QuickScan iX ECA采集仪器专为在材料生产环境中进行表面检测而设计。与经过现场验证的QuickScan iX PA仪器一样,QuickScan iX ECA仪器的设计也符合可靠的24 V
I/O工业标准。每个单元最多可连接8个探头。可将多个采集单元组合在一起,构建对探头或速度要求更严格的配置。
QuickScan iX ECA仪器
为满足工业要求而打造
QuickScan iX ECA仪器是我们用于工业检测系统的新一代涡流采集单元。这款采集单元符合IP55评级标准,可以方便地集成到工业环境中。
Bar inspection systems use advanced technologies, such as ultrasonic phased array, eddy current array, and X-ray fluorescence spectroscopy, to inspect the full volume and surface of round or square bars and pipes.
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