Olympus' USPM-RU-W Enables Accurate and Fast Measurements of Curves Surfaces and Minute Areas
Olympus' USPM-RU-W NIR Micro-Spectrophotometer performs fast, accurate spectrometry across a wide range of wavelengths of visible light to near-infrared.The ability to easily measure reflectivity of extremely small areas or curved surfaces that cannot be measured using ordinary spectrophotometers, makes the USPM-RU-W optimally suited for analyzing optical elements or minute electronics parts.
■ Reflectivity, Film thickness, Object color, and transmittance measured in seconds
■ Wide range of wavelength from 380 to 1050 nm
■ Measures reflectivity on curved surface without contact
Measure the reflectivity of a minute area with a diameter ranging from 17 to 70 um
Optical Path of Reflectivity Measurement
Example of reflectivity measurement : lens
Example of reflectivity measurement : lens curvature
Measure Film Thickness
Film Thickness Measurement Screen-shot
Measure Object Color
Object Color Measurement Screen-shot
Measure Transmission Levels (Available as an option)
Measure the transmittance of a plane sample by transmitting 2 mm parallel beams of lights through the sample to the spectrophotometry acceptance elements.
Optical Path of Transmittance Measurement
Measure Reflectivity at an Incidence Angle of 45 Degrees（Available as an option）
Measure the reflectivity at an incidence angle of 45 degrees by reflecting 2 mm parallel beams of lights to the spectrophotometry acceptance elements.
Optical Path of 45-degree Reflectivity Measurement
Provides High-speed Measurement
Optical system image
Optimally Suited for Reflectivity Measurement of Extremely Small Parts and Lenses
Image of reflectivity measurment
Anti-reflection Processing is Not Required on the Back of the Sample
Principle of backside reflection elimination
Available Film Thickness Measurement Methods
The single-layer or multi-layer film thickness can be analyzed according to the measured spectral reflectivity data. You can select the optimum measurement method for the application.
Peak valley film thickness analysis result
Fourier Transform Method
Fourier transform film thickness analysis result
Curve Fit Method
Curve fitting film thickness analysis result
This method is used to calculate film thickness by estimating which structure has the smallest difference between the measured spectral reflectivity and the calculated reflectivity for that structure, and is effective for measuring single-layer and multilayer films. The curve fit method also makes it possible to analyze thin film in which peak and valley values are not apparent.
Satisfies Diverse Measurement Needs at High Speed and With High Precision
Evaluation of Lens Coating for reflectivity,color and film thickness.
Digital Camera Lenses
Examining the Reflectivity and Film Thickness of Minute Electronic Parts.
Printed Circuit Boards
Reflectivity, Film Thickness and Transmittance measurment of Planar Optical Elements.
Optical Elements Reflectivity at an Incident Angle of 45 Degrees.
|USPM-RU-W NIR Micro-Spectrophotometer：Specifications|
|Reflectivity measurement||Transmittance Measurement*1||Reflectivity Measurement for 45-Degrees*1|
Transmittance measurement set for
45-degree reflectance measurement set for
|Measured wavelength||380 to 1050 nm|
|Measurement method||Compared with a reference sample for measurement||Transmissivity is measured with 100% as standard||Compared with a reference sample for measurement|
|Measurement range||See the specifications of the objective lens below||Approx. 2.0 mm in diameter|
|Measurement repeatability(3σ) *2||Reflectivity measurement||During use of 10x and 20x objective lenses||
±0.02% or less (430 to 1010 nm)
±0.2% or less (Except as described above)
±0.3% or less (430 to 1010 nm)
±1.0% or less (Except as described above)
|During use of a 40x objective lens||
±0.05% or less (430 to 950 nm)
±0.5% or less (Except as described above)
|Film thickness measurement||±1%||-|
|Wavelength display resolution||1nm|
|Lighting accessory||Dedicated halogen light source, JC12V 55W (Average life: 700 hours)|
Loading surface size: 200 (W) x 200 (D) mm
With stand load: 3 kg
Operating range: (XY) ±40 mm, (Z) 125 mm
Loading surface size: 140 (W) x 140 (D) mm
Withstand load: 1 kg
Operating range: (XT) ±1*, (YT) ±1*
|Weight||Main body: Approx. 26 kg (not including PC)||Main body: Approx. 31 kg (not including PC)*3|
|Control power box: Approx. 6.7 kg|
|Dimensions||Main body: Approx. 26 kg (not including PC)||Main body: Approx. 31 kg (not including PC)*3|
|Control power box: 250 (W) x 270 (D) x 125 (H) mm|
|Power specifications||Input specifications: 100 to 240 VAC, 110 VA 50/60 Hz|
Horizontal place not subject to vibration
Temperature: 15 ºC to 30 ºC
Humidity: 15% to 60% RH (Free from dew condensation)
*1 Optional unit *2 Measured under the measurement conditions of our company. *3 The total combined weight of both the installed transmissivity measurement
|Operating distance||±5 mm or more||±1 mm or more||±1 mm or more|
*4 It differs from objective lens' NA.
*5 Spot diameter
Spectral Analysis Software with an Easy-to-use User Interface
Example of GUI layout
Diverse Measurement Results
Reflectivity/transmittance graph, reflectivity/transmittance text, XY/L*a*b* chromaticity diagram
Easy Position Adjustment and Focus Adjustment
Positioning the measuring point is easy by using a focusing window for Z axis alignment and centering (CT) window for X and Y axis alignment.
Flexibility for Any Application
Work setting, layer setting, graph setting, parameter setting
Tolerance setting function of automatic pass / fail determination.
Example of reflectivity measurement with Tolerance setting function