Microscope Solutions

LMPLN-IR/LCPLN-IR

LMPLN-IR/LCPLN-IR Near-Infrared Inspection Objective Lenses

Specifications

LCPLN100XIR objective lens
N.A. W.D. F.N. Glass Thickness
Correction (mm)
Silicon Thickness
Correction (mm)
0.85 1.2 22 0-0.7 0-1.0

Transmittance/Wavelength

Transmittance/Wavelength

Dimensions

LCPLN100XIR Dimensions

Specifications

LCPLN50XIR objective lens
N.A. W.D. F.N. Glass Thickness
Correction (mm)
Silicon Thickness
Correction (mm)
0.65 4.5 22 0-1.2 0-1.2

Transmittance/Wavelength

Transmittance/Wavelength

Dimensions

LCPLN50XIR Dimensions

Specifications

LCPLN20XIR objective lens
N.A. W.D. F.N. Glass Thickness
Correction (mm)
Silicon Thickness
Correction (mm)
0.45 8.3 22 0-1.2 0-1.2

Transmittance/Wavelength

Transmittance/Wavelength

Dimensions

LCPLN20XIR Dimensions

Specifications

LMPLN10XIR objective lens
N.A. W.D. F.N.
0.3 18 22

Transmittance/Wavelength

Transmittance/Wavelength

Dimensions

LMPLN10XIR Dimensions

Specifications

LMPLN5XIR objective lens
N.A. W.D. F.N.
0.1 23 22

Transmittance/Wavelength

Transmittance/Wavelength

Dimensions

LMPLN5XIR Dimensions

Our LMPLN-IR and LCPLN-IR long working distance Plan Achromat lenses, are specifically designed for optimal transmission in the near infrared (700-1300nm wavelengths).

Near-IR Long Working Distance Plan Achromat - LMPLN-IR/LCPLN-IR

  • Objective lenses exclusive for the near-infrared microscopy, for inspecting internal structures in silicon wafers
  • The LCPLN-IR lenses have correction collars that adjust for varying thicknesses of silicon or glass substrates

LMPLN-IR/LCPLN-IR for Infrared Light Observation

Loading...

Inspection & Measurement Systems
English | 日本語 | français | 简体中文 | Deutsch | italiano | čeština | magyar | Tiểng Việt | Español | русский | polski | português | 한국어

Advanced NDT Solutions

Flaw Detectors

Integrated Inspection Systems