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Microscope Solutions for
Semiconductor Manufacturing

IC Design

Integrated circuit (IC) chips are inspected at various stages during the design and testing phases, and highly accurate microscopes are critical to this process.

Observing the Surface of IC Chips

Integrated circuit (IC) design companies need to inspect the pattern of designed IC chips. Additionally, IC chip manufacturers must analyze the IC chip design at the trial production step. Since the inspection volume is low, manufacturers can use manual equipment with high accuracy.

Our Solution

Our BX/MX series industrial microscopes feature magnification as high as 1,000X, enabling you to observe IC patterns with lines in the micrometer or sub-micrometer level. Alternatively, our DSX series microscopes offer magnification as high as 7,000X and are easy to operate.

MX series semiconductor microscope

MX series semiconductor microscope

BX series metallurgical microscope

BX series metallurgical microscope

DSX series digital microscope

DSX series digital microscope

Application Notes

Explore related applications:

App note Detecting Manufacturing Defects
Detecting Manufacturing Defects on Semiconductor Wafers Using a Digital Microscope Read More
Measuring the Thickness of Photoresist Film
Measuring the Thickness of Photoresist Film Read More
Inspecting Bonding Wires Using a Digital Microscope
Inspecting Bonding Wires Using a Digital Microscope Read More

MX series semiconductor
microscope

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BX series metallurgical
microscope

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DSX series digital
microscope

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