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Industrial Solutions
Industrial Microscopes

Inverted Metallurgical Microscope GX53

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Inverted Metallurgical Microscope GX53
Home/ Products/ Light Microscopes/ Inverted Microscopes/ GX53
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  • Overview
  • Observation
  • Analysis
  • Sharing
  • Specifications
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Overview

Quickly Analyze Thick, Large Sample Materials

Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.

Quickly Analyze Thick, Large Sample Materials


Fast Inspections, Advanced Functionality

Quickly observe, measure, and analyze metallurgical structures.

Advanced Analysis Tools

1. Combined observation methods produce exceptional images

2. Easily create panoramic images

3. Create all-in-focus images

4. Capture both bright and dark areas

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Optimized for Material Science

1. Software designed for materials science

2. Metallurgical analysis that complies with industrial standards

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Userfriendly

Even novice operators can comfortably make observations, analyze results, and create reports.

1. Easily restore microscope settings

2. User guidance helps simplify advanced analysis

3. Efficient report generation

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Advanced Imaging Technology

Our proven optics and imaging technology deliver clear images and reliable results.

1. Reliable optical performance: wavefront aberration control

2. Clear images: image shading correction

3. Consistent color temperature: high-intensity white LED illumination

4. Precise measurements: auto calibration

Advanced Imaging Technology

Modular

Choose the components you need for your application.

1. Build your system your way: fully customizable system with a variety of optional components

Modular

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Observation

Advanced Analysis Tools

The GX53 microscope’s various observation capabilities provide clear, sharp images, so you can reliably detect defects in your samples. OLYMPUS Stream image analysis software's new illumination techniques and image acquisition options give you more choices for evaluating your samples and documenting your findings.


The Invisible Becomes Visible: MIX Technology

MIX technology combines darkfield with another observation method, such as brightfield or polarization, to enable you to view samples that are difficult to see with conventional microscopes. The circular LED illuminator has a directional darkfield function where one or more quadrants are illuminated at a given time, reducing a sample’s halation to better visualize surface texture.

Cross-section of a printed circuit board

Cross-section of a printed circuit board - Brightfield

Cross-section of a printed circuit board - Darkfield

Cross-section of a printed circuit board - MIX

Brightfield 
The substrate layers and through hole are invisible.

Darkfield 
The traces are invisible.

MIX: Brightfield + Darkfield 
All of the components are clearly represented.

Stainless steel

Stainless steel - Brightfield

Stainless steel - Darkfield

Stainless steel - MIX

Brightfield 
The texture is unobservable.

Darkfield quadrant 
The color information is eliminated.

MIX: Brightfield + Darkfield quadrant 
Both the material color and texture are visible.


Easily Create Panoramic Images: Instant MIA

With multiple image alignment (MIA), you can stitch images together simply by moving the XY knobs on the manual stage—a motorized stage is optional. OLYMPUS Stream software uses pattern recognition to generate a panoramic image, making it ideal for inspecting carburizing and metal flow conditions.

Metal flow of a bolt

Adjust the stage position using the XY knob.

Metal flow of a bolt

Metal flow of a bolt - The full condition of metal flow can be seen.

Adjust the stage position using the XY knob.

The full condition of metal flow can be seen.


Create All-in-Focus Images: EFI

OLYMPUS Stream software’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the depth of focus. EFI stacks these images together to create a single all-in-focus image of the sample. Even when analyzing a cross-section sample with an uneven surface, EFI creates fully-focused images.

EFI works with either a manual or motorized Z-axis and creates a height map to visualize structures.

Resin parts

Adjust the objective’s height with the focusing handle.

EFI automatically captures and stacks multiple images to create a single, in-focus image of the sample.

Fully focused image is created.

Adjust the objective’s height with the focusing handle.

EFI automatically captures and stacks multiple images to create a single, in-focus image of the sample.

Fully focused image is created.


Capture Both Bright and Dark Areas Using HDR

Using advanced image processing, high dynamic range (HDR) adjusts for differences in brightness within an image to reduce glare. It also helps boost the contrast in low-contrast images. HDR can be used to observe minute structures in electric devices and identify metallic grain boundaries.

Gold plate

Some areas have glare.

Both dark and bright areas are clearly exposed using HDR.

Some areas have glare.

Both dark and bright areas are clearly exposed using HDR.

Chromium diffusion coating

Low contrast and unclear.

Enhanced contrast with HDR.

Low contrast and unclear.

Enhanced contrast with HDR.


Applications

There are just a few examples of what can be achieved using different observation methods.

Polished sample of AlSi (Brightfield / Darkfield)

Polished sample of AlSi - Brightfield

Polished sample of AlSi - Darkfield

Brightfield

Darkfield

Brightfield: a common observation method to observe reflected light from a sample by illuminating it straight on. Darkfield: observe scattered or diffracted light from a sample, so imperfections, such as minute scratches or flaws, clearly stand out.

