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Princípios básicos de microscópios com rastreamento a laser

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Index

1. Basic Principles of Laser Scanning Microscopes
1-1. Confocal Optical System
1-2. Two-Dimensional Scanning
1-2-1. Acousto-Optic Deflectors (AOD)
1-2-2. Polygon Mirrors
1-2-3. Resonant Galvano Mirrors
1-3. Confocal Effect and Extended Focus Image
1-4. Three-Dimensional Images
2. Resolving Power of Laser Scanning Microscopes
2-1. CTF(contrast transfer function)
3. Measurement Accuracy of Laser Scanning Microscopes
3-1. Horizontal Measurement
3-2. Vertical Measurement (Three-Dimensional Measurement)
4. Software for Laser Scanning Microscopes
4-1. Imaging
4-2. Analysis (Measurement)
4-3. Display
5. Basic Features of Olympus Industrial Laser Scanning Microscopes
5-1. 405-nm Laser Scan
5-2. Objective Lens Specially Designed for 405-nm Light
5-3. High-Speed Two-Dimensional Scan with Low Distortion and Excellent Plane Resolving Power
5-4. CFO Search
5-5. Differential Interference Contrast of Laser (DIC)
5-6. Improvement of Detection Capability for Combined Samples Containing Materials with Different Reflectance Values and Steep Slopes
5-7. Noncontact/Nondestructive Observation, Inspection, and Measurement
5-8. Measurement of Fine Irregularities Using Miniscule Laser Spots
5-9. Performance Assurance of Accuracy and Repeatability and Ensuring Traceability
6. Application Examples

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