The Vanta iX in-line XRF analyzer
performs fully automated analysis for high-volume process control.
The Vanta iX analyzer can be controlled by a PC,
or integrated with a PLC for automated start/stop, data acquisition,
decision-making, and communication to external devices.
Here’s how it works.
A sample is placed over the probe head for analysis.
The probe head emits X-rays to measure the sample material.
Using this information, the Vanta iX analyzer
can quickly and nondestructively verify the alloy grade and chemistry
to determine if the material meets specification and display a grade match
or make a pass/fail determination.
With continuous measurements of titanium to uranium
on any surface for the CW model,
and the MR model can measure magnesium to urainium
the Vanta iX can deliver results in the form of material chemistry,
accurate grade identification, or pass/fail results.
The Vanta iX system has intelligent operation and connectors
making it easy to integrate with new or existing PLC controlled processes.
The Vanta iX is IP rated
and has a durable Kapton mesh window for the CW model
and the MR model has a Prolene window
built to sustain 24/7 operation with high levels of vibration,
electromagnetic and acoustical noise, dust, and moisture
To learn more about how the Vanta iX in-line XRF system
can help implement quality control to your production line,
contact your local Olympus representative or visit our website.