Optical Metrology

KIF-20-DW

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Overview
Specifications
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KIF-20 Interferometers

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Laser Interferometer (Downward Type) KIF-20-DW: Specifications
Measuring method	Fizeau interferometer
Aperture	ø60 mm (when using the option: ø6 - ø60 mm)
Reference lens profile irregularity	λ/20 (spherical and flat surfaces)
Light source	He-Ne laser (632.8 nm) laser class 2
Image output	USB2.0 digital output
Auto-focusing	Available
Auto-alignment	Available (spotlight matching method)
Magnification	Digital zoom (1X - 3X)
Main unit dimensions	Interferometer	370 (W) × 260 (D) × 845 (H) mm (excluding the PC)
	Light source unit	195 (W) × 365 (D) × 98 (H) mm
Main unit mass	Interferometer	Approx. 20 Kg (excluding the PC)
	Light source unit	Approx. 5.0 Kg
Power supply voltage	100 - 120 VAC/200 - 240 VAC, 50 - 60 Hz
Working distance	Maximum 300 mm (different depending on the reference lens and test piece)
Reference fringe observation	PC used as a monitor
Phase calculation method	Interference fringe profile (fringe digitalization method)
Major functions of interference fringe digitalization software	・Entire screen display of interference fringes ・Interference fringe visual check chart display function ・Alignment image display ・P-V, RMS, Pwr, AS, Coma, Sa3 display function (incapable of ± judgment and angle judgment) ・Rated value setting and OK/NG judgment function ・Mask setting function ・Single/continuous measurement function
Interference fringe measurement reproducibility	PV value: 0.1λ or less *Specified under Olympus measurement conditions
Interference fringe measurement time	Approximately 1.0 second (depends on the PC performance)
Options	・Scale unit ・Dovetail adapter (for threaded reference lenses) ・Interference fringe analyzer (KIF-FU60/KIF-FSA) ・Reference lenses (RF60, F0.6, F0.7, F1.0, F1.5, F2.0, F3.0, F4.0, F6.0, C150, C300, C490, V520, V670, V750, APC60-15)1 ・Attenuating filter (AF60) 1: A part of reference lenses needs to use the dovetail adapter.

Laser interferometer KIF-20-DW is an interferometer system most suitable for quick quality inspection and numeric control of profile irregularities on flat and spherical surfaces at the production site.

Standard equipment with the PC where interference fringe digitization software KIF-FIA has been installed
This system allows digitized display of aberrations from interference fringes in addition to the conventional interference fringe observation.
The ability to also save and print numerical data and screen data makes it optimal for quality control in manufacturing processes.
Adoption of a new reference lens mount
The adoption of a new type dovetail-grooved reference lens mount prevents the reference lens from dropping during its mounting/dismounting and enables easy and quick replacement of the lens, thus contributing to increase in production efficiency.
Stabilized inspection/measurement
The compact, high-rigidity and vibration-protected interferometer body is excellent at environmental resistance and operability in view of the operating environments at the production site.