Scanning Probe Microscopy

Integrating a traditional optical microscope with an excellent laser scanning microscope (LSM) and a nanometric-scale scanning probe microscope (SPM), the OLYMPUS LEXT OLS4500 is compatible with a wide range of samples, providing a total observation/measurement solution for a new era.


LEXT OLS4500은 광학 현미경, 레이저 현미경(LSM), 프로브 현미경(SPM)을 한 대에 결합한 복합 현미경입니다. 관찰 배율은 수십 배에서 수백만 배까지 광범위한 영역을 커버하고 관찰 포인트를 잃는 일 없이 원활하게 밀리미터부터 나노미터까지 관찰 및 측정이 가능합니다.

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