i-SPEED PL
IPLEX UltraLite
LabVIEW compatibility
OmniScan MX2
Innov-X DELTA Handheld XRF
EPOCH 1000 Series
BXiS
LEXT OLS4000
Encoded B-scan, 38DL PLUSOlympus announces the i-SPEED PLi-SPEED cameras* are now compatible with LabVIEWOlympus is pleased to introduce the palm-sized, IPLEX UltraLite videoscopeOlympus Innov-X introduces the new GoldXpert XRF AnalyzerOlympus Innov-X Awards Research & Discovery Grant to The Institute of ArchaeologyOlympus introduces Thickness Gages and Flaw Detectors to the Web Store Olympus Introduces Industrial Tech Guide App for iPhone and iPadOlympus launches Encoded C-scan Option for the EPOCH 1000iSan Francisco State University Awarded Research & Discovery Grant To Study Heavy Metal Content Of Cosmetics And Skin Care Products
See All HeadlinesNielsen Environmental Field Conference
United States of America
07 luty 2012
Heli-Expo
United States of America
11 luty 2012
Olympus provides an industry-leading portfolio of innovative test, measurement, and imaging instruments.
Leading edge testing technologies include remote visual inspection, microscopy, ultrasound, phased array, eddy current, eddy current array, X-ray fluorescence and diffraction, high speed video, and optical metrology. Our products include ultrasonic flaw detectors and thickness gages, videoscopes, borescopes, microscopes, high speed video cameras, in-line and advanced nondestructive testing systems, XRF and XRD analyzers, interferometers, and a large selection of industrial
scanners, probes, software programs, and instrument accessories.
Download our Olympus-IMS Industrial Solutions brochure >> Download our Olympus Power Generation Solutions >> |
Ultrasonic TestingUltrasonic testing uses high frequency, highly directional sound waves to measure material thickness, find hidden internal flaws, or analyze material properties in metals, plastics, composites, ceramics, rubber, and glass. Using frequencies beyond the limit of human hearing, ultrasonic instruments generate shorts bursts of sound energy that are coupled into the test piece, and the instrument monitors and analyzes reflected or transmitted wave patterns to generate test results. Phased Array TestingPhased Array testing is a specialized type of ultrasonic testing that uses sophisticated multi-element array transducers and powerful software to steer high frequency sound beams through the test piece and map returning echoes, producing detailed images of internal structures similar to medical ultrasound images. It is used for inspection of critical structural metals, pipeline welds, aerospace components, and similar applications where the additional information supplied by phased array inspection is valuable. Eddy Current and Eddy Current Array TestingEddy Current testing utilizes principles of electromagnetic induction to locate near-surface cracks, measure thickness, and categorize certain material properties in metals. An eddy current probe generates a magnetic field that induces currents that flow in a circular path in the test material. Changes in the integrity or thickness of the test piece will in turn affect current flow, the magnetic field, and ultimately the magnitude and phase of the voltage in the coil. The instrument monitors the probe output and displays information for analysis. Eddy current array systems use multiple probes to expand coverage areas and provide imaging capability. Optical MetrologyMeasuring microscopes provide non-contact geometric measurements of electronic devices and machined parts with a high-precision measuring table. 3D measuring laser microscopes are capable of making measurements with sub-micron accuracy. High-definition 3D images acquired using confocal technology enable highly accurate height measurements, while a minute laser spot enables non-contact surface roughness measurements regardless of material surface condition. Furthermore, by applying our lens evaluation technology developed with our lens manufacturing experience, we also provide laser interferometers for measuring surface accuracy of optical components, and a spectral reflectivity measurement device for measuring spectral reflectivity and film thickness. *Interferometers may not be available in some areas. Microscope SolutionsOptical microscopes are microscopes that typically use visible light and a system of lenses to magnify images of small samples. Industrial microscopes incorporate many complex designs that aim to improve resolution and sample contrast. Images from an optical microscope can be captured by normal light-sensitive cameras to generate a micrograph. Modern developments in CMOS and charge-coupled device (CCD) cameras allow the capture of digital images. Digital microscopes are available with a CCD camera to examine a sample, and the image is shown directly on a computer screen without the need for eye-pieces. Remote Visual TestingOur remote visual inspection videoscopes systems are designed to meet the demands of the modern industrial inspection environment. They offer portable and intelligent remote imaging solutions with a host of advanced, yet intuitive features, making them ideal remote visual inspection instruments A wider range of videoscope, fiberscopes and borescopes with various diameters and viewing options are available, making our videoscopes systems most versatile inspection system suitable for a multitude of inspection requirements. High Speed VideoHigh speed video is capable of capturing images at speeds up to 1,000,000 frames per second. Our cameras are an effective method of locating problems quickly and easily. Users can evaluate new designs, increase productivity, and reduce maintenance costs. Video images are digitally captured onto its memory with custom designed software that provides the operator with the ability to analyze and enhance images. Velocity and distance measurement can also be calculated. XRF and XRD AnalysisX-ray Fluorescence (XRF) and X-ray Diffraction (XRD) Analysis are based on the interaction of matter with x-rays which are short-wavelength, high-energy beams of electromagnetic radiation. XRF analysis utilizes the fact that when a primary x-ray beam strikes a substance, it excites elements at the atomic level, causing electron movement. Each element has characteristic emissions of secondary (fluorescent) x-rays when these movements occur, identifying the elemental composition of the substance. For instance, XRF can tell that iron and sulfur are in a substance and the quantity of each. XRD analysis utilizes the fact that when a primary x-ray beam strikes a substance, diffraction takes place creating a pattern that is unique to the crystalline structure(s) of the substance. XRD patterns are used to identify the compound(s) in the substance.
For instance, XRD can identify and quantify the iron-sulfur compound in a substance such as marcasite - iron disulfide orthohomic, pyrite - iron disulfide cubic, or pyrrhotite - iron sulfide. Together, XRF and XRD give a comprehensive picture of the composition of a substance by providing elemental and compound identification and quantification. These non-destructive, rapid analysis techniques are widely used to determine the composition of metals, alloys, glass, ceramics, minerals and countless other materials. |
Copyright 2011 OLYMPUS CORPORATION, All rights reserved. Terms Of Use | Privacy Statement