Olympus Logo

Contact Us   Contact Us  

  • Products▾
    • Thickness and Flaw Inspection Solutions▾
      • Flaw Detectors / Phased Array Flaw Detectors▾
        • Ultrasonic Flaw Detectors
        • Phased Array
        • Eddy Current Products
        • Eddy Current Array Products
        • Bond Testing
      • Thickness Gauges▾
        • 27MG
        • 45MG
        • 38DL PLUS
        • Magna-Mike 8600
        • 35RDC
        • Transducers and Accessories
      • Transducers and Probes▾
        • Single and Dual Element Transducers
        • Eddy Current Probes
        • Probes for Tube Inspection
        • Phased Array Probes
        • BondMaster Probes
      • Automated Inspection Systems▾
        • Wheel Inspection System
        • Bar Inspection Systems
        • Tube Inspection Systems
        • Friction Stir Weld Inspection System
      • NDT Systems Instrumentation ▾
        • FOCUS PX / PC / SDK
        • QuickScan
      • NDT Industrial Scanners▾
        • Weld Inspection Scanners
        • Corrosion Inspection Scanners
        • Aerospace/Wind Blade Inspection Scanners
        • Scanner Accessories
      • The Olympus Scientific Cloud
    • XRF and XRD Analyzers▾
      • Handheld XRF Analyzers▾
        • Vanta
        • Vanta Element
      • Compact and Portable XRF Analyzers▾
        • Vanta
        • Vanta Element
        • GoldXpert
        • Xpert for Consumer/RoHS
      • Process XRF Analyzers▾
        • Vanta iX
      • XRD Analyzers▾
        • TERRA II Portable XRD Analyzer
        • BTX III Benchtop XRD Analyzer
      • OEM Solutions▾
        • X-STREAM
      • Applications and Solutions Key
      • The Olympus Scientific Cloud
    • Industrial Microscopes▾
      • Laser Confocal Microscopes▾
        • OLS5100
      • Digital Microscopes
      • Measuring Microscopes▾
        • STM7
        • STM7-BSW
      • Cleanliness Inspector▾
        • OLYMPUS CIX100
      • Light Microscopes▾
        • Upright Microscopes
        • Inverted Microscopes
        • Modular Microscopes
      • Semiconductor & Flat Panel Display Inspection Microscopes▾
        • MX63 / MX63L
        • AL120
        • AL120-12
      • Stereo Microscopes▾
        • SZX16
        • SZX10
        • SZX7
        • SZ61/SZ51
      • Digital Cameras▾
        • DP28
        • DP74
        • SC180
        • DP23
        • LC30
        • XM10
        • XM10IR
      • Image Analysis Software▾
        • OLYMPUS Stream
      • Micro Spectrophotometer▾
        • USPM-RU-W
        • USPM-RU III
      • Objective Lenses▾
        • MPLAPON
        • MPLAPON-Oil
        • MPLN
        • MPLN-BD
        • MPLFLN
        • MPLFLN-BD
        • MPLFLN-BDP
        • LMPLFLN
        • LMPLFLN-BD
        • SLMPLN
        • LCPLFLN-LCD
        • LMPLN-IR/LCPLN-IR
        • White Light Interferometry Objective
        • Micrometer
      • OEM Microscope Components for Integration
      • Industrial Microscope FAQ
      • Customized Solutions
    • Videoscopes and Borescopes▾
      • Videoscopes▾
        • IPLEX NX
        • IPLEX GAir
        • IPLEX GX/GT
        • IPLEX G Lite
        • IPLEX TX
        • IPLEX Long Scope Solution
      • Fiberscopes▾
        • Small Diameter Fiberscopes
      • Rigid Borescopes▾
        • Standard Rigid Borescopes
        • Swing Prism Borescopes
        • Zoom Swing Prism Borescopes
        • MK Modular Mini-Scope
      • Light Sources
      • Inspection Assist Software▾
        • InHelp
  • Industries
  • Resources
  • Learn
  • Blog
  • Support▾
    • Contact Us
    • Customer Service
    • XRF and XRD Technical Support
    • Service Centers
    • Custom Financing Solutions
    • Olympus Scientific Cloud
    • Software Downloads
    • Instruction Manual Downloads
    • ISO Certifications
    • MSDS Datasheets
    • Compliance and Ethics at Olympus
    • Product Information
    • Product Service Termination List
    • Discontinued and Obsolete Products
    • Terms and Conditions of Supply
    • CIC
    • Olympus Technolab
    • Microscope Classroom
  • Rentals
  • Shop
  • Careers
  • Careers
  • Search
  • My Account
    • IMS Log in
    • IMS Registration
    • My Apps
    • My Devices
    • My Data
    • OSC Marketplace
    • My Organization
    • OSC Log in
    • OSC Log in
    • Log Out
    • Log Out
Industrial Solutions
Careers
Careers
InSight Blog
Home/ Blog
Submit your suggestion!
QC automotive paint finishing

