Przegląd
BTX™ III Benchtop XRD AnalyzerThe BTX III X-ray diffraction (XRD) analyzer provides fast, reliable quantitative mineralogy of major and minor components in a compact, benchtop design. The BTX III analyzer features a unique small sample holder to provide a lightweight and virtually maintenance-free alternative to conventional XRD. This standalone instrument runs without the need for compressed gas, water cooling, a secondary chiller, or external transformer, keeping the cost of ownership low. Operators can directly connect the XRD instrument to any device using Ethernet or wireless capability. Our XRD tools are powered by intuitive SwiftMin® software to streamline your workflow with a single dashboard, preset calibrations, easy data export, and automatic data transfer. | ![]() |
---|
![]() | Increased Speed and Sensitivity Power Swift DecisionsPowerful, intuitive software is paired with improved X-ray detectors for enhanced sensitivity, faster analysis times, and more reliable results.
|
---|
Sample Prep Made EasyUsing conventional X-ray diffraction instruments, a large batch of sample must be finely ground and pressed into a pellet to ensure a sufficiently random orientation of the crystals. In contrast, the small vibrating sample holder utilized in the BTX III convects all particles within the sample chamber, ensuring data is virtually free of orientation effects. As a result, the instrument requires a mere 15 mg of sample, easily obtained using the supplied sample kit. | ![]() |
---|
SwiftMin
Specyfikacja
BTX III XRD System Specifications
|
The BTX III operates off software embedded in the unit itself. The user accesses the operating system through a wireless connection (802.11 b/g). This unique method of operation allows for a wide degree of flexibility in controlling the instrument and subsequent data handling. |
Aplikacje
Olympus XRD
How Olympus XRD WorksThe Olympus XRD diffractometers use a unique method to rapidly and easily collect and process XRD data.
Our instruments use transmission geometry (represented in the image above), rather than reflection geometry used in conventional goniometer-based XRD models. With no moving parts, we achieve randomization using a unique vibrating sample holder. It generates a constant frequency that randomizes the powder, known as powder liquefaction. The powder sits in between two windows of either Mylar or Kapton, as shown in the image below. ![]() Thanks to our convective technique, every grain of sample in the chamber passes through the X-ray beam in every possible orientation within 30 seconds. With this method, Olympus XRD tools achieve 100% randomization, a critical component of precise and accurate X-ray diffraction. Requiring a mere 15 mg of sample, Olympus XRD can simultaneously collect the entire practical 2-theta range. The lack of moving parts also makes our XRD products reliable and virtually maintenance free. |
Resources
Uwagi dotyczące aplikacjiFilmySlideShareSeminaria internetoweBroszuryInstrukcje obsługiCase Studies |