The GX53 microscope’s various observation capabilities provide clear, sharp images, so you can reliably detect defects in your samples. PRECiV image analysis software's new illumination techniques and image acquisition options give you more choices for evaluating your samples and documenting your findings.
Objective lenses are crucial to a microscope’s performance. The new MXPLFLN objectives add depth to the MPLFLN series for epi-illumination imaging by maximizing numerical aperture and working distance at the same time. Higher resolutions at 20X and 50X magnifications typically mean shorter working distances, which forces the sample or objective to be retracted during objective exchange. In many cases, the MXPLFLN series’ 3 mm working distance eliminates this problem, enabling faster inspections with less chance of the objective hitting the sample.
Learn More about MXPLFLN Objectives>>
MIX technology combines darkfield with another observation method, such as brightfield or polarization, to enable you to view samples that are difficult to see with conventional microscopes. The circular LED illuminator has a directional darkfield function where one or more quadrants are illuminated at a given time, reducing a sample’s halation to better visualize surface texture.
Cross-section of a printed circuit board
Brightfield | Darkfield | MIX: Brightfield + Darkfield |
Stainless steel
Brightfield | Darkfield quadrant | MIX: Brightfield + Darkfield quadrant |
With multiple image alignment (MIA), you can stitch images together simply by moving the XY knobs on the manual stage—a motorized stage is optional. PRECiV software uses pattern recognition to generate a panoramic image, making it ideal for inspecting carburizing and metal flow conditions.
Metal flow of a bolt
Adjust the stage position using the XY knob. | The full condition of metal flow can be seen. |
PRECiV software’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the depth of focus. EFI stacks these images together to create a single all-in-focus image of the sample. Even when analyzing a cross-section sample with an uneven surface, EFI creates fully-focused images.
EFI works with either a manual or motorized Z-axis and creates a height map to visualize structures.
Resin parts
Adjust the objective’s height with the focusing handle. | EFI automatically captures and stacks multiple images to create a single, in-focus image of the sample. | Fully focused image is created. |
Using advanced image processing, high dynamic range (HDR) adjusts for differences in brightness within an image to reduce glare. It also helps boost the contrast in low-contrast images. HDR can be used to observe minute structures in electric devices and identify metallic grain boundaries.
Gold plate
Some areas have glare. | Both dark and bright areas are clearly exposed using HDR. |
Chromium diffusion coating
Low contrast and unclear. | Enhanced contrast with HDR. |
There are just a few examples of what can be achieved using different observation methods.
Brightfield | Darkfield |
Brightfield: a common observation method to observe reflected light from a sample by illuminating it straight on. Darkfield: observe scattered or diffracted light from a sample, so imperfections, such as minute scratches or flaws, clearly stand out.
Brightfield | DIC observation |
Differential interference contrast (DIC): an observation technique where the height of a sample is visible as a relief, similar to a 3D image with improved contrast; it is ideal for inspections of samples that have very minute height differences, including metallurgical structures and minerals.
Brightfield | Polarized light observation |
Polarized light: a technique that highlights a material’s texture and crystal condition to view metallurgical structures, such as the growth pattern of graphite on nodular cast iron and minerals.
Brightfield | MIX: Brightfield + Darkfield |
MIX observation: combines brightfield and darkfield to show a sample’s color and structure.
The above MIX observation image clearly reproduces the device’s color and texture as well as the condition of the adhesive layer.