TomoView™ LITE is a version of TomoView chiefly designed for OmniScan® data file analysis. It incorporates the main TomoView features such as volumetric views, merged views, and a multigroup display. A simplified interface combined with optimal predefined layouts makes TomoView LITE the right analysis tool for many applications.

TomoView LITE has two distinct functionality sets: TomoView LITE Weld and TomoView LITE Aero, each of which offer the most commonly used analysis features, adapted respectively for the weld and aerospace industries.

Features

• Support for all OmniScan® (. opd and .oud) and TomoView™ (. rdt) files
• Merging of multiple data files into one single file
• Convenient predefined layouts for most typical applications. Layouts can be customized, saved, and uploaded.
• Color adjustment (Soft. gain and color range)
• Display of all merged data in a single view (Volumetric Merge)
• Creation, saving, and importing of weld overlays
• Powerful measurement and statistic tools
• Indication table editing and creation (with indication characteristics)
• Embedded report generator
• Support for conventional UT, TOFD, and phased array data

Ultrasonic Data Analysis Software

Reporting

Creating a report in TomoView™ LITE is very simple. Use the Zone tool to add an indication. Select your preferred indication table template (easily customized with additional readings and comments). Click add. Repeat for all relevant indications.
Changing company logos and adding inspection specific information (operator's name, site, part, etc.) can also be done very easily, so that a full HTML report including all relevant inspection settings, can be created in a matter of seconds.
Once completed, indication tables are automatically saved in an .R01 file format, to be later uploaded in TomoView.

Predefined Layouts

Linear scanning with A-scan, S-scan, and C-scan views	Raster scan inspection with A-scan, End-D, and Side-B views
TOFD inspection with A-scan and B-scan views	Raster scan inspection with time of flight C-scan, Side-B, End‑D, and A-scan views