Flawless Finish? How Digital Microscopy is Transforming the Automotive Paint Shop

By Hamish Rossell - 15 August, 2018
Ancient Ceramics

How XRF Illuminates the Analysis of Ancient Ceramics

By Michelle Wright - 30 April, 2018
OmniScan and Automated Detection Technology

Breaking Down the Bottleneck: Phased Array Analysis in Seconds

By Emilie Peloquin - 17 April, 2018
Preparación del proceso de trabajo destinado a la limpieza técnica

Breaking Down the Technical Cleanliness Workflow Part 1: Preparation

By Hamish Rossell - 18 December, 2017

3 Tips for Measuring Welds with X-ray Fluorescence (XRF)

By Alex Thurston - 21 November, 2017

The Value of a Turnkey Cleanliness Inspection System

By Francesco Piscani - 10 October, 2017

Acquiring High-Quality Images Through Silicon Without Damaging the Finished Product

By Robert Bellinger - 12 September, 2017

An Introduction to Technical Cleanliness Inspection

By Francesco Piscani - 15 August, 2017

Through Thick and Thin: Using XRF to Measure Coating Thickness

By Karen Paklin - 28 July, 2017

Going Ballistic: Laser Scanning Confocal Microscopy Helps Identify Breech Face Markings

By Robert Bellinger - 11 July, 2017

Inspecting Explosion-Bonded Cladded Plates

By Florin Turcu - 1 June, 2017

Using Image Analysis Software to Automatically Detect Particles in Cadmium Zinc Telluride

By Robert Bellinger - 16 May, 2017
  • Subscribe to the Insight Blog Subscribe to the Insight Blog
Share
x
Keyword Search
Popular Topics
Thickness Gage Ultrasonic Automotive XRF XRD Metal Manufacturing Inspection Service Industrial Microscopes Mining & Geology Environment RVI Conventional Ultrasound Vanta Academic Research Aerospace Energy Infrastructure Medical Devices Oil & Gas Security & Defense Electronics OmniScan Phased Array Eddy Current Cleanliness Inspection Flaw Detection IPLEX Digital Microscope Safety Handheld XRF
Authors
Dr. Christopher Lane
Manager, Olympus APAC Technology Centre
Emilie Peloquin
Global Advanced Product Support Manager
Simon Alain
Product Manager, Scanners and Inspection Solutions
Michelle Wright
Marketing Specialist, Analytical Instruments
Show all authors
Blog Posts By Date
InSight Blog Sign-up

By clicking subscribe you are agreeing to our privacy policy which can be found here.

Sorry, this page is not available in your country
Let us know what you're looking for by filling out the form below.
  • Contact Us
  • Subscribe to Newsletters
Home/ Blog
Print

Copyright OLYMPUS CORPORATION, All rights reserved.

Global | Terms Of Use | Privacy Notice | Cookies | | About Us | Careers | Careers | Sitemap

Copyright OLYMPUS CORPORATION, All rights reserved.

Global | Terms Of Use | Privacy Notice | Cookies | | About Us | Imprint | Careers | Careers | Sitemap

  • Youtube
  • LinkedIn
  • Twitter
  • Facebook
Cancel

Redirecting

You are being redirected to our local site.