Olympus Logo
Olympus LogoOlympus Logo


13 julio 2011
San Francisco State University Awarded Research & Discovery Grant To Study Heavy Metal Content Of Cosmetics And Skin Care Products

Olympus Innov-X awarded a Research & Discovery Grant to San Francisco State University, San Francisco CA. The awarded proposal, Portable XRF for the Analysis of Heavy Metal Content in Skin Care Products, is being directed by Dr. Pete Palmer, Professor of Chemistry and Biochemistry at San Francisco State.

Dr. Palmer plans to analyze a variety of consumer care products distributed worldwide. He is particularly interested in understanding the concentrations of arsenic (As) and lead (Pb) used in cosmetics and skin care products. Dr. Palmer, Professor of Chemistry and Biochemistry at San Francisco State, has worked in conjunction with the FDA to develop portable XRF methods to quickly screen for toxic metal content in consumer related products. His research will be conducted in the San Francisco area.

Dr. Palmer is using an Olympus Innov-X DELTA Premium Handheld XRF Analyzer. This handheld XRF couples a high resolution, large-area silicon drift detector (SDD) with a powerful 4-watt tube to deliver fast and precise compositional analysis of a variety of materials, including solids, powders, cream and fluids. With dramatically reduced testing times, the DELTA allows hundreds of tests per day enabling one to make immediate on-the-spot decisions, maximizing any research and discovery budget.

DELTA handheld XRF analyzers offer cutting edge electronics and X-Ray technology, as well as innovative software features that make DELTA analyzers fast, user-friendly, and easy-to-operate. These analyzers are engineered for continual use, achieving thousands of tests per day in some applications, even in extreme environments. Every DELTA is engineered for rugged toughness and analytical precision
For more information on the use of the DELTA for Research & Discovery, please visit http://www.olympus-ims.com/en/xrf-xrd/delta-handheld/delta-r-and-d/.

<< Back

Sorry, this page is not available in your country