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Industrial Microscopes
Specifications

Main License Specifications

Enterprise Desktop
Image Acquisition Basic image acquisition including HDR and auto-calibration of magnification and Live HDR*1, and position navigation*1 ■

Software autofocus*2 and movie acquisition (Avi format) ■

Time lapse, Instant EFI, and Instant/Manual MIA*3 ■

Motorized EFI/MIA and Z-stack acquisition ■

Image and Customization Tools Basic tool windows (Image history, properties, navigator, gallery view tool window)*4 ■ ■
Annotations, layer management, scale bar, cross hair, info stamp display, and image filters ■ ■
Digital reticle/grid, line profile display, My Function, layout management, and Macro Manager ■

Measurements/ Image Analysis Basic interactive measurement (distance, angles, rectangles, circles, ellipses, polygons, circle-to-circle distance, angle ruler, and line ruler) and data export to MS-Excel ■ ■
Phase analysis, magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics ■ ■
3D measurements, 3D profile measurements, and 3D surface view ■ ■
Reporting*5 Report creation (MS-Word, and MS-Excel formats)  ■ ■
Presentation creation ■ ■
Data Management Client/Server data management system for an unlimited number of simultaneous database users**6 ■ ■
User-/project-oriented administration of images and other documents ■ ■
Variable user rights for image and data ■ ■
Fast and controllable data access ■ ■
High-performance search functions ■ ■
Supported DBMS: Microsoft SQL Server 2008 R2/R2 Express, Microsoft SQL Server 2012 (SP1 and SP2)/Express (SP1 and SP2), Microsoft SQL Server 2014/Express, Microsoft SQL Server 2017/Express, Microsoft SQL Server 2019/Express, Oracle 11g R2/express, Oracle 12g R2/Express ■ ■
Sophisticated service for secure storage due to secure file repository (SFR) technology ■ ■
Device Support Evident microscopes**7 and Evident cameras*8 ■

Non-Evident cameras and image source converters*9 ■

Non-Evident stage controllers*9 ■

PC Requirements
CPU Intel® Core i5, Intel® Core i7, Intel® Xeon
RAM/hard disk/DVD drive 4 GB or more (8 GB recommended)/2.4 GB or more free space/DVD+R DL compatible
OS*10 Windows 10 Pro (64-bit) , Windows  8.1 (64-bit) Pro
.NET Framework Version 4.6.2 or higher
Graphic card*11 1280 × 1024 monitor resolution with 32-bit video card
Web browser Windows Internet Explorer 8, 9, 10, or 11

*1   Requires the DP74 camera, and the Live HDR function requires 64-bit OS.
*2   Requires Evident microscope with motorized Z-axis or external motorized Z-axis
*3   Instant MIA may not work properly with some cameras
*4   Write and read all major file formats and open Evident proprietary formats (DSX, LEXT and POIR file formats)
*5   Requires Microsoft Word 2010, 2013, 2016, 2019, or Office 365 to be installed beforehand (not provided).
*6   Using Microsoft SQL Server Express
*7   Supports BX53M, BX2, IX2, GX, GX53, SZX, SZX2, SZX-ZE, MX, MX63, MX63L, MVX, STM7-CB, CBS, BX3M-CB, BX3M-CBFM, BX-REMCB.
*8   8 Supports LC20, LC30, LC35, DP22, DP23, DP27, DP28, DP73, DP74, SC30, SC50, SC100, SC180, UC30, UC50, UC90, XC10, XC30, XC50, XM10, DP23M.
*9   Please contact Evident for supported device information
*10 Starting with Stream 2.5, Evident cameras DP74, DP73 and SC180/UC90 are compatible with Windows 10/8.1 only. Windows 7 is no longer supported.
*11 Required configurations for Live HDR in DP74. Graphic board applicable to CUDA made by NVIDIA (compute capability 2.1 or higher). Graphic board driver applicable to CUDA 9.1 or higher.

Special Solution Specifications

Solutions Compatiblity Functions
Enterprise Desktop Measurement Type
3D Included Partially included* 3D Surface View, 3D Measurement, 3D Profile Measurement, Motorized Z-stack/EFI, Instant EFI with height map (requires coded or motorized Z-axis).
Weld Measurement ■ ■ Weld Measurement solution (measurements for geometric distortion introduced by the heating during welding).
Count & Measure ■ ■ Multiple threshold methods are available (automatic, manual HSV, manual and adaptive)
The system can automatically measure multiple parameters on all segmented objects (Area, Aspect Ratio, Bisector, Bounding Box, Gravity Center, ID, Mass Center, Intensity Values, Convexity, Diameters, Elongation, Feret, Extent, Next Neighbor Distance, Orientation, Perimeter, Radius, Shape, Sphericity, etc.), Spreadsheet and charts with individual and distribution measurements.

TruAI™ Deep-Learning Technology

■ ■ Training of Neural Networks using semantic (well separated objects) or instance (touching borders objects) segmentation methods.

