Polovodičové mikroskopy a inspekční mikroskopy s plochým panelovým displejem

Mikroskopy Olympus MX jsou vyvinuty se záměrem nabídnout nejvyšší efektivitu všem zákazníkům. Mikroskopy MX mají čtyři prospěšné stupně – rychlé spuštění, jednoduchý provoz, analýza závad a možnost rozšíření pro uživatele.

MX63 / MX63L

The MX 63 and MX63L microscope systems offer quality observations for 300 mm wafers at largest, flat panel displays, print circuit boards, and other large samples, featuring the versatile functions and ergonomic, user-friendly designs. The flexible module design provides optimal observation systems for diverse inspection purposes. By the combination with OLYMPUS Stream image analysis software, your inspection procedure from observation to report generation can be simplified and streamlined.

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AL120

The AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design.

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AL120-12

The AL120-12 wafer handler is compatible with both FOUP (Load Port) and FOSB, ideal for lower cost back-end inspection. The safe and ergonomic design maintain operator safety while effectively transferring wafers including thin and warped wafers.

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Kamera a softwarová řešení

K dispozici jsou digitální kamery pro poskytování vysokého rozlišení a věrnosti barev. Celkové řešení Olympus je spojeno se softwarem pokročilého zobrazování, který poskytuje integrované operace od základního zachycení obrazu až po zpracování obrazu, měření a vytváření reportů.

OLYMPUS Stream

OLYMPUS Stream image analysis software offers fast, efficient inspection workflows for all process steps for image acquisition, quantitative measurements and image analysis, reporting, and advanced materials science inspections tasks.

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Digital Cameras for Microscopes

Olympus Digital Cameras are exclusively designed for Microscopes and become indispensable options nowadays. All cameras are confirmed their best digital imaging performance with Olympus Microscopes and Imaging Analysis Software systems.

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