OmniScan SX for Multi-Technolgy Weld Inspection
The Olympus OmniScan SX is capable of
conventional A-scan inspections
and advanced phased array and TOFD inspections
where data is saved for analysis and reporting
to replace radiography.
Conventional UT
In flaw detector mode for conventional UT probes,
a large, high-resolution touch screen display
and interactive menus on the A-scan
allow manipulation using the touch screen.
UT start, UT range,
gate manipulation,
ability to change the gain,
and trigonometry readings.
In conventional UT inspection
the probe is rastered in and out from the weld
with overlap while observing the A-scan display for indications.
Indications are marked on the weld when detected
and statistical information written on the inspection report.
(Video has been sped up two and a half times the normal rate.)
The end result is a paper report
signed by the inspector for which
the results are greatly dependent on skill and experience.
Phased Array Acquisition
Phased array inspection provides a more thorough
and faster inspection by use of multiple element
programmable probes and scanners.
Phased array inspections are regulated by the same codes
and acceptance standards used in conventional UT
such as ASME, EN, and similar.
The probe is scanned parallel to the weld line
from a pre-determined position
and the data is recorded.
At the end of the acquisition the data file is saved
and recorded to the SDHC card for analysis
directly on the OmniScan
or offline using OmniPC software.
Phased Array Analysis
Analysis includes the ability to view the data
in side and end views along with the A-scan data
used to create them directly from the interactive title bar.
Set data cursor by a touch and hold on the touch screen
or manipulating the interactive title bar allows the inspection
to be replayed one data point at a time
along the weld line.
Length sizing is accomplished on the C-scan
by placing cursors at the flaw extremities
at the three or six db drop.
Depth and height sizing is accomplished on the S-scan
by manipulating cursors to the flaw extremities.
We have a sidewall lack of fusion indication.
Seventeen point three four millimeters in length
and four point eight four millimeters in height
at a depth of six point seven nine millimeters deep.
Flaws are added to the indication table
directly from the touch screen
including a screen shot of the current layout
and an onboard report generator
allows the OmniScan inspection parameters
information about the instrument and inspection results.
The report can be saved
directly onto the SDHC card and printed.
TOFD Acquisition
The TOFD inspection technique
uses two conventional probes
and a single A-scan in a pitch-catch configuration.
The OmniScan software wizards assist the user
in the configuration of the UT and scanner.
Select the AB layout from the interactive title bar
and start acquisition on the instrument.
Move the probes along the weld line
in a slow, smooth, steady scan.
Select the pause button and save the data
to the SDHC memory card.
TOFD Analysis
TOFD analysis is performed on the B-scan
and A-scan after calibration for PCS and wedge delay.
Zoom the area of interest on the B-scan
and set the position of the data cursor near the flaw.
Manipulating the data cursor with the rotary knob
displays the A-scan for each data point on the B-scan.
Just off of the flaw, set the position of the reference cursor
on the lateral wave
and the position of the measure cursor
on the back wall.
Using the touch screen, touch and hold
and select wedge delay and PCS.
The screen is now calibrated
and the flaw is measured by the box created
with the reference and measure cursors
on the ultrasound and scan axis.
Position the data cursors
for a representative A-scan
using the touch and hold on the readings area,
add the indication to the table
and it is stored in the data file
and available for the report.