How to Perform Faster and More Productive TFM Inspections

27 April, 2024 at 5pm EDT / 11pm CEST

While the total focusing method (TFM) can provide excellent images, TFM inspections often run at slower acquisition rates. Learn how to optimize TFM inspection speeds on the OmniScan™ X3 phased array flaw detector so you can be more productive.

Curtis Dickinson

Sr. Applications Engineer

Curtis re-joined the Olympus team after several years providing ultrasonics training and consulting for the inspection industry. Combined with his Associates in Applied Science – NDT degree, he has over 12 years of experience in ultrasonics, phased array, and TOFD applications.