Residue and defects on silicon wafers stand out : Our novel MIX illumination combines brightfield, darkfield, simple polarized, and fluorescent lighting techniques to reveal defects that are otherwise difficult to see.  

Sample
Semiconductor Wafer
Semiconductor Wafer

Improved contrast : A combination of hardware and software remove glare and halation, improving the contrast of your images. Even highly reflective components are now easily visible. 

Sample
Printed Circuit Board(PCB)
Printed Circuit Board(PCB)

Fits 6-inch wafers and large printed circuit boards : The large stage has a flat top design, enabling larger samples to extend off the edge. The stage’s long stroke can cover 150 mm x 100 mm inspection area.

Not available in your country.
Not available in your country.
このページはお住まいの地域ではご覧いただくことはできません。