* The system may not exert sufficient performance depending on the installation environment during measurement.
* This system shall not guarantee absolute accuracy in conformity with the traceability system.

• Work parameters setup functions
  ・ Product name, unit name, comment
  ・ Fitting order (3/4/9/16/25/36)
  ・ Aberration elimination (aberration specification/Zernike coefficient specification)
  ・ Display units (λ, μm, nm, fringe)
  ・ Offset setting for Zernike coefficients
  ・Rated values (each aberration specification and user-defined expression)

• Analysis result display functions
  ・ P-V, RMS, Pwr
  ・ Seidel aberrations (tilt, focus, astigmatism, coma, spherical aberration)
  ・ Zernike coefficients (3, 4, 9, 16, 25, 36 terms)
  ・ 3D bird's-eye view, 2D color map
  ・ Cross-section profile (X-direction, Y-direction, PV, RMS)
  ・ OK/NG judgment result

• File input/output functions
  ・ Save/read of work parameters
  ・ Save/read of fringe data
  ・ Save/read of mask data
  ・ Save/read of screen layouts
  ・ Main window printing

Model KIF-FU100, KIF-FSA is an interference fringe analysis system mounted on the KIF-402 series interferometer for acquiring the wavefront phase of a test piece by a fringe scanning method and displaying and saving the measurement result.

1. Space-saving
   The system achieves a space-saving design through the adoption of a piezoelectric controller developed by Olympus and a laptop PC.

2. Improvement in measurement speed
   The improvement of image data capturing and analysis algorism has reduced measurement speed.

3. Automatic alignment function
   Alignment work to null interference fringes can be automated by combining with an optional 3-axis piezo stage, thus allowing improvement in work efficiency (at spherical surface measurement).

4. High-functionality analysis software
   The analysis software, including the automatic alignment function, has been completely changed to meet exact customer needs.

5. Digital zoom function
   The digital zoom function, which can vary magnification from 1X to 3X in 0.1X steps, allows easy check of even a small workpiece.

6. 2D & 3D color image display
   The wavefront phase and cross-section profile of a test piece can be checked using its 2D color image display. Additionally, a 3D image can visually represent a wavefront phase.

7. OK/NG judgment function
   OK/NG judgment can easily be performed on the production line by setting a standard value. The standard value for a user-defined aberration can also be set.

8. Screen customizing
   The screen layout condition save/read function allows layout configuration in conformity to the usage environment and product.