Industrial Microscopes
Observation

Advanced Analysis Tools

The GX53 microscope’s various observation capabilities provide clear, sharp images, so you can reliably detect defects in your samples. OLYMPUS Stream image analysis software's new illumination techniques and image acquisition options give you more choices for evaluating your samples and documenting your findings.


The Invisible Becomes Visible: MIX Technology

MIX technology combines darkfield with another observation method, such as brightfield or polarization, to enable you to view samples that are difficult to see with conventional microscopes. The circular LED illuminator has a directional darkfield function where one or more quadrants are illuminated at a given time, reducing a sample’s halation to better visualize surface texture.

Cross-section of a printed circuit board

Cross-section of a printed circuit board - Brightfield

Cross-section of a printed circuit board - Darkfield

Cross-section of a printed circuit board - MIX

Brightfield 
The substrate layers and through hole are invisible.

Darkfield 
The traces are invisible.

MIX: Brightfield + Darkfield 
All of the components are clearly represented.

Stainless steel

Stainless steel - Brightfield

Stainless steel - Darkfield

Stainless steel - MIX

Brightfield 
The texture is unobservable.

Darkfield quadrant 
The color information is eliminated.

MIX: Brightfield + Darkfield quadrant 
Both the material color and texture are visible.


Easily Create Panoramic Images: Instant MIA

With multiple image alignment (MIA), you can stitch images together simply by moving the XY knobs on the manual stage—a motorized stage is optional. OLYMPUS Stream software uses pattern recognition to generate a panoramic image, making it ideal for inspecting carburizing and metal flow conditions.

Metal flow of a bolt

Adjust the stage position using the XY knob.

Metal flow of a bolt

Metal flow of a bolt - The full condition of metal flow can be seen.

Adjust the stage position using the XY knob.

The full condition of metal flow can be seen.


Create All-in-Focus Images: EFI

OLYMPUS Stream software’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the depth of focus. EFI stacks these images together to create a single all-in-focus image of the sample. Even when analyzing a cross-section sample with an uneven surface, EFI creates fully-focused images.

EFI works with either a manual or motorized Z-axis and creates a height map to visualize structures.

Resin parts

Adjust the objective’s height with the focusing handle.

EFI automatically captures and stacks multiple images to create a single, in-focus image of the sample.

Fully focused image is created.

Adjust the objective’s height with the focusing handle.

EFI automatically captures and stacks multiple images to create a single, in-focus image of the sample.

Fully focused image is created.


Capture Both Bright and Dark Areas Using HDR

Using advanced image processing, high dynamic range (HDR) adjusts for differences in brightness within an image to reduce glare. It also helps boost the contrast in low-contrast images. HDR can be used to observe minute structures in electric devices and identify metallic grain boundaries.

Gold plate

Some areas have glare.

Both dark and bright areas are clearly exposed using HDR.

Some areas have glare.

Both dark and bright areas are clearly exposed using HDR.

Chromium diffusion coating

Low contrast and unclear.

Enhanced contrast with HDR.

Low contrast and unclear.

Enhanced contrast with HDR.


Applications

There are just a few examples of what can be achieved using different observation methods.

Polished sample of AlSi (Brightfield / Darkfield)

Polished sample of AlSi - Brightfield

Polished sample of AlSi - Darkfield

Brightfield

Darkfield

Brightfield: a common observation method to observe reflected light from a sample by illuminating it straight on. Darkfield: observe scattered or diffracted light from a sample, so imperfections, such as minute scratches or flaws, clearly stand out.

Spheroidal graphite cast iron (Brightfield / DIC)

Spheroidal graphite cast iron - Brightfield

Spheroidal graphite cast iron - DIC

Brightfield

DIC observation

Differential interference contrast (DIC): an observation technique where the height of a sample is visible as a relief, similar to a 3D image with improved contrast; it is ideal for inspections of samples that have very minute height differences, including metallurgical structures and minerals.

Aluminum alloy (Brightfield / Polarized light)

Aluminum alloy - Brightfield

Aluminum alloy - Polarized light observation

Brightfield

Polarized light observation

Polarized light: a technique that highlights a material’s texture and crystal condition to view metallurgical structures, such as the growth pattern of graphite on nodular cast iron and minerals.

Electric device (Brightfield / MIX observation)

Electric device - Brightfield

Electric device - MIX

Brightfield

MIX: Brightfield + Darkfield

MIX observation: combines brightfield and darkfield to show a sample’s color and structure.
The above MIX observation image clearly reproduces the device’s color and texture as well as the condition of the adhesive layer.


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