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Bar Inspection Systems

Bar inspection system using ultrasonic phased array, eddy current array and X-ray fluorescence spectroscopy technologies.
 

Vanta™ iX In-Line XRF Analyzer

The Vanta iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line. Built to operate 24/7 in industrial environments, the system delivers instant results for 100% inspection and continuous quality control.

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BIS PA: Bar Inspection System—Phased Array

The BIS PA uses phased array technology to inspect the full volume of round and square bars. The system is based on a unique “Floating Head” concept for a constant optimal positioning of probes; independently of the straightness variations of the bars.

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RBIS: Rotating Bar Inspection System

The RBIS combines phased array and eddy current array technologies to inspect the full volume and surface of large round bars; called billet. The inspection is carried out during the rotation of the billet and the linear movement of the carriage supporting inspection head.

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BIS ECA: Bar Inspection System—Eddy Current Array

This BIS uses eddy current array (ECA) technology to inspect the full surface of round and square bars. The system uses a wear shoe that constantly optimizes the position of the ECA probes, independent of variations in the straightness of the bars.

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