USPM-RU III
Overview
The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light.
*This product is not available in all locations.
 Measuring Image | Measuring even minute areasThe curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component. |
 Principle of Eliminating Rear Surface Reflection | Reduces backside interferenceAccurate measurement of surface reflectivity can be performed without the costly steps that are typically needed to prevent rear surface reflection. Rear surface-reflected light is reduced by means of special optics that block out all out of focus light reflection similar to a confocal system. Whether your optical component is spherical, aspherical or flat the USPM-RU III does not require sample prep through anti-reflection treatments |
Fast Results
Quick, highly repeatable measurements can be achieved in seconds using a flat filed grating, line sensor and high -speed spectrophotometry.
 XY Chromaticity | X-Y Chromaticy Diagrams and L*A*B MeasurementObject color can be measured based on spectrophotometric colorimetry determined from the prismatic reflectivity. |
Software
 Reflectivity graph image |  Reflectivity text data image |
Specifications
Lens Spectral Reflectivity Measurement Device USPM-RU III: Specifications
| Measurement wavelength | 380nm - 780nm |
|---|---|
| Measurement method | Comparison measurement using reference specimen |
| Sample N.A.* |
0.12 (using 10x objective lens)
0.24 (using 20x objective lens) * it differs from objective lens' N.A. |
| Sample W.D. |
10.1 mm (using 10x objective lens)
3.1 mm (using 20x objective lens) |
| Sample curvature radius | -1R - ∞, +1R - ∞ |
| Sample measurement range |
Approximately ø60 µm (using 10x objective lens)
Approximately ø30 µm (using 20x objective lens) |
| Measurement repeatability (2σ) |
±0.1 % and less (during 380 nm - 410 nm measurement)
±0.01 % and less (during 410 nm - 700 nm measurement) |
| Display resolution | 1 nm |
| Measurement time | A few secs-several secs (it differs from sampling time) |
| Light source | Halogen lamp 12 V 100W |
| Z-direction movement range of the stage | 85mm |
| PC interface | USB |
| Weight |
Unit Approximately 20 kg
Power source for light source: Approximately 3 kg Control box: Approximately 8 kg |
| External dimensions |
Unit: 300 (W) x 550 (D) x 570 (H) mm
Power source for light source: 150 (w) x 250 (D) x 140 (H) mm Control box: 220 (W) x 250 (D) x 140 (H) mm |
| Power Source |
Power source for light source: 100 V (2.8A)/220 V AC
Control box: 100 V (0.2A)/220V AC |
| Environment for use |
Installed at the horizontal plane with no vibration
Temperature: 23 ±5°C Humidity: 60% or less An environment is not subject to air fluctuation |
* Absolute accuracy complying with traceability system is not guaranteed.
Resources
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