Optical Metrology

KIF-10A-UW

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Compact LD Interferometer (Upward Type) KIF-10A-UW: Specifications
Item	KIF-10A-UW
Inspection method	Fizeau type interferometry
Aperture	ø25.4 mm (1 inch)
Magnification	1X
Reference lens surface accuracy	λ/15 (spherical and flat surfaces)
Light source	Semiconductor laser (635 nm), class 2 product Laser output: 0.8 mW or less
Power supply	Primary source: 100 - 240 VAC, 50/60 Hz Main unit power supply: 12 VDC
Test piece size	R: approx. ±140 mm *, Diameter: approx. 110 mm
Main unit dimensions	90 (W) × 112 (D) × 185 (H) mm (excluding the laser shielding plate)
Main unit mass	Approx. 2 kg
Main options	3-axis stage, 2-axis stage, small LCD monitors (2.5", 5.6"), reference lenses, aperture converter RF25-D6

* The minimum R and minimum diameter differ depending on the test piece.

Small LD Interferometer KIF-10A-UW is a low-cost, compact LD interferometer. This type has achieved compactness in a palm size and ease of operation. Just only putting a lens on the stage enables an easy and quick inspection.

Extra small size and ease of operation
Ultra-small type with a height of 185 mm (main unit). With this model located next to a processing machine on the shop floor, fix an appropriate adapter to a test lens on the stage, then just place the lens to perform inspection.
Smooth introduction to existing inline processes through the use of 635nm laser wavelength
Since the laser wavelength is close to that of the conventional Fizeau interferometer (632.8nm), equivalent interference fringe sensitivity can be obtained. This allows smooth introduction of this model to an existing inline inspection process.
Olympus' rich reference lens lineup
One-inch and compact-type specifications are used for reference lenses, with a wide choice of options similar to the KIF-202L series.

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