Optical Metrology

KIF-10A-UW

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Small LD Interferometer KIF-10A-UW is a low-cost, compact LD interferometer. This type has achieved compactness in a palm size and ease of operation. Just only putting a lens on the stage enables an easy and quick inspection.

Стандартные
Характеристики
Interference Fringe Digitalization Kit
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Extra small size and ease of operation
Ultra-small type with a height of 185 mm (main unit). With this model located next to a processing machine on the shop floor, fix an appropriate adapter to a test lens on the stage, then just place the lens to perform inspection.
Smooth introduction to existing inline processes through the use of 635nm laser wavelength
Since the laser wavelength is close to that of the conventional Fizeau interferometer (632.8nm), equivalent interference fringe sensitivity can be obtained. This allows smooth introduction of this model to an existing inline inspection process.
Olympus' rich reference lens lineup
One-inch and compact-type specifications are used for reference lenses, with a wide choice of options similar to the KIF-202L series.

Compact LD Interferometer (Upward Type) KIF-10A-UW: Specifications
Item	KIF-10A-UW
Inspection method	Fizeau type interferometry
Aperture	ø25.4 mm (1 inch)
Magnification	1X
Reference lens surface accuracy	λ/15 (spherical and flat surfaces)
Light source	Semiconductor laser (635 nm), class 2 product Laser output: 0.8 mW or less
Power supply	Primary source: 100 - 240 VAC, 50/60 Hz Main unit power supply: 12 VDC
Test piece size	R: approx. ±140 mm *, Diameter: approx. 110 mm
Main unit dimensions	90 (W) × 112 (D) × 185 (H) mm (excluding the laser shielding plate)
Main unit mass	Approx. 2 kg
Main options	3-axis stage, 2-axis stage, small LCD monitors (2.5", 5.6"), reference lenses, aperture converter RF25-D6

* The minimum R and minimum diameter differ depending on the test piece.

Compact LD Interferometer (Upward Type) KIF-10A-UW: Interference Fringe Digitization Kit for KIF10A

Interference fringe digitization kit KIF-FS10A is a system for displaying digitized aberrations from interference fringes of the interferometer inspection system KIF-10A series.

Features

Simple OK/NG judgment
The system can easily perform OK/NG judgment on the production line with the OK/NG judgment function in accordance with an arbitrary-set standard value.
Quick processing
Since processing is significantly quicker than that of the fringe analysis software using the scanning method, the system can perform interference fringe analysis almost in real time.
Low-cost system
This system can be configured at lower cost, compared with the fringe scanning type interferometer system.
Controllable in the manufacturing process
OK/NG judgment can easily be controlled in the manufacturing process thanks to the capability to save numerical data and print image data.

Specifications

Interference Fringe Digitization Kit for KIF10A
Item	KIF-FS10A
Phase calculation method	Interference fringe profile (fringe digitization method)
Reproducibility	PV value: 0.1λ or less * (3σ value, under Olympus measurement conditions)
Interference fringe analysis speed	Approx. 1.0 second (depends on the PC performance)
OS	Windows XP
Main functions	P-V, RMS, Pwr, AS, Coma, and Sa3 display function (incapable of +/- judgment)
	Standard value setting and OK/NG judgment function
	Mask setting function
	Single/continuous measurement function

* The system may not exert sufficient performance depending on the installation environment during measurement. Please contact Olympus for details.
* This system shall not guarantee traceability. Please understand that this system is designed to inspect products on the manufacturing line while comparing with the master lens.

Windows and Windows XP^(R) are registered trademarks of US Microsoft Corporation in USA and other countries.

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