Key Industries and Applications

• General weld inspeciton
• Crack detection and sizing
• Power generation inspections
• AWS D1.1/D1.5 weld inspection
• Casting and forging defect inspections
• DGS/AVG defect sizing
• In-line inspections
• Composite delamination and defect inspections
• Aerospace and maintenance
• Automotive and transportation

PC Management and Reporting

GageView™ Pro Data Software

The EPOCH 1000 series is fully compatible with GageView Pro Olympus' standard portable instrument PC interface program. The GageView Pro interface program can be used to download saved data for review, export, and backup, and to generate reports containing setup parameters, measurement data, and waveforms. Database backup files can be viewed directly in GageView Pro using a USB memory stick without having to connect the EPOCH 1000 series instrument to the PC. This feature allows for backup, data review, and report generation of instrument files without having to remove the instrument from in-field work. Other tools, including an instrument firmware upgrade utility, are also available as part of this program.

Features

• Download saved inspection data and setup files.
• Review setup information and measurements on a PC.
• Export measurements and calibration data to common spreadsheet programs.
• Back up calibration and inspection data from the instrument.
• Upgrade instrument firmware.
• Generate reports with setup parameters, measurements, and waveforms.
• Access saved data through unit database backup files.

Accessories

The EPOCH 1000 series offers various accessories to allow full functionality of available features.

• EPXT-C-VGA-6 (U8779019): VGA output cable
• EP4P/C-USB-6 (U8840084): USB client cable
• EP1000-C-RS232-6 (U8779197): RS-232 communications cable
• EP1000-C-26OUT-6 (U8779018): Hardware I/O cable (alarm outputs triggering)
• EP1000-C-9OUT-6 (U8779017): Hardware I/O cable (analog output)
• EP4/CH (U8140055): Chest harness
• EPXT-EC-X: External battery charger
• EPXT-BAT-L (U8760021): Extra battery (lithium-ion)
• EP1000-TC-S (U8764078): Small Transport Case
• EP1000-TC-L (U864079): Large Transport Case

Small Transport (P/N EP1000-TC-S)

Large Transport Case (P/N: EP1000-TC-L)

Dynamic DAC/TVG Mode

• Dynamic DAC/TVG - This standard feature enables fast and dynamic creation of DAC curves using reference reflectors, in addition to single-button switching from DAC to TVG mode. Includes ASME, ASME-III, JIS, 20% to 80% DAC, Custom, and TVG Table.
• Onboard DGS/AVG - The DGS/AVG flaw sizing technique uses calculated attenuation curves to aid you in sizing potential defects. A vast onboard library of characterized probes enables you to quickly and easily setup a DGS/AVG curve and perform precise flaw sizing.

Interface Gate with 1 and Gate 2 Tracking

• Interface Gate - This optional third measurement gate enables real-time tracking of a variable interface echo in order to maintain consistent digital measurements.
• AWS Welding Rating - This weld rating calculator provides a live AWS D1.1/D1.5 code-compliant "D" value weld rating for gated flaw indications.
• Floating Gate - This option enables you to "float" Gate 1 and/or Gate 2 at a selected height compared to a gated echo (-1 dB to -14 dB). This feature provides more consistent, precise readings, especially in Edge Detection mode.

SureView Screen

The EPOCH® 1000 features a new and exciting set of visual enhancement capabilities to improve the quality and ease of detection in advanced applications.

• SureView® - This feature emulates the functionality of analog CRT displays, allowing you to visualize peak indications from reflectors by adding a point of light along the A-scan trace where every peak occurs.
• Composite A-scan - This feature uses every A-scan acquired in between screen update rates (multiple A-scans when PRF > 60 Hz) to draw a composite A-scan based on the maximum envelope of all the acquired A-scans. This feature increases confidence of visual detection when scanning quickly.
• Max Amplitude - This feature displays only the acquired A-scan with the highest gated amplitude reading between screen updates.

Persistence Mode Screen

• Persistence Mode - This feature retains previously acquired A-scans on the instrument display for a user-selectable duration. This feature provides visual "memory" of an inspection for enhanced visual detection over a short period
  of time.
• Baseline Break - This feature displays "zero-cross" points as lines connecting individual A-scan lobes to the baseline in full-wave rectified mode.
• Min Thickness - This feature displays only the A-scan representing the minimum thickness reading between screen updates.
• Averaged A-scan - This feature enables you to view the average of the acquired A-scans. Averaging is applied in multipliers of 2x, 4x, 8x, 16x, 32x, and 64x.

Combined A-scan and S-scan Views

The EPOCH 1000i features a standard combined A-scan and S-scan view that displays A-scan data from every angle between two user-defined start and end values. Each individual angle, collectively referred to as focal laws, can be selected to display a live A-scan enabling you to detect and characterize potential defects at multiple angles simultaneously using phased array imaging.

Calibration Across All Focal Laws

When calibrating for gain and zero offset in phased array mode, the EPOCH 1000 i utilizes single-step procedures to calibrate across all focal laws. These automated calibration procedures allow you to capture peak amplitude or TOF/distance measurements from a single reflector across all the imaging angles (focal laws). The instrument then uses the captured amplitude or TOF/distance data to adjust the gain and zero offset at each focal law so that calibrated measurements are provided for every A-scan.