* Not possible to use the functions relating to image acquisition

Materials Solutions Specifications

Solutions Output Functions
Enterprise Desktop Automatic Report Workbook with Individual Store All Results in the Image Properties Measurement Type Supported Standards
Grain Intercept ■ ■ ■ ■ ■ Selection of pattern (circles, cross, cross circles, vertical lines, horizontal lines, horizontal vertical lines)

Definition of the number of test lines for determination of grain elongation

Displays the G-value in the Material Solution tool window 		ASTM E112-13(2021), ISO 643:2020, JIS G 0551:2020, JIS G 0552:1998, GOST 5639-82, GB/T 6394-2017, DIN 50601:1985, ASTM E1382-97(2015)
Grain Planimetric ■ ■ ■ ■*2 ■ Automatic extraction of grain boundaries

User interaction using Stream sliders for improved usability

Displays the G-value histogram in the Material Solution tool window for direct interaction 		ASTM E112-13 (2021), ISO 643:2020, JIS G 0551:2020, JIS G 0552:1998, GOST 5639-82, GB/T 6394-2017, DIN 50601:1985, ASTM E1382-97(2015)
Non-Metallic Inclusions ■ ■ ■ ■ ■ Automatic detection of non-metallic inclusion using colors, shape, and size

Automatic classification of oxides, sulfides, silicates, and aluminates

Live display of the detected inclusion with its rating

Statistical overview of inclusions on the entire scanned area
  		ASTM E45-18a (method A), DIN 50602:1985 (method M), ISO 4967:2013 (method A), GB/T 10561-2005 (method A, equivalent to ISO 4967), JIS G 0555:2003 (method A, equivalent to ISO 4967), UNI 3244:1980 (method M), EN 10247:2017 (methods P and M), EN 10247:2007 (methods P and M), ASTM E45-18 (method D), ISO 4967:2013 (method B), SEP 1571-2017 (methods M and K), EN10247:2017 (method K).
Cast Iron ■ ■ ■ ■ ■ On polished samples: automatically measures the characteristics of the graphite content (size, shape, and distribution)

On etched samples: measures the ferrite to pearlite ratio

Integrated workflow that takes into account the sample status (etched or polished) 		EN ISO 945-1:2018, ASTM A247-17,
JIS G 5502:2001, KS D 4302:2006,
GB/T 9441-2009, ISO 16112:2017,
JIS G 5505:2013, NF A04-197:2017,
ASTM E2567-16a (for nodularity only)

Chart Comparison

■ ■

■ ■ Multiple displays available, including live overlay

User interaction using Stream sliders for improved usability

Calculates statistics on the selected values 		DIN 50602:1985, ISO 945-1:2019, ISO 643:1983, ISO 643:2012, EN 10247:2017, SEP 1520:1998, SEP 1572:2019, ASTM E112:13(2021), ISO 4505:1978

Layer Thickness

■ ■ ■ ■

Layer boundaries can be specified using automatic detection, magic wand, or manual mode (using 2 or 3 points)

Individual measurements can be added or deleted later on

Measurement of any type of layers (with even or uneven boundaries) is supported

Layer thickness measurement calculates mean, maximum, and minimum values as well as statistical data for each individual layer

Coating Thickness

■ ■ ■ ■ ■ Prints are measured from top view

Calculation of the coating thickness according to the sample geometry 		EN 1071-2:2002, VDI 3824: 2001, ISO 26423:2016

Dendrite Arm Spacing

■ ■ ■ ■ ■ Determines the mean dendrite arm spacing in cast aluminum alloys

Automatic Measurements

■

■

Automatically measures distances (point-to-point, point-to-line, circle-to-circle, point-to-circle, line-to-circle)

Automatically measures circle diameter (roundness, bounding box)

Automatically measures angles between two lines

Definition of tolerances values for measurement and visual validation

Expert and user mode for measurement repeatability

Throwing Power

■

■ ■ ■ Manual measurements of selected point of interest on the sample

Predefined points that will be triggered by the operator

Selection of the vias type and documentation of the analysis

Report and automatic calculation according to the manual measurements

Porosity

■ ■ ■ ■ ■ Pore detection per ROIs (triangle, circle, rectangle, polygon, or magic wand) with overlapping capability

Measurement of the pore density, count, and specific area

Measurement of the biggest pore

Measurement of a specified size range 		VW 50093/ P6093:2012,
VDG P201-2002, VDG P202-2010,
VDG P211-2010

Particle Distribution

■ ■ ■ ■ ■ Particles are defined using simplified threshold settings

Automatic classification according to a selected parameter (size, color, or shape)

Measurement of ROIs and multiple thresholds

Definition of validation and coding according to user-defined standards

Advanced Phase Analysis

■ ■ ■ ■ ■ Phase fraction per ROIs (triangle, circle, rectangle, or polygon)

Magic wand, freehand polyline, interpolated polygon, morphology filter, and image arithmetics also usable

Measurement of the total phase percentage per phase and per ROI

Selectable minimum area detection


*2 Stream Enterprise chart with the distribution can be output.

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