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Industrial Microscopes
Scanning Probe Microscopy

Integrating a traditional optical microscope with an excellent laser scanning microscope (LSM) and a nanometric-scale scanning probe microscope (SPM), the OLYMPUS LEXT OLS4500 is compatible with a wide range of samples, providing a total observation/measurement solution for a new era.

LEXT OLS4500

LEXT OLS4500 is Nano Search Microscope which is combined a laser microscope and scanning probe microscope (SPM) in the same instrument to allow observation and measurement over a wide range of magnifications (from around 50x up to 1,000,000x)

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