumination |
| ||
| Imaging device |
| ||
| Sample size |
| ||
| Nose piece | Motorized type | Motorized Nosepiece |
|
| Software controlled |
| ||
| Stage | Motorized stage X,Y | Motorized stage X,Y |
|
| Software controlled |
| ||
| Specimen holder | Sample holder |
| |
| Particle Standard Device (PSD) |
| ||
| Stage insert | 2-Position stage insert |
| |
| Controller | Workstation | High-Performance pre-installed workstation |
|
| Add-in boards |
| ||
| Language selection |
| ||
| Touch panel display | 23 inch slim screen |
| |
| Power | Rating |
| |
| Power consumption |
| ||
| Drawing | Dimensions (W × D × H) | Approx. 1300 mm × 800 mm × 510 mm | |
| Weight | 44kg(97 lb) | ||
System environment limitations
| Normal use | Temperature | 10 °C to 35 °C (50 °F to 95 °F) |
| Humidity | 30 to 80% | |
| For safety regulations | Environment | Indoor use |
| Temperature | 5 ℃ to 40 ℃ (41 °F to 104 °F) | |
| Humidity |
| |
| Altitude | Up to 2,000 m (6,562 ft) | |
| Level of horizon | Up to ±2° | |
| Power supply and voltage stability | ±10% | |
| Pollution level (IEC60664) | 2 | |
| Overall voltage category (IEC60664) | II |
Software
| Software | CIX-ASW-V1.4.2 |
| |||
| Languages | GUI |
| |||
| Online help |
| ||||
| License management |
| ||||
| User Management |
| ||||
| Live image | Display in color mode |
| |||
| Window fit method |
| ||||
| Live detection |
| ||||
| Image capture and manual measurements | Collecting user snapshots |
| |||
| Manual measurements |
| ||||
| Hardware control | XY motorized stage |
| |||
| Motorized nosepiece |
| ||||
| Motorized focusing |
| ||||
| Check system | System verification |
| |||
| Selectable objective |
| ||||
| Technical cleanliness standards | Supported standards |
| |||
| Precisely compliant to VDA19:2016 recommendations |
| ||||
| Identification of particle family |
| ||||
| Customized standards |
| ||||
| Inspection configuration |
| ||||
| Particle tile view | Displays the detected particles in tile for improved navigation |
| |||
| Store the full membrane | The complete filter is stored |
| |||
| Data export | Save data |
| |||
| Trend analysis | Trend analysis over several samples (Built-in SQC tool) |
| |||
| Particle Edition | Particles can be edited during the revision process. |
It is possible to:
| |||
| Dynamic reports | Professional analytical reports can be produced by using Microsoft Word 2019 |
| |||
Optional Solution CIX-S-HM
| Height Measurements | Automatic or Manual height measurement of selected particles |
|
Environment Law and Regulations
| Europe | Low Voltage Directive 2014/35/EU |
| EMC Directive 2014/30/EU | |
| RoHS Directive 2011/65/EU | |
| REACH Regulation No. 1907/2006 | |
| Packaging and Packaging Waste Directive 94/62/EC | |
| WEEE Directive 2012/19/EU | |
| Machinery Directive 2006/42/EC | |
| USA | UL 61010-1:2010 Edition 3 |
| FCC 47 CFR Part15 SubPartB | |
| Canada | CAN/CSA-C22.2 (No. 61010-1-12) |
| Australia | Radio communications Act 1992, Telecommunications Act 1997 |
| Regulation on Energy conservation AS/NZS 4665-2005 | |
| Japan | Electrical Appliances and Material Safety Act (PSE) |
| Korea | Electrical Appliances Safety Control Act |
| Regulation on Energy Efficiency Labeling and Standards | |
| Regulations for EMC and Wireless Telecommunication (Notice 2913-5) | |
| China | China RoHS |
| China PL Law | |
| Regulation for Manuals |
