InSight Blog

Dillon McDowell is an Applications Scientist at Olympus, specializing in using X-ray fluorescence (XRF) and other analytical technologies in alloy, precious metals, and regulatory (RoHS, and consumer product safety) applications. Before joining Olympus, Dillon was a research assistant at Northeastern university’s Nanomagnetism Research Group. Dillon has a BS in physics and MS in mechanical engineering from Northeastern University and has been published in the Journal of Material Chemistry C.