Square Billet Inspection System (SBIS)
Overview
Optimized for full volumetric inspection of large-diameter square billets, bars, and blooms, the phased array technology and unique water-wedge design of this system provide high repeatability on small reference defects. The Square Billet Inspection System (SBIS) integrates easily into the production line since the need for an inspection tank has been eliminated. Its tankless design supports a high production capacity, making it easy to manipulate the billets during the fabrication process.
- Unique elastomer membrane of the water wedge requires only a thin film of water to provide reliable ultrasonic coupling with the product’s surface
- Two PA probes simultaneously inspect the full volume of products, covering a range of dimensions (see Specifications)
- Pneumatic actuators enable the probes to automatically adjust to the product size and adapt to geometrical variations.
- Electronic control of the probe enables you to set the active element to the product’s dimensions
- Eddy current array (ECA) probes can provide surface inspection of all four sides and corners when required
Two-sided inspection coverage provided by phased array probes on square bars of different dimensions
The SBIS reliably detects typical defects, such as ≥1.0 mm FBHs or elongated defects, at depths of:
- 50% of the nominal diameter
- 25% of the nominal diameter
- 5 mm from the back wall
Software and Acquisition Units
Phased array (PA) and eddy current array (ECA) probe technology, a powerful acquisition unit, and advanced software deliver a powerful inspection system.
PA and ECA Acquisition Units
The QuickScan™ PA 32:256 module meets IP55 standards and provides full volumetric coverage, while the QuickScan EC unit provides the flexibility to inspect the billet’s surface. Both units easily integrate into industrial environments.
Easy Setup
QuickView™ software makes it easy to configure the system and acquire and manage data. The results are merged and displayed to clearly differentiate between accepted and rejected billets.
- Software wizard assists you in creating setups for each part size
- Quickly access predefined inspection configuration and calibration parameters for each billet diameter
- Restrict access to certain users to help minimize operator errors
- Calibration and inspection information are stored for traceability
System Specifications
System Performance
| Standard Product Range | Size | Standard 120 × 120 to 280 × 280 mm (4.7 × 4.7 to 11 × 11 in.), can be extended upon request. |
| Speed | Typically: 30 m/min (140 × 140 mm or 160 × 160 mm (5.5 × 5.5 or 6.3 × 6.3 in.) square billets) for dynamic FBH detection. | |
| Coverage |
PAUT 2- or 4-sided inspection, starting at 30 mm (1.2 in.) from the interface to 5 mm (0.2 in.) from the back wall, excluding corners.
Eddy current array (ECA) inspection covers all four billet faces and corners. | |
| Data Presentation |
Real-Time
Inspection Results | C-scan, A-scan, B-scan, strip charts, and alarms |
| Inspection Modes |
Typical
Inspection Modes | Longitudinal waves, volume inspection eddy current array, surface inspection |
|
Bar
Temperature | Up to 60 °C (140 °F) | |
|
Detection Capabilities
for Typical Reference Defects | Repeatability |
≥1.0 mm FBH: <6 dB
Depending on the material’s condition. |
|
Reporting and
Data Storage | Report Types | Inspection, calibration, and calibration-check user-configurable reports |
| Storage | Real-time database inspection data storage |