Spheroidal graphite cast iron (Brightfield / DIC)

Spheroidal graphite cast iron - Brightfield

Spheroidal graphite cast iron - DIC

Brightfield

DIC observation

Differential interference contrast (DIC): an observation technique where the height of a sample is visible as a relief, similar to a 3D image with improved contrast; it is ideal for inspections of samples that have very minute height differences, including metallurgical structures and minerals.

Aluminum alloy (Brightfield / Polarized light)

Aluminum alloy - Brightfield

Aluminum alloy - Polarized light observation

Brightfield

Polarized light observation

Polarized light: a technique that highlights a material’s texture and crystal condition to view metallurgical structures, such as the growth pattern of graphite on nodular cast iron and minerals.

Electric device (Brightfield / MIX observation)

Electric device - Brightfield

Electric device - MIX

Brightfield

MIX: Brightfield + Darkfield

MIX observation: combines brightfield and darkfield to show a sample’s color and structure.
The above MIX observation image clearly reproduces the device’s color and texture as well as the condition of the adhesive layer.


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Analysis

OLYMPUS Stream Software – Optimized for Materials Science

Together, the GX53 microscope and OLYMPUS Stream software support metallurgical analysis methods that comply with different industrial standards. With step-by-step operator guidance, users can analyze their samples quickly and easily.

> Click here for details about OLYMPUS Stream software


Particle Analysis – Count and Measure Solution

The Count and Measure solution uses advanced threshold methods to reliably separate objects, such as particles and scratches, from the background. More than 50 different object measurement and classification parameters are available including shape, size, position, and pixel properties.

Unclear grain boundaries

original image

Grain boundaries are clearly detected

Conventional software
Unclear grain boundaries

Etched steel microstructure 
(original image)

OLYMPUS Stream
Grain boundaries are clearly detected


Grain classification results

Grain classification results


Grain Sizing in a Microstructure

Measure the grain size and analyze the microstructure of aluminum, steel crystal structures, such as ferrite and austenite, and other metals.
Supported standards: ISO, GOST, ASTM, DIN, JIS, GB/T

Microstructure of ferritic grains

Grain sizing intercept solution

Grain sizing intercept solution

Grain sizing planimetric solution with secondary phase

Grain sizing planimetric solution with secondary phase


Evaluating Graphite Nodularity

Evaluate the graphite nodularity and content in cast iron samples (nodular and vermicular). Classify the form, distribution, and size of graphite nodes.
Supported standards: ISO, NF, ASTM, KS, JIS, GB/T

Ductile cast iron showing nodular graphite

Cast iron solution

Cast iron solution


Rating Nonmetallic Inclusion Content in High-Purity Steel

Classify nonmetallic inclusions using an image of the worst field or worst inclusion found manually in the sample.
Supported standards: ISO, EN, ASTM, DIN, JIS, GB/T, UNI

Steel with nonmetallic inclusions

Inclusion worst field solution

Inclusion worst field solution


Compare Images of Your Sample and Reference Images

Easily compare live or still images with auto-scaled reference images. This solution includes reference images in accordance with various standards (additional reference images can be purchased separately). Multiple modes are supported, including live overlay display and side-by-side comparison.
Supported standards: ISO, EN, ASTM, DIN, SEP

Steel with nonmetallic inclusions

Steel with nonmetallic inclusions

Microstructure with ferritic grains

Microstructure with ferritic grains


Material Solution Specifications

Solutions Supported standards
Grain intercept ISO 643: 2012, JIS G 0551: 2013, JIS G 0552: 1998, ASTM E112: 2013, DIN 50601: 1985, GOST 5639: 1982, GB/T 6394: 2002
Grain planimetric ISO 643: 2012, JIS G 0551: 2013, JIS G 0552: 1998, ASTM E112: 2013, DIN 50601: 1985, GOST 5639: 1982, GB/T 6394: 2002
Cast iron ISO 945-1: 2010, ISO 16112: 2017, JIS G 5502: 2001, JIS G 5505: 2013, ASTM A247: 16a, ASTM E2567: 16a, NF A04-197: 2004, GB/T 9441: 2009, KS D 4302: 2006
Inclusion worst field ISO 4967 (method A): 2013, JIS G 0555 (method A): 2003, ASTM E45 (method A): 2013, EN 10247 (methods P and M): 2007, DIN 50602 (method M): 1985, GB/T 10561 (method A): 2005, UNI 3244 (method M): 1980
Chart comparison ISO 643: 1983, ISO 643: 2012, ISO 945: 2008, ASTM E 112: 2004, EN 10247: 2007, DIN 50602: 1985, ISO 4505: 1978, SEP 1572: 1971, SEP 1520: 1998
Coating thickness EN 1071: 2002, VDI 3824: 2001

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Sharing

Simple and Efficient Inspections

Use the GX53 microscope and OLYMPUS Stream software to acquire images of diverse samples, conduct a variety of analyses, and generate professional reports.

> Click here for details about OLYMPUS Stream software


Easily Restore Microscope Settings: Coded Hardware

Coded functions integrate the microscope’s hardware settings with OLYMPUS Stream image analysis software. The observation method, illumination intensity, and magnification can be recorded and stored with the associated images. The settings are easily reproduced so that different operators can conduct the same quality inspections with limited training.

