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Technical cleanliness inspection system

7 Capabilities That Make Technical Cleanliness Inspections Easy for Novice Operators

By Dr. Christina Hesseling - 七月 1, 2020
Olympus IMS web store

Explore the Olympus IMS Web Store from Work or Home

By Betsy Kenaston - 六月 25, 2020
Scrap metal recycling using handheld XRF

Calculating Your ROI for Scrap Metal Recycling: The Value of Handheld XRF

By Peter Faulkner - 六月 16, 2020
Identifying real diamonds with XRF analysis

Shining Like a Diamond…or Rhinestone: Identifying Precious Gems with XRF Analyzers

By Josh Litofsky - 六月 11, 2020
An Urartu bronze helmet tested by Artemis Labs

Artemis Testing Lab Identifies Authentic Artifacts Using XRF Analysis

By Michelle Wright - 六月 2, 2020
Technical cleanliness inspections

5 Ways the OLYMPUS CIX100 Cleanliness Inspector Delivers Reproducible Results

By Dr. Peter Büscher - 五月 29, 2020
Ancient steel helmet

Carbon Steel Success—How XRF Helped ID an Ancient Helmet

By Michelle Wright - 五月 27, 2020
用于探测轻元素的手持式XRF分析仪

SDD还是PIN：您的手持式XRF分析仪需要哪种探测器？

By Ted Shields - 五月 26, 2020
Passive-axis focusing wedge and phased array probe inspecting a half-pipe, compensating for divergence caused by the curvature of the pipe's surface and back wall.

Curbing the Problem of Ultrasonic Beam Spread with Passive-Axis Focusing (PAF) Wedges

By Simon Alain - 五月 25, 2020
XRF analyzers for manufacturing QA/QC

9 Quick Tips for End-to-End Manufacturing Quality Control

By Damien Blondel - 五月 22, 2020
Vanta with a computer

Share XRF Results Across the Globe with the Vanta™ Data Viewer

By Michelle Wright - 五月 21, 2020
TFM imaging of cluster porosity, a result of moisture-contaminated flux coated electrodes. During the welding process, the moisture is heated, turns into a gas, and becomes trapped in the weld.

4 Essentials for Building Your Code-Compliant TFM Strategy for Weld Inspection

By Daly Souissi - 五月 18, 2020
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作者
Dr. Christina Hesseling
Product Manager Industrial Equipment
Betsy Kenaston
Marketing Specialist, Portable NDT Instruments
Peter Faulkner
Josh Litofsky
Application Scientist, ANI – XRF and XRD Technologies
Michelle Wright
Marketing Specialist, Analytical Instruments
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