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Olympus is pleased to introduce

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the LEXT® OLS5000

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3D laser confocal scanning microscope.

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With newly designed
optics and software,

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the OLS5000 laser microscope

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elevates surface metrology measurement

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to a higher level.

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Equipped with dedicated
LEXT objectives

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designed for surface metrology,

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the OLS5000 laser microscope

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can detect a step height difference

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as small as six nanometers

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for highly accurate measurements.

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The new MEMS scanner

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enables the system to scan

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through surfaces at high resolution.

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For better image quality,

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4K lateral scanning

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is the new default scanning mode.

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Even when resolving structures

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as small as 120 nanometers

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you can still get clear images.

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The system’s precision measurements

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are balanced with speed.

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With the new PEAK algorithm,

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the OLS5000 laser microscope

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can collect data in the
tens of microns range

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in just a few seconds.

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For even faster results,

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the new SKIP SCAN mode

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enables the system to measure

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a one-millimeter
step height difference

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in twenty seconds.

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Operating the system is easy.

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Users can capture 3D data
automatically

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just by clicking the Start button.

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The smart scan function

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will automatically optimize
the imaging settings,

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helping minimize variation

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between different operators.

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Analyzing data is also easy.

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With just a few clicks,

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the software can quickly quantify

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surface topography,

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including the step height,

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line width, and surface roughness.

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With sensitive optics

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on the OLS5000 microscope,

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you can still measure objects
from farther away

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with the same high accuracy.

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New 10x

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and long working distance
LEXT objectives

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enable deep contours to be observed

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in a wider field of view.

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For larger samples up to 210 mm high

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and 300 mm wide,

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a frame extender adds the flexibility

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to handle a variety of sample types.

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Elevate your surface metrology

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to a higher level

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with the LEXT OLS5000

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3D laser confocal scanning microscope.

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To learn more,

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please visit our website

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or contact your local
sales representative.