Semiconductor laser (635 nm), class 2 product
Laser output: 0.8 mW or less
Primary source: 100 - 240 VAC, 50/60 Hz
Main unit power supply: 12 VDC
Test piece size
R: +140 mm to -113 mm *, Diameter: approx. 110 mm
Main unit dimensions
180 (W) × 230 (D) × 440 (H) mm
Main unit mass
Approx. 5.2 kg
3-axis stage, 2-axis stage, small LCD monitors (2.5", 5.6"), reference lenses, attenuating filter AF, aperture converter RF25-D6
* The minimum R and minimum diameter differ depending on the test piece.
Small LD Interferometer KIF-10A-DW is a low-cost, compact LD interferometer. This type is best suited for quick quality inspection on the multi-product small-lot production site of small lenses. It allows quality inspection with ease of operation.
Ideal for quick quality inspection on the multi-product small-lot production site of small lenses
No specific tools are required for inspecting lenses in different specifications, making this type suitable for inspection on the multi-product small-lot production site. Just place a lens in the same way a microscope is used, then this model provides a simple and quick quality inspection.
Smooth introduction to existing inline processes through the use of 635nm laser wavelength
Since the laser wavelength is close to that of the conventional Fizeau interferometer (632.8nm), equivalent interference fringe sensitivity can be obtained. This allows smooth introduction of this model to an existing inline inspection process.
Olympus' rich reference lens lineup
One-inch and compact-type specifications are used for reference lenses, with a wide choice of options similar to the KIF-202L series.