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Reflected Differential Interference Contrast (DIC) Observation
It is a microscopic observation technique where the height difference of specimen that may not be visible with brightfield become a relief-like or three dimensional image with improved contrast. Illumination light becomes two rays of diffracted light by DIC prism. They bring about slightly difference in light path on height difference of the specimen. The difference becomes contrast utilizing DIC prism and analyzer. At the sensitive tint range, coloration is enhanced. Suitable for examining specimens with very minute height differences including metallurgical structure, minerals, magnetic heads, surface of hard disk and polished surface of wafer.
Surface of Hard Disk
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