Hydrogen-induced cracking (HIC) can occur in susceptible steels exposed to aqueous environments containing hydrogen sulphides. It is a form of hydrogen-related cracking and can have two distinct morphologies: 1. The first type is commonly referred to as hydrogen-induced cracking (HIC) and can occur where little or no applied or residual tensile stress exists. It is manifested as blisters or blister cracks oriented parallel to the plate surface. 2. The second type produces an array of blister cracks linked together in the through thickness direction by transgranular cleavage cracks. The latter type of cracking is referred to as stress-oriented hydrogen-induced cracking (SOHIC). SOHIC can have a greater effect on serviceability than HIC because it effectively reduces load carrying capabilities to a greater degree. The inspection requires characterization of the defect areas to differentiate between spot inclusions, laminations, and different stages of hydrogen-induced cracking (HIC). The benefit of electronic angle sweeping (S-scans) provided by the OmniScan™ allows simultaneous scanning from −30 to +30 degrees. The imaging from this scanning technique allows the user to distinguish between spot indications and interconnected defects. Typical Inspection Requirements
A 0-degree raster scan is used to find the area that has laminations. Then the phased array probe using the −30- to +30-degree S-scan setup is manually scanned over on the areas where defects have been found to determine if there is a link between those defects. Screen shots and reports of the defect can be immediately created for later printouts. |
The OmniScan MX is an advanced, multi-technology flaw detector. It offers a high acquisition rate and powerful software features-in a portable, modular instrument to efficiently perform manual and automated inspections. Available with PA and conventional UT modules, and conventional EC and ECA modules.
The OmniScan MX2 phased array flaw detector with touch screen interface offers increased testing efficiencies and powerful software features, ensuring superior manual and advanced AUT application performance with fast setups, test cycles, and reporting. It is compatible with all existing phased array modules.Copyright 2011 OLYMPUS CORPORATION, All rights reserved. Terms Of Use | Privacy Statement