Gain Calibration Curve

Phased Array DAC Edit Mode

Standard DAC/TVG for All Focal Laws

The EPOCH 1000 i comes standard with DAC/TVG for all focal laws. This allows you to acquire a DAC curve, or create a TVG setup from known reflectors for all defined angles/focal laws at once. The instrument then allows you to edit individual points acquired during setup for precise DAC or TVG presentation. After completing the setup, you can use the S-scan image to detect potential defects at various focal laws.

Phased Array DGS/AVG Mode

Standard Phased Array DGS/AVG

The DGS/AVG flaw sizing technique is included as a standard option in phased array mode. This feature uses the probe ID and wedge information to establish the DGS/AVG curve characteristics, and applies the curve at 0°, 45°, 60°, and 70° focal laws. The standard EPOCH onboard DGS/AVG menu and modified GAIN calibration tool allow for quick and easy setup. The option also provides an interpolated image TVG for easy detection across a given soundpath range.

Phased Array S-scan with Weld Overlay

Weld Overlay

Weld Overlay is a standard inclusion on the EPOCH 1000 i , providing a visual reference of a weld profile on the S-scan display. This profile enables you to visualize the relative position of indications in relation to the weld geometry.

A weld centerline cursor allows manual positioning of the overlay on the S-scan. The Weld Overlay enhances your ability to locate, characterize, and size flaws within the component during inspection, and improves reporting.

Multi-Angle Phased Array Mode

EPOCH 1000 i Multi-Angle

The EPOCH 1000 i phased array mode includes a standard feature called Multi-Angle. This feature enables you to designate any three angles, or focal laws, available in the sector scan as "visible" focal laws. The A-scans from each of the three designated angles are overlaid, one on top of the other in the A-scan window, enabling you to view all three A-scans at the same time. Each individual angle is color coded for ease of use. This feature is perfect for inspectors using conventional sizing methods requiring evaluation at 45°, 60°, and 70°.

A-scan and S-scan view with True Depth Gates

True Depth Gates

Measurements gates can be displayed in True Depth mode on the Sector Scan, thus enabling you to acquire measurements from a constant depth area throughout the part, regardless of the focal law selected. This is particularly helpful when using the encoded C-scan option, as it enables you to collect information for one entire skip distance with a single gate position.

The True Depth gates display as horizontal lines on the S-scan only; the A-scan view remains in Soundpath mode.

AWS "D" Weld Rating displayed for 45° focal law

AWS Weld Rating

The EPOCH 1000 i comes with an AWS D1.1/D1.5 weld rating calculator. In conjunction with Olympus' AWS-rated phased array transducer, this enables you to use imaging capabilities for flaw detection while sizing flaws at 45°, 60°, and 70° using the conventional A-scan technique, and also view the D value for onscreen weld rating of any selected A-scan (focal law).

This optional software feature expands the EPOCH 1000 i to a 16:64 element configuration and enables linear scans in addition to encoded or timed C-scans. Linear scans are collected using a probe with up to 64 elements, and a maximum active aperture of 16 elements.

C-scan imaging is created by accumulating image data from the programmed linear scan or S-scan across a single-line scan axis. An encoder is required to track the position as the probe is moved along the scan axis. This encoded C-scan image collects both time of flight (TOF) and amplitude data from two independent measurement gates. The live A-scan is viewable during C-scan acquisition. Compressed A-scan images can be stored for all points on the C-scan, and can be reviewed along with the S-scan or liner scan from a particular C-scan location for basic visual analysis. Data source and type can be adjusted dynamically after the scan is acquired, and cursors are available for basic scan sizing. Additional color palettes are available for phased array image scans. These color palettes provide different color scales for use with varied applications, and can be modified to meet your specific needs.

Watch the Encoded C-scan Feature video.

Zero-degree C-scan

• Encoded or time based C-scans.
• Uni- or bi-directional encoding.
• Supports probes with up to 64 elements.
• Minimum scan resolution of 1 mm (0.040 in.).
• Compressed A-scan storage for all C-scan points.
• C-scan can be created from S-scan or linear scan.
• Encoding up to 3 m (118.11 in.) per scan (61 focal laws at 1 mm scan resolution).
• Image and A-Scan review for visual analysis using cursors.

The EPOCH® 1000 i supports a new series of phased array probes to meet the demands of critical inspections. These probes include specialized probes for specific code compliance, and standard weld inspection probes, including removable or integral wedge phased array probes. Most common phased array probes with up to 64 elements are supported.

Fast Switch from Conventional to Phased Array

The EPOCH 1000 i is compatible with all standard single element transducers in conventional mode. Switching between conventional UT and phased array inspection is as easy as pressing a button. The EPOCH 1000 i features a high-speed transition from UT to PA mode, enabling you to easily combine conventional UT and phased array inspections.

Mini-Wheel Encoder

The Mini-Wheel encoder can be used with the encoded C-scan option for the positioning and dimensioning of defects in the scan axis, and can synchronize data acquisition with probe movement.

The Mini-Wheel encoder is waterproof and can be mounted onto the Olympus PA wedges using the included bracket kit. This miniature encoder is made entirely of stainless steel, and features sealed bearings for long-lasting smooth operation. The custom electronic circuit was designed for minimal noise induction.

Features

• Waterproof (designed for IP68 rating).
• Small footprint dimensions.
• Double O-ring tire for better adherence.
• Sealed bearing long lasting smooth wheel rotation.
• Strain relief for cable protection.
• Two M3 threaded holes on top of the casing for rigid attachment.

Standard Inclusions

• 1 Encoder with standard wheel
• 1 Bracket kit
• 1 Allen key screwdriver for bracket attachment
• 1 Carrying case