The Invisible Becomes Visible:
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 | Create All-in-focus Images: EFIThe Extended Focus Imaging (EFI) function within PRECiV software captures images of samples whose height extends beyond the depth of focus of the objective and stacks them together to create one image that is all in focus. EFI can be executed with either a manual or motorized Z-axis and creates a height map for easy structure visualization. It is also possible to construct an EFI image while offline within PRECiV Desktop. |
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Capture Both Bright and Dark Areas: HDRUsing advanced image processing, high dynamic range (HDR) adjusts for differences in brightness within an image to reduce glare. HDR improves the visual quality of digital images thereby helping to generate professional-looking reports. |  Clearly exposed for both of dark and bright parts by HDR (Sample: fuel injector bulb) |  Contrast enhancement by HDR |
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 Instant MIA image of a coin | Easily Move the Stage for Panorama: Instant MIAYou can now stitch images easily and quickly just by moving the XY knobs on the manual stage; no motorized stage is necessary. PRECiV software uses pattern recognition to generate a panoramic image giving users a wider field of view than a single frame. |
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Versatile Measurement Capability |
Routine or Basic Measurement FunctionsVarious measurement functions are available through PRECiV so that the user can easily obtain useful data from the images. For quality control and inspection, measuring features on images are often required. All levels of PRECiV licenses include interactive measurement functions such as distances, angles, rectangles, circles, ellipses, and polygons. All measured results are saved with the image files for further documentation. |  |
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 | Count and MeasureObject detection and size distribution measurement are among the most important applications in digital imaging. PRECiV incorporates a detection engine that utilizes threshold methods to reliably separate objects (e.g., particles, scratches) from the background. |
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Materials Science SolutionsPRECiV offers an intuitive, workflow-oriented interface for complex image analysis. At the click of a button, the most complex image analysis tasks can be executed quickly, precisely, and in compliance with most common industrial standards. With a significant reduction in processing time for repeated tasks, materials scientists can concentrate on analysis and research. Modular add-ins for inclusions and intercept charts are easily performed at any time. |  |
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 3D surface view (Roughness test sample) |  Single view and 3D profile measurement | 3D Sample MeasurementWhen using an external motorized focus drive, an EFI image can be quickly captured and displayed in 3D. The height data acquired can be used for 3D measurements on the profile or from the single view image. |
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Learn More about PRECiV |
View More Sample Types and SizesThe new 150 × 100 mm stage provides a longer travel in the X direction than previous models. This, together with the flat-top design, enables large samples or multiple samples to be easily placed on the stage. The stage plate has tapped holes to attach a sample holder. The larger stage provides flexibility to users by enabling them to inspect more samples on one microscope, saving valuable lab space. The stage’s adjustable torque facilitates fine positioning under high magnification with a narrow field of view. |
Flexibility for Sample Height and WeightSamples up to 105 mm can be mounted on the stage with the optional modular unit. Due to the improved focusing mechanism, the microscope can accommodate a total weight (sample + stage) of up to 6 kg. This means that larger and heavier samples can be inspected on the BX53M, so fewer microscopes are required in the lab. By strategically positioning a rotatable holder for 6-inch wafers off-center, users can observe the whole wafer surface by just rotating the holder when moving through the 100 mm travel range. The stage's torque adjustment is optimized for ease of use and the comfortable handle grip makes it easy to find the region of interest of the sample. |  BX53MRF-S |
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 BXFM | Flexibility for Sample SizeWhen samples are two large to place on a traditional microscope stage, the core optical components for reflected light microscopy can be configured in a modular configuration. This modular system, the BXFM, can be mounted to a larger stand via a pole or mounted to another instrument of choice using a mounting bracket. This enables users to take advantage of our renowned optics even when their samples are unique in size or shape. |
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Protect Electronic Devices from Electrostatic Discharge: ESD CompatibleThe BX53M has an ESD dissipation capability that protects electronic devices from static electricity caused by human or environmental factors. |