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The Vanta iX in-line XRF analyzer

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performs fully automated analysis
for high-volume process control.

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The Vanta iX analyzer can be controlled by a PC,

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or integrated with a PLC for
automated start/stop, data acquisition,

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decision-making, and communication to external devices.

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Here’s how it works.

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A sample is placed over the probe head
for analysis.

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The probe head emits X-rays
to measure the sample material.

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Using this information, the Vanta iX analyzer

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can quickly and nondestructively verify
the alloy grade and chemistry

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to determine if the material meets specification
and display a grade match

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or make a pass/fail determination.

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With continuous measurements of titanium to uranium

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on any surface for the CW model,

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and the MR model can measure magnesium to urainium

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the Vanta iX can deliver results in the form of material chemistry,

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accurate grade identification, or pass/fail results.

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The Vanta iX system has intelligent operation
and connectors

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making it easy to integrate with new
or existing PLC controlled processes.

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The Vanta iX is IP rated

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and has a durable Kapton mesh window
for the CW model

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and the MR model has a Prolene window

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built to sustain 24/7 operation with high levels of vibration,

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electromagnetic and acoustical noise, dust, and moisture

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To learn more about how the Vanta iX in-line XRF system

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can help implement quality control to your production line,

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contact your local Olympus representative
or visit our website.