Different operators use different settings.

Retrieve the device settings with OLYMPUS Stream software.

All operators can use the same settings.

Different operators use different settings.

Retrieve the device settings with OLYMPUS Stream software.

All operators can use the same settings.


User Guidance Helps Simplify Advanced Analysis

The software guides users step-by-step through an inspection process that complies with the chosen industrial standard. Operators can conduct advanced analysis simply by following the on-screen guidance.

User Guidance Helps Simplify Advanced Analysis


Efficient Report Generation

Creating a report can often take longer than capturing the image and taking the measurements. OLYMPUS Stream software provides intuitive report creation to repeatedly produce sophisticated reports based on predefined templates.

Efficient Report Generation


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Specifications

Optical systemOptical system UIS2 optical system (infinity-corrected)
Microscope frame Reflected light illumination Manual brightfield/darkfield selection by mirror unit
Manual field stop/aperture stop switch with centering
Light source: White LED (with Light Intensity Manager) /12 V, 100 W halogen lamp/100 W mercury lamp/light guide source
Observation mode: brightfield, darkfield, differential interface contrast (DIC)*1, simple polarizing*1, MIX observation (4 directional darkfield)*2
*1 Slider for exclusive use of this observation is required. *2 MIX observation configuration is required.
Microscope frame Imprinting of scale All ports reversed positions (up/down) from observation positions seen through the eyepiece
Microscope frame Output front port (optional) Camera and DP system (reversed image, special camera adapter for GX)
Microscope frame Output side port (optional) Camera, DP system (upright image)
Microscope frame Electrical system Reflected light illumination
Built-in LED power supply for reflected light illumination
  Continuously-variable light intensity dial
  Input rating 5 V DC, 2.5 A (AC adapter 100–240 V, AC 0.4 A, 50 Hz/60 Hz)
Transmitted light illumination (requires the optional BX3M-PSLED power supply)
  Continuously-variable light intensity dial by voltage
  Input rating 5 V DC, 2.5 A (AC adapter 100–240 V, AC 0.4 A, 50 Hz/60 Hz)
External interface (requires the optional BX3M-CBFM control box)
Coded nosepiece connector × 1
MIX Slider (U-MIXR) connector × 1
Handset (BX3M-HS) connector × 1
Handset (U-HSEXP) connector × 1
  RS-232C connector × 1, USB 2.0 connector × 1
Microscope frame Focus Rack and pinion with roller guide
  Manual, coarse and fine coaxial handle; focus stroke 9 mm (2 mm above and 7 mm below the stage surface)
  Fine handle stroke per rotation: 100 μm (min. scale: 1 μm)
  Coarse handle stroke per rotation: 7 mm
  With torque adjustment ring for coarse focusing
  With upper limit stopper for coarse focusing
Tubes Widefield (FN 22) Inverted: binocular (U-BI90, U-BI90CT), trinocular (U-TR30H-2), tilting binocular (U-TBI90)
Nosepiece Brightfield Holes: 4 to 7 pcs, Type: Manual/Coded, Centering: Enabled/Disabled
Brighfield/darkfield Hole: 5 to 6 pcs, Type: Manual/Coded, Centering: Enabled/Disabled
Stage Right handle stage for GX (X/Y stroke: 50 × 50 mm, max. load 5 kg)
Flexible right handle stage, left short handle stage (each X/Y stroke: 50 × 50 mm, max. load 1 kg)
Gliding stage (max. load 1 kg)
A set of teardrop and long hole types
Weight Approx. 25 kg (microscope frame 20 kg)
Environment ・Indoor use
・Ambient temperature: 5 to 40 °C (45 to 100 °F)
・Maximum relative humidity: 80% for temperatures up to 31 °C (88 °F) (without condensation)
  In case of over 31 °C (88 °F), the relative humidity is decreased linearly through 70% at 34 °C (93 °F), 60% at 37 °C
  (99 °F), and to 50% at 40 °C (104 °F).
・Pollution degree: 2 (in accordance with IEC60664-1)
・Installation/Overvoltage category: II (in accordance with IEC60664-1)
・Supply voltage fluctuation: ±10 %

Resources

Application Notes

Nonmetallic Inclusion Analysis in Steel
Evaluation of Steel Grain Size
Evaluation of spheroidal graphite cast iron
Evaluation using visual comparisons with standard diagrams of industrial standards
Measuring Weld Throat Thickness with OLYMPUS Stream Image Analysis Software
Using Image Analysis Software to Measure Throwing Power or PCB Copper Plating Thickness Uniformity
Cast Iron Analysis
Grain Size Analysis in Metals and Alloys
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Infographics

GX53 Inverted Microscope Metallurgy Inspection Standards
GX53 Inverted Microscope Metallurgy Inspection Process
Infographic: GX53 Inverted Microscope - Metallurgy Inspection Process
Infographic: GX53 Inverted Microscope - Metallurgy Inspection Standards
 Show More

Brochures

Inverted Metallurgical Microscope GX53
Inverted Metallurgical Microscopes Customer Solutions

Solutions

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