Inspection & Measurement Systems

Micro Spectrophotometer

Micro-spectrophotometer provides high speed and repeatable measurement using an optical grating and line sensor. Curved surfaces and micro spot can be measured that most spectrophotometer can not measure.

USPM-RU-W

Olympus' USPM-RU-W NIR Micro-Spectrophotometer performs fast, accurate spectrometry across a wide range of wavelengths of visible light to near-infrared.The ability to easily measure reflectivity of extremely small areas or curved surfaces that cannot be measured using ordinary spectrophotometers, makes the USPM-RU-W optimally suited for analyzing optical elements or minute electronics parts.

USPM-RU III

The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light.

Advanced NDT Solutions

Flaw Detectors

Integrated Inspection Systems