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Olympus provides an industry-leading portfolio of innovative test, measurement, and imaging instruments.

Leading edge testing technologies include remote visual inspection, microscopy, ultrasound, phased array, eddy current, eddy current array, X-ray fluorescence and diffraction, and optical metrology. Our products include ultrasonic flaw detectors and thickness gages, videoscopes, borescopes, microscopes, in-line and advanced nondestructive testing systems, XRF and XRD analyzers, interferometers, and a large selection of industrial scanners, probes, software programs, and instrument accessories.

Olympus instruments are used in industrial and research applications ranging from aerospace, power generation, petrochemical, manufacturing, and automotive to consumer products. Olympus instruments contribute to the quality of products and add to the safety of infrastructure and facilities.


Ultrasonic testing uses high frequency, highly directional sound waves to measure material thickness, find hidden internal flaws, or analyze material properties in metals, plastics, composites, ceramics, rubber, and glass. Using frequencies beyond the limit of human hearing, ultrasonic instruments generate shorts bursts of sound energy that are coupled into the test piece, and the instrument monitors and analyzes reflected or transmitted wave patterns to generate test results.
Phased Array testing is a specialized type of ultrasonic testing that uses sophisticated multi-element array transducers and powerful software to steer high frequency sound beams through the test piece and map returning echoes, producing detailed images of internal structures similar to medical ultrasound images. It is used for inspection of critical structural metals, pipeline welds, aerospace components, and similar applications where the additional information supplied by phased array inspection is valuable.
Eddy Current testing utilizes principles of electromagnetic induction to locate near-surface cracks, measure thickness, and categorize certain material properties in metals. An eddy current probe generates a magnetic field that induces currents that flow in a circular path in the test material. Changes in the integrity or thickness of the test piece will in turn affect current flow, the magnetic field, and ultimately the magnitude and phase of the voltage in the coil. The instrument monitors the probe output and displays information for analysis. Eddy current array systems use multiple probes to expand coverage areas and provide imaging capability.
Industrial microscopes incorporate many complex designs that aim to improve resolution and sample contrast. Olympus microscopes meet a wide-variety of analysis applications, from a routine inspection to sophisticated analysis by it's wide range of microscope models strengthened by superb optical performance and a variety of accessories. The combination of digital camera and software provides streamlined workflows and flexible solutions for image acquisition, measurement and reporting as well as grain analysis, particle analysis and other material solutions. OLYMPUS also provides non-contact geometric measurements of electronic devices and machined parts with a high-precision measuring system.
Our remote visual inspection videoscopes systems are designed to meet the demands of the modern industrial inspection environment. They offer portable and intelligent remote imaging solutions with a host of advanced, yet intuitive features, making them ideal remote visual inspection instruments A wider range of videoscope, fiberscopes and borescopes with various diameters and viewing options are available, making our videoscopes systems most versatile inspection system suitable for a multitude of inspection requirements.
X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) Analysis are based on the interaction of matter with x-rays which are short-wavelength, high-energy beams of electromagnetic radiation. XRF analysis utilizes the fact that when a primary x-ray beam strikes a substance, it excites elements at the atomic level, causing electron movement. Each element has characteristic emissions of secondary (fluorescent) x-rays when these movements occur, identifying the elemental composition of the substance. For instance, XRF can tell that iron and sulfur are in a substance and the quantity of each. XRD analysis utilizes the fact that when a primary x-ray beam strikes a substance, diffraction takes place creating a pattern that is unique to the crystalline structure(s) of the substance. XRD patterns are used to identify the compound(s) in the substance. For instance, XRD can identify and quantify the iron-sulfur compound in a substance such as marcasite - iron disulfide orthohomic, pyrite - iron disulfide cubic, or pyrrhotite - iron sulfide. Together, XRF and XRD give a comprehensive picture of the composition of a substance by providing elemental and compound identification and quantification. These non-destructive, rapid analysis techniques are widely used to determine the composition of metals, alloys, glass, ceramics, minerals and countless other materials.

Advanced NDT Solutions

Flaw Detectors

Thickness Gages

Videoscopes, Borescopes

Microscope Solutions

XRF and XRD Analyzers

Integrated Inspection Systems

High Speed Video Cameras