Basics of X-ray Fluorescence (XRF) for Positive Material Identification (PMI)

Michael is an Applications Scientist in Olympus’ Analytical Instruments division. Day-to-day, he assists XRF users in finding individual solutions. Michael has a PhD in Inorganic Chemistry from the University of Notre Dame, and his research involved the synthesis of novel materials. He utilizes X-ray techniques for structural characterization, compositional determination, and analytical identification. He was a faculty member at Northwest Missouri State University before joining Olympus and has been a visiting researcher at Rice University and the Colorado School of Mines.