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산업 솔루션

철근 검사 솔루션

홈/ 제품/ Thickness and Flaw Inspection Solutions/ 통합 검사 시스템/ 철근 검사 솔루션

초음파 위상 배열, 와전류 배열 및 X선 형광 분광 기술을 이용하는 철근 검사 시스템.
 

BIS PA: Bar Inspection System-Phased Array

The BIS PA uses phased array technology to inspect the full volume of round and square bars. The system is based on a unique “Floating Head” concept for a constant optimal positioning of probes; independently of the straightness variations of the bars.

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RBIS: Rotating Bar Inspection System

The RBIS combines phased array and eddy current array technologies to inspect the full volume and surface of large round bars; called billet. The inspection is carried out during the rotation of the billet and the linear movement of the carriage supporting inspection head.

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FOX-IQ Process & On-Line XRF System

The FOX-IQ Process &On-Line XRF System is for automated, continuous, on-line XRF measurements of Ca to U. It’s designed for 24/7 operation industrial environments to optimize processes for increased productivity &improved quality. Used for metals, alloys, liquids &other fluids. Easy install, low cost of ownership.

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BIS ECA: Bar Inspection System-Eddy Current Array

The BIS ECA uses eddy current array technology to inspect the full surface of round and square bars. The system is based on a “Wear Shoes” concept for a constant optimal positioning of probes, independently of the straightness variations of the bars.

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  • 연락처
  • Thickness and Flaw Inspection Solutions
    • 결함 탐상기/위상 배열 결함 탐상기
    • 두께 측정기
    • 탐촉자 및 프로브
    • 통합 검사 시스템
      • Wheel Inspection System
      • 철근 검사 솔루션
        • Bar Inspection System (BIS)—Phased Array
        • Bar Inspection System (BIS)—Eddy Current Array
        • Rotating Billet Inspection System (RBIS)
        • FOX-IQ
      • Tube Inspection Systems
      • Friction Stir Weld Inspection System
    • NDT 시스템 계측기
    • 산업용 스캐너
    • The Olympus Scientific Cloud
  • XRF and XRD Analyzers
  • 현미경 솔루션
  • 산업내시경 검사
  • 뉴스레터 신청
홈/ 제품/ Thickness and Flaw Inspection Solutions/ 통합 검사 시스템/ 철근 검사 솔루션
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