|Laser Interferometer (Downward Type) KIF-20-DW: Specifications|
|Measuring method||Fizeau interferometer|
|Aperture||ø60 mm (when using the option: ø6 - ø60 mm)|
|Reference lens profile irregularity||λ/20 (spherical and flat surfaces)|
|Light source||He-Ne laser (632.8 nm) laser class 2|
|Image output||USB2.0 digital output|
|Auto-alignment||Available (spotlight matching method)|
|Magnification||Digital zoom (1X - 3X)|
|Main unit dimensions||Interferometer||370 (W) × 260 (D) × 845 (H) mm (excluding the PC)|
|Light source unit||195 (W) × 365 (D) × 98 (H) mm|
|Main unit mass||Interferometer||Approx. 20 Kg (excluding the PC)|
|Light source unit||Approx. 5.0 Kg|
|Power supply voltage||100 - 120 VAC/200 - 240 VAC, 50 - 60 Hz|
|Working distance||Maximum 300 mm (different depending on the reference lens and test piece)|
|Reference fringe observation||PC used as a monitor|
|Phase calculation method||Interference fringe profile (fringe digitalization method)|
|Major functions of interference fringe digitalization software||
・Entire screen display of interference fringes
・Interference fringe visual check chart display function
・Alignment image display
・P-V, RMS, Pwr, AS, Coma, Sa3 display function
(incapable of ± judgment and angle judgment)
・Rated value setting and OK/NG judgment function
・Mask setting function
・Single/continuous measurement function
|Interference fringe measurement reproducibility||PV value: 0.1λ or less *Specified under Olympus measurement conditions|
|Interference fringe measurement time||Approximately 1.0 second (depends on the PC performance)|
・Dovetail adapter (for threaded reference lenses)
・Interference fringe analyzer (KIF-FU60/KIF-FSA)
・Reference lenses (RF60, F0.6, F0.7, F1.0, F1.5, F2.0, F3.0, F4.0, F6.0, C150, C300, C490, V520, V670, V750, APC60-15)*1
・Attenuating filter (AF60)
*1: A part of reference lenses needs to use the dovetail adapter.
Laser interferometer KIF-20-DW is an interferometer system most suitable for quick quality inspection and numeric control of profile irregularities on flat and spherical surfaces at the production site.
Standard equipment with the PC where interference fringe digitization software KIF-FIA has been installed
This system allows digitized display of aberrations from interference fringes in addition to the conventional interference fringe observation.
The ability to also save and print numerical data and screen data makes it optimal for quality control in manufacturing processes.
Adoption of a new reference lens mount
The adoption of a new type dovetail-grooved reference lens mount prevents the reference lens from dropping during its mounting/dismounting and enables easy and quick replacement of the lens, thus contributing to increase in production efficiency.
The compact, high-rigidity and vibration-protected interferometer body is excellent at environmental resistance and operability in view of the operating environments at the production site.
KIF-FIA Main Window
Reference Lens Mounting/Dismounting Image