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Surface Profile Evaluation of Diffuser Plates for LCDs / Non-contact 3D shape measurement using a laser microscope


Application

Liquid crystal displays (LCDs) must exhibit uniform brightness. To achieve this, special-purpose films are laminated together as part of an illumination optical system. The light from a source such as LEDs installed at the edge of a light guide plate is repeatedly reflected as it scatters within the plate, illuminating the plate’s front side. After the light radiating from the plate is made uniform by the diffuser plate and collected by a prism sheet, it is very intense. The intense light then enters into the TFT LCD panel. In order for this process to work effectively, the surface of the diffuser plate must be uniform. Consequently, evaluating the surface profile of the plate is important.

The Olympus solution

With Olympus' OLS4100 3D laser scanning microscope, users can observe the surface roughness of the diffuser plate and the dispersion of random irregularities with high resolution and high contrast. The OLS4100 features dedicated objective lenses with high numerical apertures and an optical system that obtains maximum performance from the 405 nm laser to capture the profile of irregular slopes that were previously difficult to detect, enabling you to easily acquire more reliable three-dimensional data.

Front surface of a diffuser plate in 3D

diffuser_plate_surface_front_3d

Objective lens 50X, Zoom 1X; 3×3 stitching

Back surface of a diffuser plate in 3D

diffuser_plate_surface_back_3d

Objective lens 50X, Zoom 1X; 3×3 stitching

Olympus IMS

Products used for this application


LEXT OLS5000NEW

With the Olympus LEXT OLS5000 laser scanning confocal microscope, noncontact, nondestructive 3D observations and measurements are easy to produce. Simply by pushing the Start button, users can measure fine shapes at the submicron level. Ease of use is combined with leading-edge features to deliver an acquisition speed four times faster than our previous model. For customers with larger samples, LEXT long working distance objectives and an extended frame option allow the system to accommodate samples as large as 210 mm.
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